Er3+注入CdTe薄膜的结构和光电性能研究

采用离子注入技术对近距离升华制备的CdTe薄膜进行Er3+掺杂研究.讨论了不同掺Er3+浓度对CdTe薄膜的结构和光电性能的影响.利用X射线衍射仪、扫描电子显微镜、紫外-可见分光光度计、霍耳效应测试系统和复阻抗分析仪对样品进行测试.结果表明,适当的掺杂量可以改善CdTe薄膜的结晶性能,降低晶界势垒高度,提高其导电性能.在一定掺杂范围内掺Er3+对CdTe薄膜的光能隙影响不大.     

Er3+注入CdTe薄膜的结构和光电性能研究

采用离子注入技术对近距离升华制备的CdTe薄膜进行Er³⁺掺杂研究.讨论了不同掺Er³⁺浓度对CdTe薄膜的结构和光电性能的影响.利用X射线衍射仪、扫描电子显微镜、紫外-可见分光光度计、霍耳效应测试系统和复阻抗分析仪对样品进行测试.结果表明，适当的掺杂量可以改善CdTe薄膜的结晶性能，降低晶界势垒高度，提高其导电性能.在一定掺杂范围内掺Er³⁺对CdTe薄膜的光能隙影响不大. 关键词： CdTe薄膜 离子注入 晶界势垒 光能隙     

氧对于在Ar/O氛围下用近空间升华法制备的CdS薄膜的影响

采用近空间升华法（CSS）在氩/氧气氛中制备了硫化镉（CdS）多晶薄膜.利用XRD,XPS,AFM,UV-VIS光谱和四探针技术等测试和分析手段系统研究了氧对薄膜的成分、结构、光学和电学等性质的影响.结果表明,用近空间升华法制备的CdS薄膜具有六方相结构,膜层致密、均匀,平均晶粒大小约为40 nm,富硫.氧掺入后部分与镉生成氧化镉,并随着氧含量的增加,薄膜的成分有趋于化学计量比的趋势,光学带隙加宽,光暗电导比增加.此外,还利用扫描电镜（SEM）观察了CdS/CdTe断面结合光谱响应（QE）的结果讨论了氧对CdS/CdTe界面互扩散的影响.发现,随着CdS薄膜制备气氛中氧分压的升高,CdS/CdTe界面的互扩散程度降低,有利于提高器件在500—600 nm波长范围内的光谱响应.认为,氧含量的增加不但使CdS薄膜在光伏应用方面的质量得到改善,而且CdTe太阳电池器件中的CdS/CdTe界面也得到了优化. 关键词： CdS多晶薄膜 近空间升华法 窗口层 界面     

磁控溅射Cl掺杂CdTe薄膜的孪晶结构与电学性质

CdTe用作薄膜太阳能电池吸收层需要经过氯处理才能得到高的光电转换效率,其中Cl原子的作用机理仍然没有完全被理解.实验发现Cl原子主要偏聚在CdTe晶界处,对晶界有钝化作用,而有第一性原理计算认为Cl原子掺入CdTe晶格能够引入浅能级提高光电转换效率.为了验证Cl原子掺杂是否对CdTe的光电转换效率有益,本文通过磁控溅射制备了100 ppm(ppm=1/1000000)Cl原子掺杂的CdTe(CdTe:Cl)薄膜并研究了薄膜的晶体结构与电学性质,同时对比了正常氯处理的无掺杂CdTe薄膜与CdTe:Cl薄膜之间的性质区别.实验发现Cl原子掺杂会在CdTe:Cl中形成大量仅由几个原子层构成的孪晶,电子和空穴在CdTe:Cl薄膜中没有分离的传导通道,而在氯处理后的CdTe薄膜中电子沿晶界传导,空穴沿晶粒内部传导.磁控溅射沉积的CdTe:Cl多晶薄膜属于高阻材料,退火前载流子迁移率很低,退火后载流子浓度降低到本征数量级,电阻率提高.CdTe:Cl薄膜电池效率远低于正常氯处理的无掺杂CdTe薄膜电池效率.磁控溅射制备的非平衡重掺杂CdTe:Cl多晶薄膜不适合用作薄膜太阳能电池的吸收层.     

