Depth profiling of polymer samples using Ga+ and C60+ ion beams

In this contribution, we focus on the use of C₆₀⁺ ions for depth profiling of model synthetic polymers: polystyrene (PS) and poly(methylmethacrylate) (PMMA). These polymers were spin coated on silicon wafers, and the obtained samples were depth‐profiled both with Ga⁺ ions and C₆₀⁺ ions. We observed an important yield enhancement for both polymers when C₆₀⁺ ions are used. More specifically, we discuss here the decrease in damage obtained with C₆₀, which is found to be very sensitive to the nature of the polymer. During the C₆₀⁺ sputtering of the PMMA layer, after an initial decrease, a steady state is observed in the secondary ion yield of characteristic fragments. In contrast, for PS, an exponential decrease is directly observed, leading to an initial disappearance cross section close to the value observed for Ga⁺. Though there is a significant loss of characteristic PS signal when sputtering with C₆₀⁺ ions beams, there are still significant enhancements in sputter yields when employing C₆₀⁺ as compared to Ga⁺. Copyright © 2008 John Wiley & Sons, Ltd.     

XPS calibration study of thin‐film nickel silicides

This paper presents a systematic X‐ray photoelectron spectroscopy (XPS)study of the Ni silicides Ni₃Si, Ni₃₁Si₁₂, Ni₂Si, NiSi and NiSi₂ produced by annealing of sputtered thin films. The in situ XPS study focuses on both the core level peaks and Auger peaks. The peak positions, shapes, satellites as well as Auger parameters are compared for different silicides. The factors that influence the Ni core level peak shifts are discussed. The Ni 2p_3/2 peak shape and satellites are correlated with the valence band structure. The effect of argon ion etching on surface composition and chemical states is also investigated. Copyright © 2009 John Wiley & Sons, Ltd.     

Comparison of two parameter choice methods for the extraction of depth profiles by means of a regularized multipoint profile model from ARXPS data obtained on a three‐component system

Polystyrene films were exposed to nitrogen plasmas for periods up to 8 min. Angle‐resolved X‐ray photoelectron spectroscopy measurements revealed the presence of oxygen and nitrogen in the surface due to the plasma treatment. The depth profiles of these adatoms were determined by fitting a regularized multipoint linear segment model to the data. A regularization parameter chosen such that the chi‐square statistic of the fit to the data was equal to the number of independent data points gave a more intuitive result than a parameter chosen according to the L‐curve criterion. Although the shape of the nitrogen depth profile was observed to vary as a function of the plasma duration, the oxygen depth profiles were nearly identical. Copyright © 2009 John Wiley & Sons, Ltd.     

深圳城市气溶胶物理光学特性的观测研究

气溶胶是影响气候变化和空气污染的重要因子.在深圳地区展开气溶胶观测实验,可以获得可靠的光学物理特征,进而有助于准确评估气溶胶在新型超极城市区域的气像和环境效应.本文利用2010年12月至2011年8月太阳光度计、黑碳和浊度计等气溶胶观测资料,分析了新型超级城市深圳地区的气溶胶物理光学特性.深圳地区气溶胶呈明显季节变化,冬、春季由于城市污染性气溶胶的影响,气溶胶光学厚度和Angstrom波长指数都较大,夏季受海盐气溶胶的影响,光学厚度较小,Angstrom波长指数也较小.光学厚度与Angstrom 波长指数对比表明城市综合性污染是引起深圳气溶胶高光学厚度的主要原因.深圳地区气溶胶的散射系数、吸收系数的平均值(标准偏差)分别为178.7×10^-6 m^-1(126.6×10^-6 m^-1)和32.5×10^-6 m^-1(18.1×10^-6 m^-1),均低于珠三角腹地多年观测平均值的二分之一和国内其他大型城市观测值.而单次散射反照率为0.81,与珠三角其他地区得到的结果接近.此外,气溶胶吸收、散射和单次散射反照率呈明显日变化,可能主要受大气边界层变化的影响.     

Hydrogen detection near surfaces and shallow interfaces with resonant nuclear reaction analysis

