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An edge emitting laser with two symmetrical near-circular spots located far field (FF) is demonstrated using tapered double-sided Bragg reflection waveguides (BRWs). The BRWs consist of six pairs of top p-type and bottom n-type A10.Ga0.9 As/A10.3 Ga0.7As Bragg reflectors with a period thickness of 850 nm. The device has a 4° tapered angle configuration and exhibits two stable circular beams with a separation angle of 52°. Typical FF angles of 5.87° and 7.8° in the lateral and vertical directions, respectively, are achieved. The lateral FF angle in the ridged section is independent of the injection current (〉0.8 A) beeause of narrow ridge (-10 μm) confinement. By contrast, the FF angle in the tapered section shows an increase rate of 1.2 1.66°/A. The periodic modulation of the lasing wavelength is observed to be sensitive to self-heating effects. 相似文献
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The dependence of the sinkage at the threshold of the electric derivative curve (IdV/dI-I) on the uniformity and the quality of the laser diode bar is analyzed. By using the equations derived from the equivalent circuits of the bars, the influence of the bar uniformity on the depth of the dip is investigated in theory under certain conditions. Furthermore, the experimental results based on the presented technique indicate that the depth of the dip is interrelated to the uniformity and the quality of the corresponding bar. The present technique can be used conveniently and effectively to measure the laser diode bars in practice. 相似文献
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Experiments on developing a frequency-stabilized 555.8-nm laser are presented. The 555.8-nm laser' is obtained by frequency doubling of a l lll.6-mn diode laser through single-passing a periodically poled lithium niobate (PPLN) waveguide. Tile 555.8-nm laser is then locked to a stable high-finesse Fabry Perot (FP) cavity by tile Pound Drever--Hall (PDH) technique. Tile finesse of the cavity is measured by tile heterodyne cavity ring-down spectroscopy technique. The linewidth of the 555.8-nm laser is investigated. Alter the laser is locked, the laser line width is reduced to about 3 kHz. This frequency-stabilized 555.8-nm laser is used in experiments on the laser cooling and trapping of ytterbium atoms to develop an ytterbium optical clock. 相似文献
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高功率半导体激光器的结温上升, 不仅影响它的输出功率、斜坡效率、阈值电流和寿命, 而且还会产生光谱展宽和波长偏移. 因此, 热管理成为抽运激光器研发中的一个主要问题. 本文首先建立了噪声功率谱与结温变化的物理模型, 根据压缩感知理论, 将测量得到含有高斯白噪声和1/f噪声的混叠复合噪声信号稀疏化后, 进行基追踪算法去噪, 通过改变算法的迭代次数及测量矩阵大小, 获得1/f噪声电压功率谱与结温变化关系曲线, 避免了直接测量结温的复杂性.通过数值估计结果, 可以较好地指导高功率半导体激光器的热管理工作.
关键词:
f噪声')" href="#">1/f噪声
结温度
热阻
高功率半导体激光器 相似文献
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测量了高功率976nm InGaAs量子阱半导体激光器在低于1/30阈值电流下的低频电噪声,提出了以1/f噪声时域信号小波系数相关性与电流的关系来分析噪声来源的方法.结合1/f噪声源理论模型及小波变换系数的特性,完成了不同偏置电流下纯1/f噪声、加白噪声后的1/f噪声两种情况下的对比实验.实验结果表明:所测的低频噪声表现为明显的1/f噪声,对于纯1/f噪声,噪声幅度和小波系数相关性在判断噪声来源时具有相同的结果;对于加白噪声后的1/f噪声,噪声幅度变化很大且不能正确表征1/f噪声来源,而部分尺度下的小波系数相关性仍能作为判断噪声来源的可靠参量. 相似文献
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对1 060 nm高功率垂直腔面发射激光器的有源区进行了理论计算和设计。对比了GaAsP、GaAs和AlGaAs三种不同材料的垒层所组成的高应变InGaAs量子阱的性能。为了确定有源区阱层和垒层的参数,考虑了自热效应对功率的影响,使得模型更加精确可靠。发现所设计的In0.28Ga0.72As量子阱的阱宽和阱数的最佳值分别为9 nm和3个,输出功率可以达到瓦级。另外,对比了三种不同垒层的温度特性,结果显示,使用GaAsP垒层的器件在高温下具有更高的功率和更好的温度稳定性。最后,利用MOCVD生长了InGaAs/GaAsP量子阱并测试了其PL谱,实验数据与理论结果符合得很好。 相似文献
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根据微腔原理运用传输矩阵法对构成微腔有机电致发光器件(MOLED)谐振腔的两个反射镜进行模拟计算并比较,可观察到:随金属反射镜的反射率增大,微腔器件的电致发光(PL)谱的半峰全宽(FWHM)逐渐窄化;峰值逐渐蓝移至设计的谐振峰值520nm处;峰值强度和光谱积分强度逐渐增强。结果表明:金属反射镜反射率越大越好。随DBR反射镜的周期数从1增加到9,EL的峰值均为520nm,半峰全宽逐渐窄化,积分强度逐渐减弱;峰值强度由弱增强再减弱,4个周期时峰值强度最大,所以设计微腔器件时,DBR的周期是一项很重要的参数。DBR反射率太大不利于出光,太小微腔效应小。需要根据制作目的和需要进行合理选择。 相似文献