采用两步压强法制备优质微晶硅薄膜

针对氢化微晶硅薄膜吸收系数较低、制备需要较高厚度,从而需要较高沉积速度的问题,考虑到压强对沉积速度及晶化比的重要影响,在分析了单一压强法制备薄膜优缺点的基础上,提出了采用两步法来制备高质量微晶硅薄膜的方法.即先采用高压制备薄膜2min,减小非晶转微晶的孵化层厚度,然后再采用低压制备薄膜18min,提高薄膜的致密度及减小氧含量,最后制备出了光敏性较高,晶化比较大并且光照稳定性也较好的优质氢化微晶硅薄膜.     

Study on stability of hydrogenated amorphous silicon films

Hydrogenated amorphous silicon （a-Si：H） films with high and same order of magnitude photosensitivity （-10^5） but different stability were prepared by using microwave electron cyclotron resonance chemical vapour deposition system under the different deposition conditions. It was proposed that there was no direct correlation between the photosensitivity and the hydrogen content （CH） as well as H-Si bonding configurations, but for the stability, they were the critical factors. The experimental results indicated that higher substrate temperature, hydrogen dilution ratio and lower deposition rate played an important role in improving the microstructure of a-Si：H films. We used hydrogen elimination model to explain our experimental results.