纳米尺度扫描电化学显微镜的探针制备及在电催化氧和氢反应研究中的应用

扫描电化学显微镜是一种在检测样品表面物理形貌的同时能提供丰富的电化学信息的扫描探针技术,由于超微电极的引入,它可以高时空分辨率地探究各类样品的物理形貌和电化学性能之间的构效关系. 随着现代纳米科技的不断发展,扫描探针的尺寸也逐渐从亚微米发展到纳米级别. 与此同时,高效优选各类氧反应和氢反应电催化材料,明晰其电化学反应过程和性能是二十一世纪绿色新能源转换存储系统（如可再生燃料电池、金属空气电池等）的重要研究方向. 本文首先概括了可应用于扫描电化学显微镜的纳米级扫描探针的制备及发展,之后着重介绍了近四年纳米尺度扫描电化学显微镜在电催化氧反应和氢反应研究中的一些最新研究进展. 最后以点窥面,对未来纳米尺度扫描电化学显微镜的未来发展趋势作了展望.     

扫描探针显微术在巯醇自组装单分子膜纳米刻蚀中的应用

介绍了近十年来扫描探针显微术(SPM)在巯醇自组装单分子膜纳米刻蚀中的应用. 依据扫描探针的工作原理, 依次讨论了扫描隧道显微镜、原子力显微镜和导电原子力显微镜的工作特点和适用范围. 同时也讨论了自组装单分子膜纳米刻蚀术在生物分子传感器、超高密度信息存储等领域的应用前景.     

利用原子力显微镜探针的扫帚机理制备胶原蛋白纳米纤维阵列

利用原子力显微镜能够在微观尺度上对样品材料进行操控和加工的特性,发现并考察了一种自上而下的生物大分子纳米纤维阵列的制备方法。将50μg/mL的天然I型鼠尾胶原蛋白溶液在云母晶面上形成胶原蛋白膜层,接着在原子力显微镜的接触模式下,利用探针对溶液中的胶原蛋白膜层施加100~1000 nN的力时,可以将膜层加工成具有特定取向的蛋白纳米纤维阵列。单根纤维的高度约2~5 nm,宽度在150~350 nm之间。根据纳米纤维阵列的结构与探针扫描方式的关系,对探针的制样原理进行了探讨,验证了原子力显微镜接触模式下的“分子扫帚”机理。此制备方法为生产细胞培养器皿、制备高特异性的生物探针,合成新型微纳材料提供了一种可行技术。     

电沉积二氧化钛纳米微粒膜的光电化学性能和表面形貌研究

采用光电流谱、透射光谱和扫描微探针显微镜技术对电沉积法制备的二氧化钛纳米微粒膜的光电化学性能和表面形貌进行了研究.结果表明,不同制备条件下的二氧化钛纳米微粒膜具有与紧密的半导体电极不同的光电化学性质,并探讨了其光电化学性能与表面形貌的关系.     

化学力显微镜针尖修饰技术研究新进展

评述了化学力显微镜的新成果。对自组装单分子膜修饰扫描探针显微镜针尖,生物分子修饰原子力显微镜针尖,电化学方法修饰扫描隧道显微镜针尖,纳米碳管材料修饰原子力显微镜针尖等作了介绍。     

扫描离子电导显微镜的原理及应用

扫描离子电导显微镜(SICM)是一种扫描探针显微技术,通过测定超微玻璃管探针的离子电流,它能够非接触地扫描样品表面,进而研究样品的形貌及性质。SICM具有成像分辨率高、探针易于制备和对被成像物体无损伤等特点,特别适用于研究生理条件下的活体细胞,是一种与扫描电化学显微镜及原子力显微镜互补的扫描探针显微镜技术。SICM能够对软界面及表面,如活细胞表面的显微结构,进行高分辨率成像;并能够与其它技术联用,研究细胞形貌与功能的关系;还能控制沉积特定分子,实现纳米尺度的显微操作与加工。本文对SICM的发展历史、仪器构造、基本原理及应用进行了综述。     

原子力显微镜

<正>德国Bruker MultiMode 8型原子力显微镜德国Bruker MultiMode 8型原子力显微镜(AFM)的系统配置为MultiMode 8型主系统+NanoScope V型控制器,是全球噪音最低,分辨率最高的扫描探针显微镜;其采样速度高达6 MH,可同时进行8通道实时数据采集和成像;能对高分子、生物、化工、食品、医药等各种材料和样品进行纳米区域的物理性质包括形貌进行探测,或者直接进行纳米操纵;被测样品可为导体、半导体或绝缘体,不需要对被测样品作特殊处理,对样品损害     

