碲锌镉面元辐射探测器堆积载流子屏蔽效应

 采用铑(Rh)靶45 kV X射线源进行了碲锌镉(CdZnTe)面元像素阵列探测器成像实验。实验结果表明：在探测距离1 mm,管电压45 kV条件下,管电流增大至20 μA时,辐照中心区域像素单元信号丢失,出现围绕辐照中心区域的边缘高事件计数环形探测图像。随着管电流的增大,无响应像素区域扩大,探测器总体事件计数明显降低。进一步根据泊松方程建立了CdZnTe晶体内部电势分布模型,仿真结果表明：单位面积光子通量为5×10⁵ mm^-2·s^-1时,由于CdZnTe晶体较低的空穴迁移率,晶体内部存在堆积空穴载流子形成的高空间电荷密度分布区域。晶体内部电场产生扭曲,电子载流子无法迁移至对应阳极位置,导致辐照中心区域产生信号屏蔽效应。     

CdZnTe像素探测器的电输运性能

碲锌镉(CdZnTe)是一种性能优异的室温核辐射半导体探测器材料,广泛应用于核安全、核医学以及空间科学等领域.然而,传统的CdZnTe平面探测器受制于"空穴拖尾"效应的影响,探测性能有待改善.采用改进的垂直布里奇曼法生长的In掺杂Cd_(0.9)Zn_(0.1)Te单晶制备出单载流子收集的4×4像素阵列探测器,通过电流-电压(I-V)测试和γ射线能谱响应测试,研究了像素探测器的电学性能和载流子电输运性能,随之与相应的CdZnTe平面探测器进行了性能对比.结果表明,CdZnTe像素探测器的电阻率约为1.73×10~(10)?·cm,且施加100 V偏压后单像素点的最大漏电流小于2.2 nA;当施加偏压升高至300 V时,单像素点对~(241)Am@59.5 keV的γ射线的最佳能量分辨率可达5.78%,探测性能优于相同条件下制备的CdZnTe平面探测器.     

公共格栅像素CdZnTe探测器的能谱特性

使用同一块CdZnTe晶体设计制作了像素大小不等的4×4公共格栅像素CdZnTe探测器。通过能谱测定实验及权重势和电场仿真,研究了公共格栅像素CdZnTe探测器中的小像素效应和引导效应。结果表明:由于小像素效应较弱,较大的像素不能有效消除"空穴拖尾",能谱特性较差;由于晶体内部以及像素和公共格栅间隙表层的电荷损失,较小的像素能谱特性也较差。在像素宽度为0.8 mm时,得到了对662keV的137Cs放射源的最佳能量分辨率3.80%和峰谷比5.65。适当增大公共格栅偏压可以引导电子向阳极像素运动,促进电荷的完全收集,改善探测器的能谱特性。过大的偏压则会造成像素和公共格栅间表面漏电流的增加,探测器的能谱特性也会恶化。在像素宽度为0.8mm时最佳偏压为-60V。     

基于CdZnTe像素阵列探测技术的伽玛源成像

根据高能射线针孔成像理论,采用CdZnTe像素阵列探测器建立了直接成像探测模式的伽玛源针孔探测系统。测试分析了CdZnTe像素阵列探测器的能量分辨力及峰值效率,讨论研究了针孔成像探测系统的调制传递函数和附加噪声特性,测试获得直径5mm137Cs源的探测图像,采用Lucy-Richardson迭代算法得到了137Cs源的复原图像。实验结果表明:CdZnTe探测器对662keV137Cs源的能量分辨力为6.25%～7.50%,峰值效率65.0%～72.5%;成像系统探测图像存在一定扩散现象,所采用的Lucy-Richardson迭代复原算法能较好地修正图像扩散,提高探测图像中心区域细节分辨力;估算所得137Cs源尺寸误差约0.5mm,所建立的CdZnTe针孔成像探测系统能有效得到小尺寸伽玛源的辐照强度分布及尺寸信息。     

