LED结温与光谱特性关系的测量

采用恒定驱动电流改变环境温度和恒定环境温度改变驱动电流两种方法分别对直径5 mm封装的AlGaInP型红光和黄光LED,InGaN型绿光和蓝光LED,以及InGaN蓝光+荧光粉的白光LED的结温与其光谱特性进行了测量,得到了不同条件下LED结温与光谱特性的关系.结果表明;AlGaInP LED的峰值波长与结温有良好线性关系,InGaN LED的峰值波长则与结温没有明显对应关系;但白光LED发射光谱的白、蓝功率比与结温有良好线性关系;对AlGaInP LED及蓝光激发的白光LED,通过光谱特性测量可快速、准确地确定光源系统中各LED的结温继而预测光源系统的有效寿命.     

LED结温与光谱特性关系的测量

采用恒定驱动电流改变环境温度和恒定环境温度改变驱动电流两种方法分别对直径5 mm封装的AlGaInP型红光和黄光LED,InGaN型绿光和蓝光LED,以及InGaN蓝光+荧光粉的白光LED的结温与其光谱特性进行了测量,得到了不同条件下LED结温与光谱特性的关系.结果表明;AlGaInP LED的峰值波长与结温有良好线性关系,InGaN LED的峰值波长则与结温没有明显对应关系;但白光LED发射光谱的白、蓝功率比与结温有良好线性关系;对AlGaInP LED及蓝光激发的白光LED,通过光谱特性测量可快速、准确地确定光源系统中各LED的结温继而预测光源系统的有效寿命.     

结温对GaN基白光LED光学特性的影响

制备了一个可测量n型GaN材料电阻的白光LED样品,测量了从室温到170℃下的LED芯片的n-GaN材料的电阻,发现n-GaN材料的电阻随温度的升高而增大,且两者呈一定的指数关系。利用这一特性,通过测量LED工作状态下内部所用GaN材料的电阻,可以实现对LED结温的测量。通过改变积分球底板温度使LED样品处于不同的结温下,测量了白光LED的光谱及色度学参数,结果表明:白光LED的峰值波长、显色指数、色温、光通量均与结温成一定的线性关系。     

GaN基白光LED的结温测量

用正向电压法、管脚法和蓝白比法等三种方法测量GaN基白光LED的结温,获得了较为准确的结温,误差可以控制在4℃以内.正向电压法在恒定电流的条件下,得到了正向电压与结温的线性关系;蓝白比法在不同环境温度和不同注入电流两种情况下,都得到了蓝白比与结温较好的线性关系.提出了蓝白比法可能的物理机制,提高环境温度和增大注入电流都会使结温升高,蓝光峰值波长也会改变,这两个因素都会影响荧光粉的激发和发光效率.降低结温需要考虑的主要因素有白光LED的接触电阻、串联电阻和外量子效率,封装材料的热导率,反射杯和管脚的设计,以及空气散热部分的散热面积等.     

白光LED固态照明光转换荧光体

报道了当前热点固态照明白光LED对所用光转换荧光体的特殊要求,从发光学和晶场理论出发,提出研发白光LED用荧光体的几种方案和原则.依据多年成果,特别阐述在稀土铝镓石榴石体系,氯硅酸钙及某些钨钼酸盐中,Ce³⁺、Pr³⁺、Tb³⁺、Eu³⁺、Eu²⁺及Mn²⁺离子的发光特性,能量传递,Eu²⁺的特征“阶梯状”光谱以及激活剂在晶体中所占据不同晶体学格位与发光性质的关联性.这些材料都可用于白光LED之中.实践证明,这些基础性研究和原理是研制白光LED用荧光体的基础.光转换荧光体与InGaN蓝光芯片结合可以获得符合严格标准的全色温(2700~8000K)的高显色性白光LED光源.白光LED及InGaN蓝光LED的光电性能与正向电流I_F密切相关,器件散热极为重要.提出的在不同I_F下,LED的相关色温差(ρT_c)可用来表征LED色温变化幅度及稳定性.     

