High uniformity and forming-free ZnO-based transparent RRAM with HfO_x inserting layer

The impacts of HfO_x inserting layer thickness on the electrical properties of the ZnO-based transparent resistance random access memory(TRRAM) device were investigated in this paper. The bipolar resistive switching behavior of a single ZnO film and bilayer HfO_x/ZnO films as active layers for TRRAM devices was demonstrated. It was revealed that the bilayer TRRAM device with a 10-nm HfO_x inserted layer had a more stable resistive switching behavior than other devices including the single layer device, as well as being forming free, and the transmittance was more than 80% in the visible region. For the HfO_x/ZnO devices, the current conduction behavior was dominated by the space-charge-limited current mechanism in the low resistive state(LRS) and Schottky emission in the high resistive state(HRS), while the mechanism for single layer devices was controlled by ohmic conduction in the LRS and Poole–Frenkel emission in the HRS.     

高温热脱附技术对柴油机尾气颗粒物中小分子易挥发组分的分析研究

柴油机排放的颗粒物含量很高,约为汽油机的30～80倍[1].颗粒物中吸附的有机化合物可以诱发人类发生癌变和呼吸系统的疾病,因而被认为是对人类健康造成不利影响的最大因素之一.     

应用裂解气相色谱-质谱对聚a-烯烃减阻聚合物的鉴别

石油工业的迅速发展,使得原油及各种燃料油的管道运输量日益增加.在管道运输过程中,石油与管路系统的摩擦阻力限制了其运输,造成管道运输量的降低和能量消耗的增加.     

基于光子晶体光纤的弱压力传感器研究

利用有限元法仿真了光子晶体光纤的双折射与横向压力之间的关系,研究弱压力条件下光子晶体光栅的特性。虽然光子晶体光纤比传统的阶跃光纤对压力更为敏感,但弱压力导致的双折射变化很小,应用测量布拉格波长的变化测量压力的变化比较困难。采用偏振相关损耗来测量外界微弱压力导致的双折射变化。仿真结果表明：利用偏振相关损耗的方法,测量灵敏度可达0.75dB/MPa。     

裂解气相色谱-质谱对二元共混橡胶体系进行定量分析的新方法

自1954年起,裂解气相色谱-质谱作为一种分析测试的工具就被广泛应用[1].并且不断有人应用其来对高分子材料进行各种科学研究[2-4].