Blue-violet luminescence double peak of In-doped films prepared by radio frequency sputtering

ZnO films doped with different contents of indium were prepared by radio frequency sputtering technique. The structural, optical and emission properties of the films were characterized at room temperature using XRD, XPS, UV-vis-NIR and PL techniques. Results showed that the indium was successfully incorporated into the c-axis preferred orientated ZnO films, and the In-doped ZnO films are of over 80% optical transparency in the visible range. Furthermore, a double peak of blue-violet emission with a constant energy interval (∼0.17 eV) was observed in the PL spectra of the samples with area ratio of indium chips to the Zn target larger than 2.0%. The blue peak comes from the electron transition from the Zn_i level to the top of the valence band and the violet peak from the In_Zn donor level to the V_Zn level, respectively.     

Synthesis and characterization of photoluminescent In-doped CdSe nanoparticles

Indium-doped CdSe nanoparticles have been synthesized and characterized. Their light absorption, photoluminescence, and structure are similar to undoped CdSe nanoparticles. The greater part of the In associated with the nanoparticles is removed when the nanoparticles undergo ligand exchange by pyridine. As observed with undoped nanoparticles, a ZnS capping layer on the indium-doped nanoparticles results in enhanced nanocrystal photoluminescence. Also, the ZnS cap enhances the retention of In by the nanoparticles. Elemental analysis shows ligand exchange causes CdSe to be lost and capping with ZnS results in the loss of Se. We conclude that In-doped nanoparticles have most of the In on their surface, capping helps the nanoparticles retain the In, and they do not have altered electronic properties.     

Growth and characteristics of hydrogenated In-doped ZnO thin films by pulsed DC magnetron sputtering

We investigated the role of hydrogen impurities in highly oriented In-doped ZnO (IZO:H) films. The conductivity of ZnO:H films exhibit small variation despite the increase of hydrogen ratio. The small variation of the carrier concentration in IZO:H films can be explained by the reduction of the oxygen deficiency for the charge neutrality and the increase of Vzn-H bonding for partially charge compensation in the films. The additional mode at 573 cm⁻¹ is interpreted as vacancy clusters. The discrepancy between the increase of vacancy clusters (573 cm⁻¹) and small variation of carrier concentration is attributed to the different physical characteristics of the IZO:H films due to the hydrogen existence between bulk and surface. The measured FT-IR peak at 3500 cm⁻¹ exhibits typical characteristic of O-H bonding.     

In掺杂ZnO薄膜的制备及其白光发射机理

采用溶胶-凝胶法在Si衬底上制备了本征ZnO薄膜和In:(Zn+In)分别为5%,8%,10%的ZnO薄膜,对薄膜的晶相结构和光电性质进行了表征并在CIE-XYZ表色系统中计算了不同样品的色品坐标.结果表明:In掺入后ZnO薄膜的择优生长方向由(002)面变为(101)面且面间距变小,当In掺杂量为5%时,In原子完全替代Zn原子;薄膜的电阻率随In含量的增加出现先抑后扬的趋势;随着In的掺入光谱的紫外发射峰红移,并在670 nm左右出现一个新的峰值;In:(Zn+In)为5%样品具有白光发射特性.从第一 关键词： In掺杂ZnO薄膜 溶胶-凝胶 色品坐标 白光发射     

In掺杂对化学共沉淀法合成的SnO_2粉体Zeta电位的影响

以四氯化锡、三氯化铟和氨水为原料,采用化学共沉淀法制备了In掺杂SnO_2粉体.实验采用XRD和Zeta电位分析仪对In掺杂SnO_2粉体的物化性能进行了研究.结果表明:当In掺杂浓度为2 mol;时,掺杂SnO_2粉体具有较低的Zeta电位.相对于纯SnO_2粉体,In掺杂改变了SnO_2的晶胞参数并增大了其晶胞体积.     

In掺杂ZnO薄膜的制备及其特性研究

采用射频反应溅射技术在硅(100)衬底上制备了未掺杂和掺In的ZnO薄膜。掠角X射线衍射测试表明,实验中制备的掺In样品为ZnO薄膜。用X射线衍射仪、原子力显微镜和荧光分光光度计分别对两样品的结构、表面形貌和光致发光特性进行了表征,分析了In掺杂对ZnO薄膜的结构和发光特性的影响。与未掺杂ZnO薄膜相比,掺In ZnO薄膜具有高度的C轴择优取向,同时样品的晶格失配较小,与标准ZnO粉末样品之间的晶格失配仅为0．16％;掺In ZnO薄膜表面平滑,表面最大不平整度为7nm。在掺In样品的光致发光谱中观察到了波长位于415nm和433nm处强的蓝紫光双峰,对掺In样品的蓝紫双峰的发光机理进行了讨论,并推测出该蓝紫双峰来源于In替位杂质和Zn填隙杂质缺陷。     

用射频溅射技术在硅衬底上制备In掺杂ZnO薄膜

以金属锌(Zn)和金属铟(In)为靶材采用射频反应共溅射技术在硅(100)衬底上沉积了In掺杂ZnO薄膜。用X射线衍射仪、扫描电子显微镜(SEM)、热探针、四探针和荧光分光光度计分别对样品的结构、表面形貌、导电类型、电阻率和发光特性进行了分析表征。测试结果表明,实验中制备出的ZnO薄膜具有高度的c轴择优取向和小压应力(0.74GPa),薄膜表面平整。样品为n型导电,电阻率为1.6Ω·cm。在室温光致发光谱测量中,首次观察到位于415～433nm的强的蓝紫光双峰发射,发光双峰的半峰全宽约为400meV。讨论了In掺杂对薄膜发光特性的影响。     

掺铟氧化锌纳米阵列的制备、结构及性质研究

通过碳热辅助化学气相沉积法,用Au做催化剂在850℃下制备了铟掺杂的氧化锌（In/ZnO）纳米阵列.纳米棒的尺寸均匀,表面光滑,直径约为400 nm,长为2—3 μm.能量色散谱和X射线光电子能谱分析表明, 六棱柱状的纳米阵列中成功地进行了In 的掺杂,含量约为08%.室温光致发光谱显示掺杂后的紫外发射峰位有红移,峰的半高宽变大, 没有观察到绿光发射峰位.拉曼光谱显示出ZnO的峰位有不同程度的偏移,并且有新的峰位出现,这表明In的掺杂有效地取代了部分Zn的晶格. 关键词： In掺杂 ZnO 纳米阵列 光致发光     

Ultrasonic synthesis of In-doped SnS nanoparticles and their physical properties

Indium (In)-doped Tin (II) Sulfide (SnS) nanoparticles (NPs) were synthesized by an ultra-sonication method and their optical, electrical, dielectric and photocatalytic properties were investigated. XRD patterns of the obtained NPs indicated formation of orthorhombic polycrystalline SnS. Field emission scanning electron microscopy exhibited flower-like NPs with particle sizes below 100 nm for both SnS and In-doped SnS samples. Optical analysis showed a decrease in energy band gap of SnS NPs upon In doping. In addition, electrical results demonstrated p-type nature of the synthesized SnS NPs and enhanced electrical conductivity of the NPs due to increased tin vacancy. Dielectric experiments on SnS NPs suggested an electronic polarizations effect to be responsible for changing dielectric properties of the particles, in terms of frequency. Finally, photocatalytic experiments revealed that high degradation power can be obtained using In-doped SnS NPs.     

Erratum to “Indium doping effect on properties of ZnO nanoparticles synthesized by sol-gel method”

Figure 2 in our original paper [Chin. Phys. B 28 047701(2019)] was downloaded by default. We present the correct figure in this erratum.