真空退火对355nm Al2O3/MgF2高反射薄膜性能的影响

 采用电子束蒸发沉积技术制备了355nm Al₂O₃/MgF₂ 高反射薄膜，并在真空中进行不同温度梯度的退火，用X射线衍射（XRD）观察了薄膜微结构的变化，用355nm Nd：YAG脉冲激光测试了薄膜的激光损伤阈值，用Lambda 900光谱仪测试了薄膜的透过和反射光谱。结果表明在工艺条件相同的条件下真空退火过程对薄膜的性能有很大的影响，退火温度梯度越小的样品，吸收越小，阈值越大，并且是非晶结构。选择合适的真空退火过程可以减少355nm Al₂O₃/MgF₂ 高反射膜的膜层吸收，提高薄膜的激光损伤阈值。     

力学边界对透射型光学元件激光破坏阈值的影响

 建立了激光与透射型光学元件相互作用的热弹性力学模型,解析求解了自由、固定以及一种人为边界条件下光学元件热-力学响应的定解问题。研究发现,不同的边界条件对破坏阈值有很大的影响。针对光学元件中热应力的演变情形,设计了一种“最佳”边界,消除了激光作用过程中产生的拉应力,从而使破坏阈值在理论上达到最大值。     

Thermal and mechanical damage of GaAs in picosecond regime

An in-depth study of the single pulse and multiple pulse laser (35 ps, 10 Hz and 1064 nm) damage for threshold fluence and greater fluence of GaAs 1 0 0 single crystal is presented. Damage which starts at a power 2×10¹¹ W/cm² in the form of pits occurs due to accumulation of laser induced microscopic defects. Effect of multiple pulse at first makes the pits more prominent in the form of Ga emission. Then the topmost layer is removed. If the number of pulses is further increased new pits are formed in the new surface (beneath the removed surface) and the above process is repeated. The thermal model is sufficient to explain this morphology. However, for larger fluences, a large cracking and fracture and the possibility of both Ga and As emission in different ratios suggest that mechanical damage is a dominant feature for higher fluences which arises due to generation of shock waves and rapid vaporization of material. Damage threshold has been calculated with the help of the thermal model given by Meyer et al. which is in good agreement with our experimental results.     

Calculation of temperature fields with a film-substrate interfacial layer model to discuss the layer-pair number effects on the damage thresholds of LaF3/MgF2 high reflectors at 355 nm

Laser induced damage thresholds (LIDT) of LaF₃/MgF₂ high reflectors at 355 nm were measured and investigated as a function of layer-pair number. Generally, LaF₃/MgF₂ coatings with more layer pairs possessed higher LIDT, but coatings with too high layer-pair number crazed because of high tensile stress, so the LIDT of them decreased badly. The temperature rise in the coatings was calculated based on a film-substrate interfacial absorption model, and the depth of the damage in the coatings were measured by a Veeco optical profilograph. The two characterization methods together were used to interpret the effects of layer-pair number on LIDT, and the damage mechanism of coatings at laser wavelength of 355 nm was also discussed.     

Effect of ammonia treatment on laser-induced damage of nano-porous silica film

The sol-gel monolayer silica films on K9 glass substrates were prepared with the dip method, and then treated in saturated ammonia gas. The laser-induced damage threshold (LIDT) of silica films with and without ammonia treatment was measured. Properties of the films were analyzed by using Stanford photo-thermal solutions (SPTS), ellipsometry, atomic force microscopy (AFM), and optical microscopy to study the effect of ammonia treatment on laser-induced damage of sol-gel monolayer silica film under laser irradiation. The experimental results showed that compared with the as-grown silica film, the silica film with ammonia treatment had larger absorption and smaller porous ratio, and it had smaller LIDT. Considering the improved abrasion resistance of films with ammonia treatment, a trade-off is always needed between abrasion resistance and LIDT in practice.     

