Metastable Electron Traps in Modified Silicon-on-Insulator Wafer

We perform the total ionizing radiation and electrical stress experiments to investigate the electrical characteristics of the modified silicon-on-insulator(SOI) wafers under different Si ion implantation conditions. It is confirmed that Si implantation into the buried oxide can create deep electron traps with large capture cross section to effectively improve the antiradiation capability of the SOI device. It is first proposed that the metastable electron traps accompanied with Si implantation can be avoided by adjusting the peak location of the Si implantation reasonably.     

基于光谱的中医舌色客观化方法初探

为了更加客观地反映舌的生理、病理变化,探讨了基于光谱的舌色客观化的新方法。按照国际照明委员会推荐的测色标准照明和观测条件测量舌体的反射光谱,并将测量得到的反射光谱进行归一化处理,以尽可能地除去光源等测量条件变化带来的影响。将光谱学的方法应用于舌诊领域,在多个波长上精确分析舌色信息,能够更加客观准确地刻画舌的颜色,提供更多与人体健康状况相关的微观信息,如舌组织成分、微循环状态和舌组织结构等,克服了以往方法不能准确、祥实反映组织成分、结构以及微循环状态,量化指标不精确、实用性差的缺点。通过对物体和人舌光谱数据进行的初步采集实验,证明相比于现有的比色法,光谱法既可以更全面、深入、客观地反映人舌所携带的生理和病理信息,突出舌色的细微区别,又可以用特征参数准确度量来表征,与现有物理基准相衔接,从而促进舌色客观化的研究进程。