用于制作光纤光栅的Talbot干涉仪的分析与建模

对用于制作光纤光栅的Talbot干涉仪进行了分析.当考虑准分子激光器的空间相干性和时间相干性时,几何光学中的光线法并不能给出Talbot干涉仪干涉场的真实强度分布情况,而通过光的电磁理论,则可以提供对干涉场的详细描述.基于电磁理论,建立了一个Talbot干涉仪干涉场计算模型,并首次将Talbot干涉仪的反射镜转角作为模型计算参数加以考虑,随后进行了一系列的计算.计算结果显示了干涉场的分布,同时表明空间相干性对Talbot干涉仪的近场干涉和远场干涉影响都很大,其中远场干涉对空间相干性的要求更严格,且对于远场干涉,反射镜转角的影响不可忽视.     

光纤Mach-Zehnder干涉仪中的高阶模干涉现象

利用Hermite-Gauss函数、模式干涉理论以及电场矢量线性叠加方法,分析了高阶模经光纤Mach-Zehnder干涉仪后的输出光场的空间干涉现象,得出了两个高阶模之间干涉光场的公式,计算出了双模光纤中各模式之间空间干涉的光场.数值仿真结果表明二阶模之间的干涉光场是两个相同的圆形光斑,而基模和二阶模之间的干涉光场是两个不等大的圆形光斑.     

基于循环式径向剪切干涉法的波前重建算法研究

 提出一种基于循环式径向剪切干涉的波前重建算法。先将畸变波前经径向剪切干涉仪形成的空间相位调制干涉条纹图通过傅立叶变换处理获得对应的位相差分布，再直接采用迭代算法能精确重建原始波前，为ICF系统中复杂畸变波前的在线准确检测提供了可能，并给出了应用实例。     

基于波长移相剪切干涉的准直波前重构技术

为了实现干涉仪出射准直波前的重构，提出了基于波长调谐移相的横向剪切干涉技术。干涉仪出射波前分别经楔板的前后表面反射，通过角锥棱镜返回后在干涉仪CCD上形成剪切干涉条纹。采用波长移相方法提取剪切干涉条纹的相位信息从而实现准直波前重构。分析相对剪切比对波面重构精度的影响，推导相对剪切比和其影响因素间的关系公式，给出波长移相中光程差常数分量的估算方法。测量干涉仪的三组出射波前，波前的峰谷值分别为3.22λ、2.10λ、0.83λ。该方法简化了传统测量干涉仪准直波前的横向剪切干涉装置，提高了测量精度，特别适合于测量波长移相干涉仪的出射波前。     

基于π/4相移平均的多光束干涉相位提取算法

菲佐干涉仪中如存在多光束干涉现象,干涉光强将不再是严格的余弦分布形式.在导出菲佐干涉仪中多光束干涉光强公式的基础上,给出了将其近似为理想多光束干涉光强公式的条件.推导了对多光束相移干涉图用四幅算法求解的相位计算误差,并据此提出了基于π/4相移平均的多光束干涉相位提取算法:通过采集相移间隔π/4的两组干涉图序列,将两次计...     

考虑入射光场光谱分布和损耗的Fabry-Perot干涉仪透射函数

运用部分相干光理论,分析了多光束干涉,得到了考虑损耗和入射光光谱函数分布的Fabry-Perot干涉仪透射函数。并就损耗和入射光场光谱宽度对透射函数的透过峰高度、对比度、精细常数,即Fabry-Perot干涉仪的性能的影响做了分析、讨论。     

空间调制干涉成像光谱技术

介绍空间调制干涉成像光谱技术，提出基于实体迈克尔干涉仪的空间调制干涉成像光谱仪，推导了这种仪器的基本几何参数公式与主要误差容限计算公式，总结了其主要特点。文中还归纳出高通量大视场干涉仪原理模型。     

散射板干涉仪的统计光学原理

用近代光学方法,对散射板干涉仪的基本光路进行了严格分析.用傅里叶光学证明先散射后透射与先透射后散射两条光路传播光的等价性,给出存在波偈差时这两条光路的变化.而后用统计光学方法讨论了干涉条纹产生的机理以及干涉条纹对比度与两块散板透过率相关性之间的关系,建立了散射板干涉仪的干涉条纹公式.分析结果与实验现象相符合,并可以解释以往理论不能解释的现象.     

用于微位移测量的笔束激光干涉仪

介绍了一种基于空间干涉原理的亚微米零差干涉位移测量方法。该方法是对笔束激光干涉仪在微位移测量领域的应用 ,干涉仪的测量精度不受光束波前畸变等光源噪声的影响。给出了干涉仪主要结构参数的选取原则 ;构建了用于微位移测量的笔束激光干涉仪实验系统。实验结果表明 ,该系统具有纳米测量分辨率。     

用数字干涉仪测量变形镜影响函数的实验研究

分析了变形反射镜面形影响函数的意义，鉴于自适应光学系统中波前探测大都以测量波前斜率为基础的特点，提出应研究斜率影响函数，并在此基础上构成波前复原矩阵。还介绍了用数字干涉仪测量变形镜影响函数的方法和结果，并对测量结果进行了分析，得到了影响函数的各种参数，例如：交连值，高斯指数，特征宽度等。并将干涉法测量斜率影响函数的结果与实际的哈特探测器的测试结果进行了比较。     

Holographic reverse shearing interferometry with high measurement sensitivity

The possibility of studying phase objects by reverse shearing interferometry with high measurement sensitivity is demonstrated. Phase objects are studied in two stages. In the first stage, holographic reverse shear interferograms are measured with and without an object under nonlinear conditions with tuning to frequent reference fringes. In the next stage, these interferograms are optically processed to obtain two interference patterns. The behavior of the interference fringes is the same as in the case of conventional double-beam interferometry with a standard reference wave. The increase in the measurement sensitivity in the thus-obtained interference patterns is due to the use of higher diffraction orders reconstructed from the holographic interferograms. A possibility of controlling the width of interference fringes is considered. The results of experimental approval of this technique are presented.     

