Ti—Si沸石表面吸附物种的TPSR—TPD研究

氯丙烯在不同催化剂表面上吸附的ＴＰＤ结果表明在ＴＳ－１上有三重附峰，而在ＴｉＯ２／Ｓｉｌｉｃａｌｉｔｅ上仅有单峰，Ｈ２Ｏ２或分子Ｏ２在催化剂表面吸附后，在脱附物种中可用质谱检测到原子Ｏ（１６）物种；说明Ｈ２Ｏ２或分子Ｏ２在样品表面存在解离吸附；并发现解离子分子Ｏ２的活性很低，ＴＳ－１能同时吸附内烯和Ｈ２Ｏ２，而在ＳｉＯ２／Ｓｉｌｉｃａｌｉｔｅ表面的吸附却与吸附顺序有关，环氧化活性顺序如下：ＴＳ－１     

A Two-Dimensional Photonic Crystal Slab Mirror with Silicon on Insulator for Wavelength 1.3μm

A concrete two-dimensional photonic crystal slab with triangular lattice used as a mirror for the light at wavelength 1.3μm with a silicon-on-insulator （SOI） substrate is designed by the three-dimensional plane wave expansion method. For TE-like modes, the bandgap in the Г-K direction is from 1087nm to 1559nm. The central wavelength in the bandgap is about 1.3μm, hence the incident light at wavelength 1.3μm will be strongly reflected. Experimentally, such a photonic crystal slab is fabricated on an SOI substrate by the combination of EBL and ICP etching. The measurement of its transmission characteristics shows the bandgap edge in a longer wavelength is about 1540 nm. The little discrepancy between the experimental data and the theoretical values is mainly due to the size discrepancy of the fabricated air holes.     

ZK—4、NaANaHS3种沸石的铝化

用高温气－固相置换法对ZK－4、NaANaHS3种沸石进行铝化。组成分析、尾气分析、X射线衍射、晶体形貌分析、红外光谱和^29Si高分辨魔角固体核磁结果表明，3种低硅铝比沸石铝化后骨架可能存在Al-O-Al键。     

圆形振动膜ZnO压电微传声器的研制

本文介绍了一种新型圆形振动膜ZnO压电微传声器的制备，并对传声器制备的工艺过程进行了较为详细的描述。圆形振动膜的压电传卢器与以前方形振动膜结构设计相比，较大幅度提高了传声器的灵敏度和成品率，灵敏度达到-70dB（相对于1V／Pa），成品率达到80％。     

掺钛蓝宝石与超短脉冲激光

详细阐述掺钛蓝宝石晶体的物理化学与光谱特性，着重介绍了以掺钛蓝宝石晶体为激光介质的各种激光器件及关键技术，对国内外超短脉冲激光的产生与放大技术的发展历史、研究动态和应用前景也作了简单评述。     

硅磷酸铝分子筛SAPO—34稳定性的研究

利用差热分析（ＤＴＡ）、原位ＸＲＤ技术研究了ＳＡＰＯ－３４分子筛原粉样品的晶体结构在模板剂烧除过程以及环境气氛中的变化情况。采用１０７３Ｋ下的高温焙烧和水蒸汽处理以及甲醇转化试验跟踪考察了该分子筛在结构和催化性能上的稳定性。     

Self-Assembly of Micro-Parts onto Si Substrates at Liquid-Liquid Interface

We report a new approach for the self-assembly of cuboid micro-parts onto Si substrates to construct three-dimensional microstructures. To perform assembly, the Si substrates are prepared with a deep cavity array as binding sites. An aggregate composed of hundreds of uniformly aligned micro-parts is formed at the C10F18-H2O interface. The micro-parts are arranged by passing the substrate through the aggregate of micro-parts, thus the micro-parts are left on the substrate, and then the substrate is vibrated ultrasonically in the solution, making it possible for the micro-parts to fall into the cavities on the substrate. Finally the substrate is pulled out of the solution after assembly. This technique could give a high yield of up to 70%, providing a new method for micro-assembly.     

Reduction of Dislocations in GaN Epilayer Grown on Si （111） Substrates using a GaN Intermedial Layer

GaN intermedial layers grown under different pressures are inserted between GaN epilayers and AIN/Si（111） substrates. In situ optical reflectivity measurements show that a transition from the three-dimensional （3D） mode to the 2I） one occurs during the GaN epilayer growth when a higher growth pressure is used during the preceding GaN intermedial layer growth, and an improvement of the crystalline quality of GaN epilayer will be made. Combining the in situ reflectivity and transmission electron microscopy （TEM） measurements, it is suggested that the lateral growth at the transition of growth mode is favourable for bending of dislocation lines, thus reducing the density of threading dislocations in the epilayer.