基于相对光谱强度的非接触式LED结温测量法

基于一体化封装高导热铝板,利用蓝光芯片及常用YAG荧光粉,制备了大功率白光LED,并研究了其在不同结温下的光谱变化规律。发现白光LED辐射光谱在波长485 nm处辐射强度具有极小值,并且此波长的辐射强度与LED结温存在良好的线性关系,以此为依据给出了该波长辐射强度与结温的关系公式,测量了LED结温,并与正向压降法及光谱法的测量结果进行对比。实验结果显示：所提出的结温测量方法与正向压降法测量结果差距不超过2 ℃,该方法保持了正向压降法的结温测量较为准确的优点,克服了光谱法的光谱漂移过小,对测试结果带来较大误差的缺点,同样也具有光谱法的实用性强、高效直观、非接触测量、不破坏灯具结构的优点。     

GaN基低色温高显色白光LED

采用440nm短波长InGaN/GaN基蓝光LED芯片激发高效红、绿荧光粉制得高显色性白光LFD,研究了不同胶粉配比对LED发光性能的影响,结果表明,A胶、B胶、绿粉、红粉比重在0.5∶0.5∶0.2∶0.03时,在440 m蓝光激发下呈现了有两个谱带组成的发光光谱,分别是峰值为535 nm的特征光谱和643nm的特征光谱,胶粉通过均匀调配后能够有效的进行混光产生低色温白光,实验中最低色温可达3 251K,显色指数高达88.8,这比传统蓝光激发YAG荧光粉制得的白光LED色温更低,显色指数提高了26%.     

结温对高压白光LED光谱特性的影响

高压LED因其自身突出的特点在照明领域有着潜在的应用优势,但作为一种新型功率LED,其光电热特性仍需深入研究。该实验对6和9V GaN基高压LED芯片进行了相同结构和工艺条件的封装,对封装样品进行了10~70℃的变温度光谱测试,并进行了从控温平台温度到器件结温的转换。为保证器件的电流密度相同,6和9V样品光谱测试的工作电流分别设定为150和100mA。结果显示,结温升高会导致蓝光峰值波长红移、波长半高宽增大、光效下降和显色指数上升等现象。在相同平台温度和注入功率下,9V样品的结温低于6V样品;随着温度的升高,9V样品波长半高宽的增加量比6V样品少1.3nm,光效下降量少1.13lm·W~(-1),显色指数上升量少0.28。以上表明,与低压LED相比,高压LED有着更低的工作结温和更小的温度影响。原因在于,相同环境温度下高压LED具有更好的电流扩展性和更少的发热量。此特性在高压LED的研究、发展与应用等方面具有参考价值。此外,峰值波长仍与结温有着较好的线性度,在光谱设备精度较高的情况下可继续作为结温的敏感参数。     

白光LED光谱特性及司辰节律因子

为分析白光LED的光-电-热特性及其变化,在热沉温度和驱动电流可控的条件下,测试了温度、电流对白光LED光谱分布的影响,建立了白光LED光功率和光谱蓝白比(蓝光光谱光功率与白光光谱光功率的比值)预测模型。相关性分析显示光谱蓝白比、色温及司辰节律因子之间高度相关,光谱蓝白比与色温、光谱蓝白比与司辰节律因子均存在线性关系,表明由光谱分布变化预测光谱色温漂移及其非视觉生物效应的可能性。实验结果表明,白光LED光功率、蓝白比、色温及司辰节律因子的预测值与实测值吻合较好,最大预测误差分别不超过4.22%、1.54%、1.31%和2.15%;同时,白光LED光谱蓝白比可作为一种有效手段,用于预测光谱色温及司辰节律因子,进而评估其光学特性和非视觉生物效应。     