碘化铟晶体本征缺陷的第一性原理研究

采用基于密度泛函理论的第一性原理方法,对正交碘化铟（InI）晶体可能存在的6种本征点缺陷（碘空位、铟空位、碘占铟位、铟占碘位、碘间隙、铟间隙）结构进行优化. 通过缺陷形成能的计算,得出各缺陷在生长过程中形成的难易程度;通过态密度的计算,分析出各种缺陷能级位置及其对载流子传输的影响. 结果表明：最主要的低能缺陷铟间隙会引入复合中心和深空穴陷阱,前者降低少数载流子的寿命,后者俘获价带的空穴而降低空穴的迁移率-寿命积. 计算结果为实验中提高InI 晶体载流子的迁移率-寿命积提供理论指导,对获得性能优异的InI核辐射探测材料有重要帮助. 关键词： 碘化铟 形成能 缺陷能级 深空穴陷阱     

CdZnTe平面探测器对低能X/γ射线的光谱响应

基于3片不同条件下生长的CdZnTe晶片制备出平面电极(Planar)探测器CZT1、CZT2及CZT3.分析室温下3个探测器在不同场强作用下对低能X/γ射线的光谱响应,并结合相应晶体材料的载流子迁移特性和掺杂剂的浓度以及存在状态,归纳影响探测器分辨率的原因.掺杂In浓度高的探测器CZT1,由于材料中存在的深能级缺陷Cd2+i,作为电子的俘获中心,影响了载流子的收集效率,进而降低了探测器的能量分辨率;掺杂In浓度低的探测器CZT2对不同能量X/γ射线均具有较好的能量分辨率;而Al掺杂探测器CZT3,由于Al间隙原子Ali的存在作为电子的散射中心,最终影响了收集效率及能量分辨率.     

CdZnTe核探测器的蒙特卡罗模拟的初步研究

以CdZnTe核探测器的工作原理为依据,探测器内反应的随机性和反应产生的电子空穴对数目的统计规律为物理模型,应用Visual C + + 自行编制了蒙特卡罗模拟软件.模拟了γ射线在CdZnTe探测器中的响应能谱,并将模拟结果与实际器件的测试结果进行了比较讨论.模拟能谱与实际测得的能谱的主峰符合较好.此外,通过分析⁵⁷Co源辐照下探测效率与器件厚度的关系,可以推测探测效率达到最大时所对应CdZnTe探测器的理想厚度     

TEA-CO2激光辐照HgCdTe图像传感器的实验研究

利用TEA-CO₂激光对碲铬汞(HgCdTe)图像传感器的干扰和损伤现象进行了实验研究,分析了干扰和损伤机理。探测器上激光能量密度小于255 mJ/cm2时,饱和像素仅出现在光斑区域,激光能量密度为425.8 mJ/cm2时,像素被损伤,观察到了弥散斑和暗环等现象。建立了探测器的激光辐照模型,计算了探测器的温升,讨论了温升与载流子浓度、迁移率的关系。分析认为,弥散斑的出现是探测器升温产生的热激发载流子浓度扩散所致,暗环的出现是迁移率与载流子浓度扩散共同作用的结果,像素的损伤则是因为温升导致汞的析出。     

p-Hg1-xCdxTe材料中轻空穴的性质研究

通过变磁场霍尔测量方法,采用由迁移率谱和多载流子拟合过程相结合的混合电导法,在1.2-300K范围内,获得了两块分子束外延(MBE)生长的p-Hg1-xCdxTe(x=0.224)样品中的轻、重空穴以及体电子、表面电子的浓度和迁移率.此外,在实验中,还直接观察到了轻空穴对电导张量分量的贡献.实验值不仅具有明确的物理意义,而且有助于红外探测器模型的建立.     

双光子激发ZnSe自由载流子超快动力学研究

采用Z扫描和抽运-探测实验技术, 在波长为532 nm、脉冲宽度为41 fs的条件下测得ZnSe晶体的双光子吸收系数, 并获得了不同激发光强下的自由载流子吸收截面、电子-空穴带间复合时间和电子-声子耦合时间. 研究发现, 随着激发光强的增大, 自由载流子吸收截面减小, 复合时间变短. 当激发光强增大导致载流子浓度大于10¹⁸ cm^-3时, 抽运-探测信号出现明显改变, 原因归结为强光场激发导致样品在短时间内带隙变窄和电子-空穴等离子体的形成.     