Determination of dynamic stress-intensity factors by holographic interferometry

A method is derived for the determination of the dynamic stress-intensity factor from isopachic fringe patterns around running crack tips obtained by double-exposure dynamic holographic interferometry. Interference patterns are analytically generated and compared with experimentally recorded isopachic interference patterns. Crack jump and boundary effects on the interference pattern are investigated in detail.     

Visualization of 50 MHz Surface Acoustic Wave Propagation Using Stroboscopic Phase-Shift Interferometry

A Stroboscopic phase-shift interferometry has been developed to visualize surface acoustic wave (SAW) propagation on SAW devices quantitatively. The developed interferometry is a Fizeau-type one with a multi-mode semiconductor laser diode and an optical isolator. With the laser light illuminating stroboscopically, observed interference intensity gives information about average displacements of the vibrations. Fifty MHz SAW propagation on the surface of the SAW device has been measured with the interferometry. Distribution of the SAW along the propagation path has been observed, whose amplitude is 3 nm (p-p). Repetition accuracy evaluated with the root mean square method is 1/2500 of the laser wavelength. The system is useful for estimating and improving performances of micro-devices.Presented at 1996 International Workshop on Interferometry (IWI ‘96), August 27-29, Saitama, Japan.     

Real-time holographic interferometry using superposed compensating holograms

Superposed compensating holograms are shown to be a promising tool for solving a number of problems in real-time holographic interferometry, in particular, obtaining of interference patterns with fixed parameters of reference fringes and adjustment of the measurement sensitivity. The proposed approach is tested through visualization of the melting of a PMMA planar sample by means of lateral shear holographic interferometry.     

Production of holograms with shearing interferometers using a wide light source

Interferograms with narrow fringes obtained with grating and polarization interferometers using a wide source allow the use of some processes of holographic interferometry and schlieren techniques for investigating a reconstructed wavefront. The reconstructed interference patterns of a sphere's supersonic flow are presented. A scheme for obtaining colour schlieren patterns is described.     

High-sensitivity holographic interferometry method for studying transparent objects with small transverse size

A new method for studying transparent objects with a small transverse size is considered. The method is based on lateral-shift holographic interferometry combining the displacement of the transparent object under investigation between the recordings of a pair of holographic interference patterns and their optical treatment. The interference patterns of the transparent object under investigation with a lateral shift equal to or larger than the linear size of the object are equivalent to the interference patterns obtained in a double-beam interferometer with a reference wave. In addition, such patterns are characterized by a higher sensitivity of imaging of optical inhomogeneities of the object under investigation. The results of experiments on testing this method for monitoring optical inhomogeneities of the active medium crystal of a solid-state laser are reported. The resultant interference patterns depict optical inhomogeneity of the crystal with a sensitivity 12 times higher.     

基于散斑干涉光谱分布变化量探测瞬态高温的研究

为了提高瞬态高温检测的精度,利用快速傅里叶变换(FFT)对散斑干涉条纹进行光谱分析,提出了通过光谱分布的偏移及幅值变化反演温度的方法。当激光照射应变材料时,瞬态高温使材料发生形变从而使散斑干涉条纹改变,被测表面形变前后获得的干涉条纹由面阵CCD采集。由于其对应的光谱密度分布函数也会发生相应的改变,即中心波长位置偏移及振幅变化,通过其改变反演材料的瞬态温度。在分析推导了瞬态温度变化、材料应变及干涉条纹变化之间的函数关系后,仿真分析得到了瞬态温度正比于压强系数、反比于温度系数。实验采用660 nm半导体激光器,SI6600型面阵CCD探测器,从获得的光谱分布函数中提取中心波长的偏移量,经计算和标定所得数据与传统的干涉测温方法进行对比,探测精度可达0.3%。相比传统的直接检测干涉条纹的变化量,由被测面形变量推导温度的方法精度提高近3倍。     

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.     

无抖动ICF冷冻靶干涉图像的获取

提出一种克服由于冷冻靶制冷系统和真空系统工作时引起的振动所带来的干涉图像抖动的方法。通过两个完全相同的CCD同步捕获冷冻靶干涉图像和空间位置图像,以位置图像来标定冷冻靶的振动情况,从而获得冷冻靶在不同状态下的干涉图像。在标定冷冻靶位置的过程中,提出了频率估计、投影标定、特征匹配和全匹配这4种算法,并给出了对应的数字图像处理算法流程。     

Simultaneous measurement with one-capture of the two in-plane components of displacement by electronic speckle pattern interferometry

We present the simultaneous measurement of the two in-plane displacement components by electronic speckle pattern interferometry with three object beams and without an in-line reference beam. Three interference fringe patterns, corresponding to three different sensitivity vectors, are recorded in a single interferogram and separated by means of the Fourier transform method. Then, two interference fringe patterns are selected to obtain the in-plane displacement components.