磁控溅射法制备钴掺杂氧化锌薄膜室温磁学性质

钴掺杂氧化锌是室温稀磁半导体的重要候选材料,其磁学特性和钴掺杂浓度、显微结构及光学性质密切相关。磁控溅射具有成本低、易于大面积沉积高质量薄膜等特点,是广受关注的稀磁半导体薄膜制备方法。利用磁控溅射方法制备了不同浓度的钴掺杂氧化锌薄膜,并对其显微结构、光学性质和磁学特性进行了系统分析。结果表明:当掺杂原子分数在8%以内时,钴掺杂氧化锌薄膜保持单一的铅锌矿晶体结构,钴元素完全溶解在氧化锌晶格之中;薄膜在可见光区域有很高的透射率,但在567, 615和659 nm处有明显吸收峰,这些吸收峰源于Co2+处于O2-形成的四面体晶体场中的特征d-d跃迁。磁学特性测试结果表明钴掺杂氧化锌薄膜具有室温铁磁性,且钴的掺杂浓度对薄膜的磁学特性有重要影响。结合薄膜结构、光学和电学性质分析,实验中观察到的室温铁磁性应源于钴掺杂氧化锌薄膜的本征属性,其铁磁耦合机理可由束缚磁极化子模型进行解释。     

磁控溅射法制备钴掺杂氧化锌薄膜室温磁学性质（英文）

钴掺杂氧化锌是室温稀磁半导体的重要候选材料,其磁学特性和钴掺杂浓度、显微结构及光学性质密切相关。磁控溅射具有成本低、易于大面积沉积高质量薄膜等特点,是广受关注的稀磁半导体薄膜制备方法。利用磁控溅射方法制备了不同浓度的钴掺杂氧化锌薄膜,并对其显微结构、光学性质和磁学特性进行了系统分析。结果表明:当掺杂原子分数在8%以内时,钴掺杂氧化锌薄膜保持单一的铅锌矿晶体结构,钴元素完全溶解在氧化锌晶格之中;薄膜在可见光区域有很高的透射率,但在567,615和659nm处有明显吸收峰,这些吸收峰源于Co2+处于O2-形成的四面体晶体场中的特征d-d跃迁。磁学特性测试结果表明钴掺杂氧化锌薄膜具有室温铁磁性,且钴的掺杂浓度对薄膜的磁学特性有重要影响。结合薄膜结构、光学和电学性质分析,实验中观察到的室温铁磁性应源于钴掺杂氧化锌薄膜的本征属性,其铁磁耦合机理可由束缚磁极化子模型进行解释。     

利用MOCVD技术生长As掺杂的p-ZnMgO薄膜

利用GaAs夹层掺杂的新方法,采用金属有机化学气相沉积(MOVCD)技术,通过控制生长温度,在蓝宝石衬底上成功制备出As掺杂的p型ZnMgO薄膜.利用X射线衍射分析(XRD)、霍尔效应测试和光致发光(PL)谱等表征方法对薄膜的晶体结构、电学性能和光学特性进行分析.结果表明:高温生长的ZnMgO薄膜具有良好的c轴取向性;...     

P型Cd1-xZnxTe薄膜的制备及性质研究

采用Cu对共蒸发法制备的Cd1-xZnxTe薄膜进行p型掺杂。用X射线荧光、X射线衍射、扫描电镜、紫外-可见分光光度计、热探针、四探针和台阶仪研究了不同Cu掺杂浓度下Cd1-xZnxTe薄膜退火前后的组分、结构、形貌、光学性质及电学性质的变化。结果表明掺Cu 10%的薄膜在退火后导电类型由P型转变为N型、电阻率增大了几个数量级;掺铜20%的样品退火后导电类型和电阻率未发生明显改变,退火后薄膜表面较为均匀完整;掺铜30%的薄膜透过率显著下降到10%以下,退火前后均为P型薄膜。     

化学水浴法制备大面积CdS薄膜及其光伏应用

采用化学水浴法制备了大面积CdS多晶薄膜,研究了薄膜的形貌、结构和光学性质,结果表明,大面积CdS多晶薄膜具有良好的均匀性,通过优化CdS多晶薄膜,制成了不同CdS窗口层厚度的CdTe小面积太阳电池,减薄CdS薄膜可有效提高器件的短路电流,改善器件性能.随后,在面积30cm×40cm的衬底上制备了全面积为993.6cm²的CdTe太阳电池组件,其27个集成单元的电学性质较为均匀,太阳电池组件的光电转换效率8.13%. 关键词： 化学水浴法(CBD) CdS薄膜 CdTe太阳电池 CdTe太阳电池组件     

Ag掺杂p型ZnO薄膜及其光电性能研究

采用超声喷雾热分解法在石英衬底上以醋酸锌水溶液为前驱体,以硝酸银水溶液为Ag掺杂源生长了Ag掺杂ZnO(ZnO：Ag)薄膜.研究了衬底温度对所得ZnO：Ag薄膜的晶体结构、电学和光学性质的影响规律.所得ZnO：Ag薄膜结构良好,在室温光致发光谱中检测到很强的近带边紫外发光峰,透射光谱中观测到非常陡峭的紫外吸收截止边和较高的可见光区透过率,表明薄膜具有较高的晶体质量与较好的光学特性.霍尔效应测试表明,在500℃下获得了p型导电的ZnO：Ag薄膜,载流子浓度为5.30×10¹⁵cm关键词： ZnO：Ag薄膜 p型掺杂 超声喷雾热分解 霍尔效应     