Schottky-type polycrystalline CdZnTe X-ray detectors

The polycrystalline CdZnTe:Cl thick films which have high resistivity about 5 × 10⁹ Ω cm are grown by thermal evaporation method. The leakage currents of as-deposited CdZnTe layers are still too high to operate as medical applications. The blocking layer of Schottky type was formed on the stoichiometric surface of polycrystalline CdZnTe layers to suppress the leakage current of polycrystalline CdZnTe X-ray detectors. The polycrystalline CdZnTe Schottky barrier diodes with indium contact exhibit the low leakage current (14 nA/cm²) at 40 V due to its high barrier height (ϕ_b = 0.80 eV). In X-ray image acquisition with Schottky-type linear array polycrystalline CdZnTe X-ray detector, we have obtained the promising results and proved the possibility of polycrystalline CdZnTe for applications as a flat panel X-ray detector.     

Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy

The influence of damage induced by 2 MeV protons on CdZnTe radiation detectors is investigated using ion beam induced charge (IBIC) microscopy. Charge collection efficiency (CCE) in irradiated region is found to be degraded above a fluence of 3.3 × 10¹¹ p/cm² and the energy spectrum is severely deteriorated with increasing fluence. Moreover, CCE maps obtained under the applied biases from 50 V to 400 V suggests that local radiation damage results in significant degradation of CCE uniformity, especially under low bias, i. e., 50 V and 100 V. The CCE nonuniformity induced by local radiation damage, however, can be greatly improved by increasing the detector applied bias. This bias-dependent effect of 2 MeV proton-induced radiation damage in CdZnTe detectors is attributed to the interaction of electron cloud and radiation-induced displacement defects.     

Photoluminescence and electric spectroscopy of dislocation-induced electronic levels in semi-insulated CdTe and CdZnTe

We studied deformation-induced defects in semi-insulating CdTe and CdZnTe by infrared photoluminescence (PL), contact less photoconductivity and resistivity. Plastic deformation increased the concentrations of grown-in defects, namely, those of an important midgap level E_C−0.74 eV in CdTe and Cd_1−xZn_xTe (x<0.1), the materials of choice in today’s X-ray and gamma ray detector technology. We confirmed the direct correlation between Y-emission and the dislocation density in both compounds. The Y-band intensified near an indenter deformation or near a scribing line, but was barely visible in low-dislocation areas (etch pit density <2×10⁵ cm⁻²). Our results correlate with recent findings that dislocation-induced defects and their clusters degrade charge collection in radiation detectors. Photoluminescence of midgap levels can serve as a tool to identify areas of degraded performance in semi insulated CdTe and CdZnTe crystals for radiation detectors.     

Ion-molecule collisions in gaseous111InCl and111InI systems

Using gaseous sources of¹¹¹InCl and¹¹¹InI with densities between 1.0·10¹⁷ cm^?3 and 4.4·10¹⁹ cm^?3 the perturbation of the 171.3–245.4 keVγ-γ cascade was measured as a function of time and density by the time-differential perturbed angular correlation (TDPAC) method. The anisotropy shows a strong dependence on the density. By means of an extended model based on a stochastic model of Bosch and Spehl collision cross sections for charge transfer and deorientation could be determined. The cross sections for charge transfer collisions were within the region from 2·10^?15 cm² to 26·10^?15 cm² and for deorientation collisions between 1·10^?15 cm² and 100·10^?15 cm².     

Development of new CdZnTe detectors for room‐temperature high‐flux radiation measurements

Recently, CdZnTe (CZT) detectors have been widely proposed and developed for room‐temperature X‐ray spectroscopy even at high fluxes, and great efforts have been made on both the device and the crystal growth technologies. In this work, the performance of new travelling‐heater‐method (THM)‐grown CZT detectors, recently developed at IMEM‐CNR Parma, Italy, is presented. Thick planar detectors (3 mm thick) with gold electroless contacts were realised, with a planar cathode covering the detector surface (4.1 mm × 4.1 mm) and a central anode (2 mm × 2 mm) surrounded by a guard‐ring electrode. The detectors, characterized by low leakage currents at room temperature (4.7 nA cm^?2 at 1000 V cm^?1), allow good room‐temperature operation even at high bias voltages (>7000 V cm^?1). At low rates (200 counts s^?1), the detectors exhibit an energy resolution around 4% FWHM at 59.5 keV (²⁴¹Am source) up to 2200 V, by using commercial front‐end electronics (A250F/NF charge‐sensitive preamplifier, Amptek, USA; nominal equivalent noise charge of 100 electrons RMS). At high rates (1 Mcounts s^?1), the detectors, coupled to a custom‐designed digital pulse processing electronics developed at DiFC of University of Palermo (Italy), show low spectroscopic degradations: energy resolution values of 8% and 9.7% FWHM at 59.5 keV (²⁴¹Am source) were measured, with throughputs of 0.4% and 60% at 1 Mcounts s^?1, respectively. An energy resolution of 7.7% FWHM at 122.1 keV (⁵⁷Co source) with a throughput of 50% was obtained at 550 kcounts s^?1 (energy resolution of 3.2% at low rate). These activities are in the framework of an Italian research project on the development of energy‐resolved photon‐counting systems for high‐flux energy‐resolved X‐ray imaging.     

