Measurements of charge transfer ef f iciency in a proton-irradiated swept charge device

Charged Coupled Devices(CCDs) have been successfully used in several low energy X-ray astronomical satellites over the past two decades. Their high energy resolution and high spatial resolution make them a perfect tool for low energy astronomy, such as observing the formation of galaxy clusters and the environment around black holes. The Low Energy X-ray Telescope(LE) group is developing a Swept Charge Device(SCD) for the Hard Xray Modulation Telescope(HXMT) satellite. A SCD is a special low energy X-ray CCD, which can be read out a thousand times faster than traditional CCDs, simultaneously keeping excellent energy resolution. A test method for measuring the charge transfer efficiency(CTE) of a prototype SCD has been set up. Studies of the charge transfer inefficiency(CTI) with a proton-irradiated SCD have been performed at a range of operating temperatures. The SCD is irradiated by 3×108cm-210 MeV protons.     

Proton irradiation effect on SCDs

The Low Energy X-ray Telescope is one of the main payloads on the Hard X-ray Modulation Telescope satellite.Swept charge devices(SCDs)are selected as detectors for the Low Energy X-ray Telescope.As SCDs are sensitive to proton irradiation,irradiation tests were carried out on the HI-13 accelerator at the China Institute of Atomic Energy.The beam energy was measured to be 10 MeV at the SCD.The proton fluence delivered to the SCD was 3×108protons/cm2over two hours.By comparing the performance before and after irradiation,it is concluded that proton irradiation affects both the dark current and the charge transfer inefficiency of the SCD.The energy resolution of the proton-irradiated SCD is 212 eV@5.9 keV at-60?C,while it before irradiated is 134 eV.Moreover,better performance can be reached by lowering the operating temperature of the SCD in orbit.     

A digital CDS technique and its performance testing

Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e^- and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.     

一种利用混合介质测量SBS介质布里渊线宽的方法

提出了一种利用双池受激布里渊散射(SBS)系统选用混合介质,进而测量SBS介质布里渊线宽的方法.在紧凑双池SBS系统的放大池中放入待测介质,在振荡池中放入布里渊频移可调的混合介质,测出放大池待测介质增益系数随布里渊频移偏离的洛伦兹曲线,该曲线半高处的线宽即为待测介质的布里渊线宽.实验上在Nd:YAG调Q激光系统中,选用CCl₄/C₆H₆混合介质,测量了四氯乙烯(C₂Cl₄)、六氯丁二烯(C_{关键词： 受激布里渊散射 混合介质 布里渊线宽}