光诱导纳米二氧化钛超新水薄膜SPM图像分析和氧空位浓度理论探讨

选用典型的二氧化钛纳米超亲水薄膜,用扫描探针显微镜（SPM）和电化学测试系统进行了一般性的表征。着重运用固体化学和纳米力学的原理,对SPM图像、氧空位浓度和超亲水性的机理进行理论分析;进一步解释了作者于1999年底提出的,与润湿性能有关的二氧化钛缺陷生成反应方程、普通表面物理模型、两憎（amphiphobic)表面概念和材料表面设计问题。     

靶向性纳米金探针对宫颈癌细胞的激光扫描共聚焦散射成像

制备了粒径均一的纳米金颗粒, 再对其表面进行叶酸修饰, 制得具有靶向性的纳米金探针. 利用激光扫描共聚焦显微镜(LSCM), 对靶向性纳米金的细胞特异性散射成像进行研究. 实验结果表明, 人宫颈癌细胞(Hela)对纳米金-叶酸的摄取作用强于对纳米金的摄取, 但随着时间的延长, 两者的差别逐渐减小. 表明在适当的时间内纳米金-叶酸探针对宫颈癌细胞具有良好的靶向性.     

Dip-pen刻蚀技术直接构建聚-L-赖氨酸纳米结构

Dip-pen纳米刻蚀技术(简称DPN技术)为在目标基底上沉积一个有序或连续的图案提供了一条简单而有效的途径,DPN技术是一种直接书写的扫描探针刻蚀技术,它使用原子力显微镜探针针尖,在一定的驱动力下,直接将化学试剂“墨水”转移到目标基底上．近年来,利用DPN技术已经成功地实现了多种“墨水一基底”组合。     

Atomic Force Microscopy for Molecular Structure Elucidation

Using scanning probe microscopy techniques, at low temperatures and in ultrahigh vacuum, individual molecules adsorbed on surfaces can be probed with ultrahigh resolution to determine their structure and details of their conformation, configuration, charge states, aromaticity, and the contributions of resonance structures. Functionalizing the tip of an atomic force microscope with a CO molecule enabled atomic‐resolution imaging of single molecules, and measurement of their adsorption geometry and bond‐order relations. In addition, by using scanning tunneling microscopy and Kelvin probe force microscopy, the density of the molecular frontier orbitals and the electric charge distribution within molecules can be mapped. Combining these techniques yields a high‐resolution tool for the identification and characterization of individual molecules. The single‐molecule sensitivity and the possibility of atom manipulation to induce chemical reactions with the tip of the microscope open up unique applications in chemistry, and differentiate scanning probe microscopy from conventional methods for molecular structure elucidation. Besides being an aid for challenging cases in natural product identification, atomic force microscopy has been shown to be a powerful tool for the investigation of on‐surface reactions and the characterization of radicals and molecular mixtures. Herein we review the progress that high‐resolution scanning probe microscopy with functionalized tips has made for molecular structure identification and characterization, and discuss the challenges it will face in the years to come.     

Multidimensional electrochemical imaging in materials science

In the past 20 years the characterization of electroactive surfaces and electrode reactions by scanning probe techniques has advanced significantly, benefiting from instrumental and methodological developments in the field. Electrochemical and electrical analysis instruments are attractive tools for identifying regions of different electrochemical properties and chemical reactivity and contribute to the advancement of molecular electronics. Besides their function as a surface analytical device, they have proved to be unique tools for local synthesis of polymers, metal depots, clusters, etc. This review will focus primarily on progress made by use of scanning electrochemical microscopy (SECM), conductive AFM (C-AFM), electrochemical scanning tunneling microscopy (EC-STM), and surface potential measurements, for example Kelvin probe force microscopy (KFM), for multidimensional imaging of potential-dependent processes on metals and electrified surfaces modified with polymers and self assembled monolayers. Figure Electrochemical and electrical tools like scanning electrochemical microscopy, conductive atomic force microscopy, electrochemical scannig tunneling microscopy and Kelvin probe force microscopy (see figure) are powerful tools for the multidimensional imaging of potential-dependent processes on metals and electrified surfaces modified with polymers and self assembled monolayers.     

