基于多层膜偏振元件的软X射线磁光Faraday偏转测量

在北京同步辐射装置(BSRF)的3W1B软X射线光束线上利用自行研制的同步辐射软X射线综合偏振测量装置对Ni的M_2,3边附近(60—70 eV)进行了软X射线磁光(magneto-optical)法拉第效应(Faraday effect)的偏转测量,实验装置主要由起偏器,检偏器,样品架,圆形钕铁硼永磁铁和MCP探测器组成,偏振元件(起偏元件和检偏元件)均采用反射式非周期性Mo/Si宽带多层膜.实验采用反射起偏和反射检偏的模式,得到一系列能量范围在60—70 eV间的法拉第偏转角结果, 关键词： 软X射线 磁光Faraday效应 综合偏振测量装置 宽带多层膜     

Performance of a polarizer using synthetic mica crystal in the 12——25 nm wavelength range

To develop polarizer functioning in the extreme ultraviolet (EUV) and soft X-ray region, the polarization performance of synthetic mica has been investigated theoretically with a simulation code using Fresnel equations and optical constants from the Henke database. The reflectance of synthetic mica crystal for s and p polarization was measured to investigate its polarization performance in a home-made synchrotron radiation soft X-ray polarimeter at beamline 3W1B, Beijing Synchrotron Radiation Facility (BSRF). The reflectivity of the synthetic mica crystal at an angle of grazing incidence of 48° was obtained from the experimental data, which is about 4.8 × 10^-3 at 25 nm and 6.0 × 10^-4 at 12 nm, and the linear polarizance of the X-ray reflected by the synthetic mica crystal that we measured using an analyzer-rotating method increases from 80% to 96.6% in this EUV region, while higher than 98.2% in the simulation. The result indicates that this synthetic mica crystal works as a practical polarizer in this EUV region of 12--25 nm, and also in an extensive wavelength region higher than 25 nm.     

Soft X-Ray Magneto-optical Faraday Effect around Ni M2,3 Edges

We present magneto-optical （MO） Faraday spectra measured around the M2,3 edges （60-70eV） of Ni films at the Beijing Synchrotron Radiation Facility （BSI~F）. A polarization analysis of the final state of the transmitted radiation from the Ni film is employed to determine the Faraday rotation at the edges. The MO effect becomes resonantly enhanced at the M2,3 edges, and accordingly large values for the rotation angle β of 1.85 ± 0.19° for this ferromagnetic Ni film with thickness of 31 nm are measured. Without the magnetic field, the azimuthal angles do not shift; with parallel and antiparallel magnetic field the rotation angles shift in the opposite way and they are symmetrical. The uncertainty of Faraday rotation angles mainly comes from the data fitting and the state change of the beamline when the angles are measured.     

Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

Integral diffraction coefficients of the crystal are the essential data of a crystal spectrometer which is extensively used to measure quantitative x-ray spectra of high temperature plasmas in kilo-electron-volt region. An experimental method has been developed to measure the integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility. The integral diffraction coefficients of several crystals including polyethylene terephthalate (PET), thallium acid phthalate (TlAP) and rubidium acid phthalate (RAP) crystals have been measured in the x-ray energy range 2100--5600 eV and compared with the calculations of the 'Darwin Prins' and the 'Mosaic' models. It is shown that the integral diffraction coefficients of these crystals are between the calculations of the 'Darwin Prins' and the 'Mosaic' models, but more close to the `Darwin Prins' model calculations.