白光LED衰减的光谱分析

为了研究白光LED衰减的机理,通过试验跟踪并分析了采用YAG荧光粉、荧光粉晶片、RGB三合一方式封装的PLCC-4型白光LED,以及采用YAG荧光粉封装的大功率白光LED的发射光谱老化衰减曲线。试验在相同的环境下,对上述四种类型的白光LED进行了通电老化,同一类型白光LED老化电流及时间相同,老化完成后测试其光谱分布。通过分析光谱分布曲线的变化来研究白光中各色光的衰减情况,通过对比各色光的衰减情况来推断白光LED的衰减原因。分析表明白光LED的衰减主要是由蓝光LED的衰减及荧光粉的猝灭引起:采用YAG荧光粉、采用荧光粉晶片及RGBLED封装的白光LED衰减特性基本相同,白光的衰减主要是由蓝光的衰减引起;大功率白光LED与PLCC-4型白光LED衰减特性稍有不同,白光的衰减除了因蓝光的衰减外,还有荧光粉的衰减所引起的白光衰减,而蓝光的衰减所占比例至少不低于80%。通过上述分析可以进一步推断:在散热条件足够理想的情况下,白光LED的衰减主要由蓝光的衰减引起,而随着系统温度的提升,荧光粉的衰减将加剧白光LED的衰减。所得结果将为白光LED的应用及进一步对白光LED衰减原因的研究提供了参考。     

结温对DCJTB混合YAG∶Ce3+白光LED光谱特性的影响

研究了结温变化对DCJTB混合YAG∶Ce3+荧光粉的白光LED光谱特性的影响。采用分层点粉的方法,在LED芯片上分层涂覆YAG荧光粉和有机材料DCJTB,可以使器件的显色指数高达90。利用实验室自行研发的一体化LED散热支架可方便准确测量出结温。实验表明：结温升高使蓝光芯片辐射幅值不断下降,YAG荧光粉被激发所辐射的黄光辐射幅值先增大后减小,红光光谱发生蓝移,器件的显色指数呈线性下降,色温先增大后减小。     

双波长InGaN/GaN多量子阱发光二极管的光电特性

为了实现高显色指数和流明效率的白光发光二极管,在（0001）蓝宝石衬底上利用金属有机化学气相沉积系统,生长了双波长发射的InGaN/GaN多量子阱发光二极管结构.通过对不同In组分含量的双波长发射发光二极管结构的光致发光和电致发光性能进行分析,结果表明In组分含量对双波长发射发光二极管的光致发光谱的稳定性及发光效率有重要影响.此外,用双蓝光发射的芯片来激发YAG:Ce荧光粉实现了高显色指数白光发射.     

A study of cathodoluminescent characteristics of YAG:Nd3+

The following cathodoluminescent characteristics of a YAG:Nd³⁺ crystal are studied at room and liquid-nitrogen temperatures: the decay times of cathodoluminescence of the transitions upon termination of excitation and the Nd-concentration dependence of the cathodoluminescent properties of the crystal. Detailed cathodoluminescent spectra are obtained in the visible and near-UV spectral ranges (≈260–800 nm) with a resolution of 0.1 nm and the band positions are determined to an accuracy of 0.4 nm. The YAG:Nd³⁺ emission spectrum is interpreted according to the obtained data.     

The effect of junction temperature on the optoelectrical properties of InGaN/GaN multiple quantum well light-emitting diodes

Thermal effects on the optoelectrical characteristics of green InGaN/GaN multiple quantum well (MQW) light-emitting diodes (LEDs) have been investigated in detail for a broad temperature range, from 30 °C to 100 °C. The current-dependent electroluminescence (EL) spectra, current–voltage (I–V) curves and luminescence intensity–current (L–I) characteristics of green InGaN/GaN MQW LEDs have been measured to characterize the thermal-related effects on the optoelectrical properties of the InGaN/GaN MQW LEDs. The experimental results show that both the forward voltages decreased with a slope of ?3.7 mV/K and the emission peak wavelength increased with a slope of +0.02 nm/K with increasing temperature, indicating a change in the contact resistance between the metal and GaN layers and the existence of a band gap shrinkage effect. The junction temperature estimated from the forward voltage and the emission peak shift varied from 25.6 to 14.5 °C and from 22.4 to 35.6 °C, respectively. At the same time, the carrier temperature decreased from 371.2 to 348.1 °C as estimated from the slope of high-energy side of the emission spectra. With increasing injection current, there was found to be a strong current-dependent blueshift of ?0.15 nm/mA in the emission peak wavelength of the EL spectra. This could be attributed to not only the stronger band-filling effect but also the enhanced quantum confinement effect that resulted from the piezoelectric polarization and spontaneous polarization in InGaN/GaN heterostructures. We also demonstrate a helpful and easy way to measure and calculate the junction temperature of InGaN/GaN MQW LEDs.     

