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High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7−δ thin film by the low-temperature scanning microwave microscope |
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| Authors: | Sohei Okazaki Noriaki Okazaki Hidetaka Sugaya Ryota Takahashi Yuji Matsumoto Hideomi Koinuma Tetsuya Hasegawa |
| Institution: | a Department of Chemistry, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan b Advanced Materials Laboratories, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan c Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan d Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan e Department of Physics, University of Maryland, College Park, MD 20742-3511, USA |
| Abstract: | We developed a scanning microwave microscope (SμM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Qλ/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti1−xCoxO2−δ and Nd0.9Ca0.1Ba2Cu3O7−δ (NCBCO), it was demonstrated that this SμM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions. |
| Keywords: | 07 79 -v 71 30 +h 74 72 Bk 75 50 Pp 84 40 -x |
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