Investigation of a CPG‐array CdZnTe γ‐ray imaging detector with single collecting electrodes readout

The single‐electrode readout method has been applied to a coplanar grid (CPG) array CdZnTe detector in order to halve the number of preamplifiers previously needed and to facilitate imaging applications of CPG detectors. A method of predetermining the width of the optimum collecting electrodes has also been proposed, using the calculated optimum relative gain factor G. Meanwhile, a detailed process for calculating the charge induction efficiency (CIE) is presented. To simplify the calculation process, the computational formula of the CIE was deduced through the integration of the weighting potential. For performance evaluation, a 2 × 2 CPG‐array CdZnTe detector was elaborately designed and tested with ¹³⁷Cs at 662 keV. Experimental results showed the capability of using the CPG‐array CdZnTe detector with single collecting electrode readout for γ‐ray imaging applications, with the same complexity of associated readout electronics as that of the pixelated CdZnTe detectors.     

光电耦合器的反应堆中子辐射效应

 选择3种典型光电耦合器开展了反应堆中子辐照实验,中子注量为3×10¹¹~5×10¹²cm^-2时,位移效应导致电流传输比下降,饱和压降提高。发光器件相同,探测器为Si PIN光电二极管的光电耦合器比探测器为Si NPN光敏晶体管的光电耦合器的初始电流传输比要小,但其抗位移损伤能力更强。探测器均为Si NPN光敏晶体管,发光器件为异质结LED要比硅两性掺杂LED的光电耦合器的电流传输比抗位移损伤能力提高2个量级;以光敏晶体管为探测器的光电耦合器,在较大的正向电流和输出负载电阻条件下工作可提高抗辐射水平。此外,光电耦合器的位移损伤存在加电退火效应。     

Chemische Zusammensetzung der kosmischen Strahlung niederenergetischer Teilchen vonZ=12 bisZ=28, gemessen in Plastikdetektoren

Results of a balloon flight experiment flown from Fort Churchill, Canada, at 1.8 g/cm² for about 10 hours in 1968 are presented. The study was made using Lexan polycarbonate plastic sheets as a particle detector. The analysis of the flux and the charge composition is based on the measurement of 313 stopping particles from Mg to Ni with energies between 150 and 400 MeV/Nucl. The identification of the tracks of the particles is achieved using the restricted energy loss criterion. The flux is corrected for scanning and detector efficiency corresponding to their charge. We are able to measure the charge of a particle with an accuracy of ±0.3 charge units in the region of the iron peak. This accuracy depends on the detailed study of the cone length versus residual range. The evenZ to oddZ ratio for chargesZ≧20 is 3. We have measured the ratios of Mn/Fe=0.34, Cr/Fe=0.42 and Ca+Sc+Ti/Fe=1.05. From these measured charge ratios a thickness of (3±1) g/cm² interstellar matter can be deduced.     

X射线探测器的脉冲标定技术

利用强流电子束技术产生通量密度为10¹⁸—10¹⁹X-ray photon/sr·s的脉冲CuKX射线源,标定PIN型硅二极管半导体探测器对X光子的脉冲灵敏度。用绝对X射线监测器——P10气体脉冲电离室作为脉冲X射线通量密度的标准。脉冲电荷自动测量仪由微处理机进行程序控制,并予以实时校准。该电离室测量通量密度的精度为±5％,适用的能通量率范围可达4×10^-9—2×10²W/cm²,适用的光子能量范围为1.5—10keV,标定探测器的精度为±7.0％,并发现PIN型硅二极管的脉冲灵敏度比稳态X射线束标定的灵敏度高30％左右。 关键词：