Nanoscale surface modification via scanning electrochemical probe microscopy

Micro- and nanoscale surface modification using scanning probe microscopy techniques in combination with electrochemically induced surface structuring provides a maskless in situ fabrication strategy enabling deposition or etching of three-dimensional nanostructures. This current opinion article focuses on scanning electrochemical probe microscopy techniques highlighting recent progress in nanoscale 3D surface modification along with a spotlight on approaches of practical relevance.     

Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy

It is well known that scanning probe techniques such as scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) routinely offer atomic scale information on the geometric and the electronic structure of solids. Recent developments in STM and especially in non-contact AFM have allowed imaging and spectroscopy of individual molecules on surfaces with unprecedented spatial resolution, which makes it possible to study chemistry and physics at the single molecule level. In this feature article, we first review the physical concepts underlying image contrast in STM and AFM. We then focus on the key experimental considerations and use selected examples to demonstrate the capabilities of modern day low-temperature scanning probe microscopy in providing chemical insight at the single molecule level.     

Summary of ISO/TC 201 Standard: ISO 18115‐2:2010 – Surface chemical analysis – Vocabulary—Terms used in scanning probe microscopy

This International Standard revises ISO 18115:2001 and the two subsequent amendments by bringing the material up to date and by separating the general terms and terms used in spectroscopy into Part 1 and terms relating to scanning probe microscopy into Part 2. This part, Part 2, covers 227 terms used in scanning probe microscopy as well as 86 acronyms. The terms cover words or phrases used in describing the samples, instruments and theoretical concepts involved in surface chemical analysis. Copyright © 2012 Crown copyright.     

Recent advances of scanning electrochemical microscopy and scanning ion conductance microscopy for single-cell analysis

Single-cell analysis is important for understanding fundamental biological processes and mechanisms. Scanning electrochemical microscopy and scanning ion conductance microscopy as two kinds of scanning probe microscopy, with high temporal and spatial resolutions as well as in situ and noninvasive characterization capabilities, emerge as strong tools for single-cell analysis. In this review, we introduce the latest advances of scanning electrochemical microscopy and scanning ion conductance microscopy for single-cell analysis, including characterizations of cell morphology dynamics, membrane properties and mechanics, and monitoring cell surface charge, extracellular pH, and intracellular substances.     

Dielectrophoretic force microscopy of aqueous interfaces

A novel scanning probe microscopy technique has allowed dielectrophoretic force imaging with nanoscale spatial resolution. Dielectrophoresis (DEP) traditionally describes the mobility of polarizable particles in inhomogeneous alternating current (ac) electric fields. Integrating DEP with atomic force microscopy allows for noncontact imaging with the image contrast related to the local electric polarizability. By tuning the ac frequency, dielectric spectroscopy can be performed at solid/liquid interfaces with high spatial resolution. In studies of cells, the frequency-dependent dielectrophoretic force is sensitive to biologically relevant electrical properties, including local membrane capacitance and ion mobility. Consequently, dielectrophoretic force microscopy is well suited for in vitro noncontact scanning probe microscopy of biological systems.     

Enhanced feature analysis using wavelets for scanning probe microscopy images of surfaces

In this work we develop wavelet theory for the analysis of surface topography images obtained by scanning probe microscopy (SPM) such as atomic force microscopy (AFM). Wavelet transformation is localized in space and frequency, which can offer an advantage for analyzing information on surface morphology and topography. Wavelet transformation is an ideal tool to detect trends, discontinuities, and short periodicities on a surface. Additionally, wavelets can be used to remove artifacts and noise from scanning microscopy images. In terms of 3-D image analysis, discrete wavelet transform can capture patterns at all relevant frequency scales, thus providing a level of image analysis that is not possible otherwise. It is also possible to use the methodology for analyzing surface structures at the molecular level. The results demonstrate superior capabilities of wavelet approach to scanning probe microscopy image analysis compared to traditional analysis techniques.     

Localising the electrochemistry of corrosion fatigue

The damage to a metal is significantly enhanced when simultaneously exposed to a corrosive solution and a cyclic mechanical stress. However, decoupling the contributions from each damage mechanisms is difficult. Localised electrochemical techniques, in particular scanning electrochemical microscopy (SECM), scanning electrochemical cell microscopy (SECCM), scanning kelvin probe force microscopy (SKPFM), and scanning vibrating electrode technique (SVET), can be advantageous when determining corrosion fatigue damage mechanisms and local phenomena, such as the transition between a corrosion pit and a fatigue crack. The recent corrosion fatigue literature is reviewed to highlight the usefulness of each localised electrochemical technique and how they can contribute to advancing the corrosion fatigue field.