| A spectroscopic method for determining thickness of quartz wave plate |
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| 作者姓名： | 冯伟伟 林礼煌 陈立刚 朱化凤 李儒新 徐至展 |
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| 作者单位： | State Key Laboratory of High Field Laser Physics Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，State Key Laboratory of High Field Laser Physics，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，Remote Sensing Laboratory，Anhui Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Hefei 230031，College of Physics Science and Technology，China University of Petroleum，Qingdao 266555，State Key Laboratory of High Field Laser Physics，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，State Key Laboratory of High Field Laser Physics，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800 |
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| 基金项目： | This work was supported by the National Ba sic Research Program of China (973 Program) under Grant No. 2006CB806000. |
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| 摘 要： | A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.
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