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Annealing effect of platinum-incorporated nanowires created by focused ion/electron-beam-induced deposition 下载免费PDF全文
Focused ion-beam-induced deposition(FIBID) and focused electron-beam-induced deposition(FEBID) are convenient and useful in nanodevice fabrication. Since the deposition is from the organometallic platinum precursor, the conductive lines directly written by focused ion-beam(FIB) and focused electron-beam(FEB) are carbon-rich materials. We discuss an alternative approach to enhancing the platinum content and improving the conductivity of the conductive leads produced by FIBID and FEBID, namely an annealing treatment. Annealing in pure oxygen at 500?C for 30 min enhances the platinum content values from ~18% to 30% and ~ 50% to 90% of FIBID and FEBID, respectively. Moreover, we find that thin films will be formed in the FIBID and FEBID processes. The annealing treatment is helpful to avoid the current leakage caused by these thin films. A single electron transistor is fabricated by FEBID and the current–voltage curve shows the Coulomb blockade effect. 相似文献
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针对不同场景下的无线信道场景识别问题,基于实测数据建立了时域、频域、图域"指纹"特征模型,提取出时延拓展、1/10带宽、多普勒频移、频带极大值数、信息熵共计五个"指纹"特征.基于"指纹"特征模型建立了"场景识别"模型、"区域划分"模型和指标评价模型,仿真结果表明模型能够合理有效区分不同场景下的无线信道. 相似文献
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