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A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer. 相似文献
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一、引言 激光可见光探针是激光等离子体研究中有效的诊断工具,能达到很高的时空分辨率。在钕玻璃激光打靶实验中,通常采用从打靶光分出一部分经倍频和受激喇曼前向散射来得到可见光探针。倍频和散射过程使光脉冲得到了压缩,但是,受激喇曼前向散射的压缩性 相似文献
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本文给出了最近在上海光学精密机械研究所LF12激光装置上完成的复合泵浦类锂硅离子软X射线激光系统实验的结果,特别是第一次在较低激光辐照强度下同时观察到类锂硅离子5f—3d,5d—3p,6f—3d和6d—3p跃迁的显著自发发射放大(ASE),波长分别为88.84,87.28,75.83和74.64,测得的增益系数和增益-长度乘积分别在1—2cm-1和2.0—4.5之间。另外还给出了增益沿靶面法线方向的空间分布和随靶面激光辐照强度的变化。用Edlen半经验公式和Cowan原子结构编码计算的4条激光谱线波长值与实验测量值符合很好。本实验结果表明复合泵浦类锂离子方案在将软X射线激光推进到“水窗”(43.8—23.3)波段中有巨大潜力。 相似文献