嵌段共聚物薄膜快速自组装方法

嵌段共聚物 (BCP) 薄膜可通过不同的退火方法诱导其微相分离,从而获得大面积圆柱状、层状和球状等纳米图案。这些长程有序的纳米结构形态,已经广泛应用在纳米光刻和电子器件等多个领域中。目前,有效且快速的退火方法仍然是BCP薄膜自组装技术中的研究热点。本文首先介绍了制备BCP薄膜纳米结构图案常用的退火技术,然后综述了三种新型快速退火技术,最后分析总结了这些退火技术的优缺点。     

Improved device reliability in organic light emitting devices by controlling the etching of indium zinc oxide anode

A controllable etching process for indium zinc oxide （IZO） films was developed by using a weak etchant of oxalic acid with a slow etching ratio. With controllable etching time and temperature, a patterned IZO electrode with smoothed surface morphology and slope edge was achieved. For the practical application in organic light emitting devices （OLEDs）, a sup- pression of the leak current in the current-voltage characteristics of OLEDs was observed. It resulted in a 1.6 times longer half lifetime in the IZO-based OLEDs compared to that using an indium tin oxide （ITO） anode etched by a conventional strong etchant of aqua regia.     

Dependence of charge trapping of fluorescent and phosphorescent dopants in organic light-emitting diodes on the dye species and current density

This paper utilizes multilayer organic light-emitting diodes with a thin layer of dye molecules to study the mechanism of charge trapping under different electric regimes. It demonstrates that the carrier trapping was independent of the current density in devices using fluorescent material as the emitting molecule while this process was exactly opposite when phosphorescent material was used. The triplet--triplet annihilation and dissociation of excitons into free charge carriers was considered to contribute to the decrease in phosphorescent emission under high electric fields. Moreover, the fluorescent dye molecule with a lower energy gap and ionized potential than the host emitter was observed to facilitate the carrier trapping mechanism, and it would produce photon emission.