氧分压对ZrO2薄膜激光损伤阈值的影响

 在不同的氧分压下用电子束热蒸发的方法制备了ZrO₂薄膜。分别通过X射线衍射、光学光谱、热透镜技术、抗激光辐照等测试，对所制备样品的微结构、折射率、吸收率及激光损伤阈值进行了测量。实验结果表明，薄膜中晶粒主要是四方相为主的多晶结构，并且随着氧分压的增加，结晶度、折射率以及弱吸收均逐渐降低。薄膜的激光损伤阈值开始随着氧分压增加从18.5J/cm²逐渐增加，氧分压为9×10^-3Pa时达到最大，值为26.7 J/cm²，氧分压再增加时则又降低到17.5 J/cm²。由此可见，氧分压引起的薄膜微结构变化是ZrO₂薄膜激光损伤阈值变化的主要原因。     

Optical characterization and laser damage of fused silica optics after ion beam sputtering

The sputtering process of fused silica bombarded by Ar ion beam is simulated with the SRIM software. The effects of ion beam energy and incident angle on sputtering yield and surface damage are computed. Since ion beam sputtering will result in defects in fused silica, such as E′ color centers and other lattice defects and probably Argon bubbles, the optimized sputtering energy is selected below 1 keV so that the projected range of Ar ions is less than 10 Å. The experimental results show that the scratches in subsurface of fused silica can be smoothed obviously and better surface can be obtained as the optimized parameters are used for ion beam sputtering. The laser induced damage threshold of fused silica increases by about 18% after ion beam sputtering.     

物理法和化学法制备的单层ZrO2膜的激光损伤行为差异

 分别采用电子束热蒸发技术和溶胶-凝胶技术在K9基片上镀制了光学厚度相近的ZrO₂单层薄膜,测试了两类薄膜的激光损伤阈值。分别采用透射式光热透镜技术、椭偏仪、原子力显微镜和光学显微镜研究了两类薄膜的热吸收、孔隙率、微观表面形貌、激光辐照前薄膜的杂质和缺陷状况以及激光辐照后薄膜的损伤形貌。实验结果表明：两类薄膜的不同损伤形貌与薄膜的热吸收与微观结构有关， 物理法制备的ZrO₂膜结构致密紧凑，膜层的杂质和缺陷多；化学法制备的ZrO₂膜结构疏松多孔，膜层纯净杂质少，激光损伤阈值达26.9 J/cm²；因物理法制备的ZrO₂膜拥有更大的热吸收(115.10×10^-6)和更小的孔隙率(0.20)，其激光损伤阈值较小(18.8 J/cm²)，损伤主要为溅射和应力破坏，而化学法制备的ZrO₂膜的损伤主要为剥层。理论上对实验结果进行了解释。     

高功率激光诱导光学元件损伤阈值测量的不确定度分析

 激光诱导损伤阈值作为一实验参量,对其结果作不确定度分析有利于激光工作者在某个精度范围内获知该参量的信息。从激光损伤和损伤阈值定义出发,分析了基于ISO11254的损伤几率测试法测试激光诱导损伤阈值的不确定度来源,包括激光能量测量、激光光斑有效面积测量、各能量密度处损伤几率的计算以及对损伤几率点进行直线拟合这4个方面。并利用统计学原理和线性拟合等理论对这4个方面引起的不确定度分量及最终测试结果的相对合成不确定度进行了计算。以1 064 nm高反薄膜样品为例,分析表明：损伤几率点的计算和几率图中损伤几率的直线拟合是损伤阈值测试结果不确定度的主要来源,当样品的损伤阈值为7.79 J/cm²时,这两种因素引起的相对不确定度可分别在4%和18%左右,损伤阈值的相对合成不确定度达18.72%。     

光学材料的激光损伤形态研究

 提出了破坏形态因子的概念并以高功率连续激光作用下的光学材料的热力学响应为例，通过积分变换的方法给出激光作用期间温度场和应力场的解析形式，继而得到破坏形态因子的表达式及其简化形式，研究破坏形态因子与材料性质、激光参数的关系，从而预言特定的材料在特定的激光作用下的破坏形态。