This review introduces hydrogen depth profiling by nuclear reaction analysis (NRA) via the resonant ¹H(¹⁵N,αγ)¹²C reaction as a versatile method for the highly depth-resolved observation of hydrogen (H) at solid surfaces and interfaces. The technique is quantitative, non-destructive, and readily applied to a large variety of materials. Its fundamentals, instrumental requirements, advantages and limitations are described in detail, and its main performance benchmarks in terms of depth resolution and sensitivity are compared to those of elastic recoil detection (ERD) as a competing method. The wide range of ¹H(¹⁵N,αγ)¹²C NRA applications in research of hydrogen-related phenomena at surfaces and interfaces is reviewed.Special emphasis is placed on the powerful combination of ¹H(¹⁵N,αγ)¹²C NRA with surface science techniques of in-situ target preparation and characterization, as the NRA technique is ideally suited to investigate hydrogen interactions with atomically controlled surfaces and intact interfaces. In conjunction with thermal desorption spectroscopy, ¹⁵N NRA can assess the thermal stability of absorbed hydrogen species in different depth locations against diffusion and desorption. Hydrogen diffusion dynamics in the near-surface region, including transitions of hydrogen between the surface and the bulk, and between shallow interfaces of nanostructured thin layer stacks can directly be visualized. As a unique feature of ¹⁵N NRA, the analysis of Doppler-broadened resonance excitation curves allows for the direct measurement of the zero-point vibrational energy of hydrogen atoms adsorbed on single crystal surfaces.     

Effects of some parameters on the divertor plasma sheath characteristics and fuel retention in castellated tungsten tile gaps

Castellation of plasma facing components is foreseen as the best solution for ensuring the lifetime of future fusion devices. However, the gaps between the resulting surface elements can increase fuel retention and complicate fuel removal issues. To know how the fuel is retained inside the gaps, the plasma sheath around the gaps needs to be understood first. In this work, a kinetic model is used to study plasma characteristics around the divertor gaps with the focus on the H＋ penetration depth inside the poloidal gaps, and a rate-theory model is coupled to simulate the hydrogen retention inside the tungsten gaps. By varying the magnetic field strength and plasma temperature, we find that the H＋ cyclotron radius has a significant effect on the penetration depth. Besides, the increase of magnetic field inclination angle can also increase the penetration depth. It is found in this work that parameters as well as the penetration depth strongly affect fuel retention in tungsten gaps.     

高光谱成像仪等效焦面装调模组设计

高光谱成像仪CCD组件在装调时,纵向需要满足20 μm焦深要求,横向需要实现光谱维、空间维的对准。为了避免检测时对昂贵的CCD频繁安装、拆除,设计了一种等效焦面装调模组。等效模组按照CCD组件的实测尺寸精密制造,提供了可供显微镜观察的模拟光谱像。通过测量实际光谱像和模拟光谱像的位置差别能够获取修磨垫的修整量,并实现光谱像和CCD像元的横向对准。试验表明,存在工具显微镜测量误差、修磨垫加工误差、互换性误差时,光谱像面各处离焦量均小于焦深。试验中仅用3次迭代即达到MTF为0.3的要求,提高了装调效率和操作安全性。     

基于视差自相关特征水深反演

提出了一种基于视差自相关特征模拟水深的新方法。这种方法利用不同摄站获取的同一物体的两幅图像,在水的折射影响下,造成的视觉上的偏差计算水深,可以得到相关区域三维显示中各点的水深数值。以数码相机所拍摄两张照片为例,实现相关区域水深三维显示。结果表明此算法具有一定的可行性,可以进行更深层次的研究,并应用于浅海、河流等地的资源探测开发。     

Formation of niobium oxynitrides by rapid thermal processing (RTP)

The potential of rapid thermal processing (RTP) for the preparation of thin films of niobium oxynitrides was investigated. The 200 and 500 nm niobium films were deposited via sputtering on oxidized silicon(1 0 0)- and on sapphire(1 −1 0 2)-substrates. At first, oxidation of niobium films in molecular oxygen and then nitridation in ammonia using an RTP-system was performed. The films were characterized before and after the oxidation and nitridation processes by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS). The influence of the two different substrates, amorphous SiO₂ and single crystalline sapphire on the reactivity of the niobium films was studied in dependence of temperature, time of reaction and film thickness. The existence of niobium oxynitride formation was verified for some of the films. In some of the experiments, crack formation in the films or even delamination of the Nb-films from the substrates was observed.     

放射性9C束流不同贯穿深度上的线能谱测量

为阐述放射性⁹C束流应用于治癌的物理基础, 运用一个球形生物组织等效正比计数器测量了⁹C束流不同贯穿深度上的线能谱, 得到了沿束流贯穿深度上的剂量平均线能分布. 将实验测量得到的线能谱转换成为不同传能线密度在吸收剂量中所占份额的分布, 得到了该⁹C束流在不同贯穿深度上的剂量平均传能线密度分布. 将生物组织等效正比计数器测量得到的与先前通过平行板正比计数器测量得到的该⁹C束流的剂量平均传能线密度分布进行比较, 发现: 在束流入射通道上, 两者测量数据符合很好, 而在束流Bragg峰附近⁹C离子的沉积区域, 由组织等效正比计数器测量得到的剂量平均传能线密度值大于由平行板正比计数器测量得到的值.