基于单色LED补偿白光LED技术的模拟太阳光谱研究

提出一种基于单色LED补偿白光LED技术,模拟日光在可见光范围内的光谱。实际调研了大功率单色LED现状,采用光子在二维空间内联合态密度函数作为单色LED的光谱辐射模型,建立LED模拟仿真数据库。通过求解超定方程组的非负最小二乘解,优化选择不同峰值波长以及半高宽的单色LED与白光LED组合,实现对目标光谱的匹配及太阳光谱的再现。对比研究了白光LED补偿技术和纯单色LED组装技术,并分析了不同种类LED组合对太阳光谱的模拟情况。结果表明,白光LED补偿技术拟合太阳光谱相关指数达到90.74%,优于纯单色LED组装技术。并且当单色LED种类减少时,白光LED补偿技术相比纯单色LED组装技术可以实现更好的模拟效果。该方法对实现基于LED类日光照明具有较好的指导意义。     

利用温变电容特性测量发光二极管结温的研究

结区的温度, 简称结温, 是发光二极管(LED) 的重要参数之一, 它对LED 器件的出光效率、光色、器件可靠性和寿命均有很大影响, 准确测量LED 器件的结温对制备LED 芯片、器件封装和应用有着重要的意义. 本文利用反向偏压下的LED的势垒电容随温度变化的特性, 提出了一种LED结温测量的新方法. 论文首先测量和分析了LED在室温下反向偏压时的电容-电压(C-V)曲线和不同反向偏压下的电容-温度(C-T)曲线, 结果表明, 在合适的偏压下, LED的电容随温度的增大而显著增加, 并呈现良好的线性关系. 在LED工作中监测其电容的变化, 并与C-T曲线进行对比, 实现了LED结温的测量, 其测量结果和传统的正向电压法的结果相对比, 两者符合较好. 最后, 利用上述方法测量了LED 在恒流和恒压条件下的结温的实时变化过程. 较传统的结温测量方法, 本方法的优点在于只须要一次定标测量, 且可实现LED在任意电压和电流下的结温测量.     

Measurement of temperature profiles on visible light-emitting diodes by use of a nematic liquid crystal and an infrared laser

We present a new technique for measuring the temperature profiles of visible LED chips by use of a nematic liquid crystal with IR laser illumination. The LEDs studied have a multi-quantum-well InGaN/GaN/sapphire structure. New features in this technique are the use of a high-power IR laser beam as the sensing light and the insertion of a color filter in the optical path to block the high-intensity LED light. For the LEDs measured, the conversion efficiency decreases by 70% when the junction temperature rises from 25 to 107 degrees C. This technique is a valuable tool for studying the performance of LEDs as a function of junction temperature.     

Study of the Light Emitting Diode as a photoreceptor: Spectral and electrical characterization as function of temperature and lighting source

In this study, the temperature influence on the spectral responsivity of a Light Emitting Diode (LED) used as a photoreceptor, combined to light source spectrum is correlated to electrical characteristics in order to propose an alternative method to estimate LED junction temperature, regardless of the absolute illumination intensity and based on the direct correlation between the integral of the product of two optical spectra and the photo-generated currents. A laboratory test bench for experimental optical measurements has been set in order to enable any characterizing of photoelectric devices in terms of spectral behaviour, in a wavelength range placed between 400–1000?nm, and of current-voltage characteristics as function of temperature by using two different illumination sources. The temperature is analysed in a range from 5?°C up to 85?°C, so as to evaluate thermal variation effects on the sensor performance. The photo-generated current of two LEDs with different peak wavelengths has been studied. Research has observed and mathematically analysed what follows: since the photo-generated current strictly depends on the combination between the spectral response of the photoreceptor and the lighting source response, it becomes possible to estimate indirectly the junction temperature of the LEDs by considering the ratio between the photogenerated currents obtained by using two different illumination sources. Such results may for one thing increase knowledge in the fields where LEDs are used as photo-detectors for many applications and for another, they could be extended to generic photodetectors, thus providing useful information in photovoltaic field, for instance.