Impact of thermal annealing on physical properties of vacuum evaporated polycrystalline CdTe thin films for solar cell applications

A study on impact of post-deposition thermal annealing on the physical properties of CdTe thin films is undertaken in this paper. The thin films of thickness 500 nm were grown on ITO and glass substrates employing thermal vacuum evaporation followed by post-deposition thermal annealing in air atmosphere within low temperature range 150–350 °C. These films were subjected to the XRD, UV‐Vis NIR spectrophotometer, source meter, SEM coupled with EDS and AFM for structural, optical, electrical and surface topographical analysis respectively. The diffraction patterns reveal that the films are having zinc-blende cubic structure with preferred orientation along (111) and polycrystalline in nature. The crystallographic parameters are calculated and discussed in detail. The optical band gap is found in the range 1.48–1.64 eV and observed to decrease with thermal annealing. The current–voltage characteristics show that the CdTe films exhibit linear ohmic behavior. The SEM studies show that the as-grown films are homogeneous, uniform and free from defects. The AFM studies reveal that the surface roughness of films is observed to increase with annealing. The experimental results reveal that the thermal annealing has significant impact on the physical properties of CdTe thin films and may be used as absorber layer to the CdTe/CdS thin films solar cells.     

Role of cadmium-related defects on the structural and electrical properties of nanocrystalline CdTe:TiO2 sputtered films

CdTe:TiO₂ nanocrystalline films with varying volume fraction of CdTe were prepared by rf magnetron sputtering from a composite TiO₂:CdTe target. The structural and electrical properties of the films were analyzed as a function of their Cd concentration. It was found that thermally treated films were Cd-rich and were stress free and had lower resistivity values. Field dependent current measurements showed that nanocrystalline films upon thermal treatment in the range 250–300 °C exhibit an unusual current peak under certain conditions of field and temperature. The current peak was associated with the presence of Cd-related defects in the CdTe lattice. The threshold temperature for the formation of Cd-related defects shifted to lower values for Cd-deficient films.     

Microstructure and electro-optical properties of sol–gel derived Cd-doped ZnO films

The microstructure, and the electrical and optical properties of undoped zinc oxide (ZnO) and cadmium-doped ZnO (CZO) films deposited by a sol–gel method have been investigated. The films have a polycrystalline structure with hexagonal wurtzite ZnO. Scanning electron microscopy (SEM) images indicated that the films have a wrinkle network with uniform size distributions. The elemental analyses of the CZO films were carried out by energy dispersive X-ray analysis. The fundamental absorption edge changed with doping. The optical band gap of the films decreased with Cd dopant. The optical constants of the films such as refractive index, extinction coefficient and dielectric constants changed with Cd dopant. A two-probe method was used to investigate the electrical properties, and the effect of Cd content on the electrical properties was investigated. The electrical conductivity of the films was improved by incorporation of Cd in the ZnO film.     

CdS/CdTe异质结-液晶型非相干-相干图像转换光阀的研究

本文报道了用CdS/CdTe光敏薄膜异质结和扭曲向列相液晶所构成的交流图像转换光阀的研制结果,讨论了组成光阀的各膜层参数对光阀性能的影响,分析表明,光阀性能的提高不仅有赖于各膜层的参数,而且和这些参数之间的匹配密切相关。 关键词：     

Microstructural analysis for europium in CdTe films

CdTe:Eu films were grown by the pulsed laser deposition method on glass substrates. The targets were prepared with three different concentrations of Cd, Te and Eu employing CdTe and EuTe powders, homogenized by ball milling. X-ray diffraction measurements showed that the samples grown with a mixture of phases related with the structure of CdTe and EuTe, with a little increase of the lattice parameter. Scanning electron micrographs revealed that CdTe:Eu films presented a texture similar to solidified drops. Optical transmission spectroscopy was used for determinate the band gap of samples. Raman spectroscopy results shown broadening of Raman features associated with the structure of CdTe and EuTe with nominal Eu content.     

Defects in HgCdTe grown by molecular beam epitaxy on GaAs substrates

The Hall effect and photoluminescence measurements combined with annealing and/or ion milling were used to study the electrical and optical properties of HgCdTe films grown by molecular-beam epitaxy on GaAs substrates with ZnTe and CdTe buffer layers. Unintentional donor doping, likely from the substrate, which resulted in residual donor concentration of the order of 10¹⁵ cm^?3, was observed in the films. Also, acceptor states, possibly related to structural defects, were observed.     

Anti-Reflection Characteristics of Si Nanowires for Enhanced Photoluminescence from CdTe/CdS Quantum Dots

CdTe/CdS quantum dots(QDs) are fabricated on Si nanowires(NWs) substrates with and without Au nanoparticles(NPs). The formation of Au NPs on Si NWs can be certified as shown in scanning electron microscopy images. The optical properties of samples are also investigated. It is interesting to find that the photoluminescence(PL) intensity of Cd Te/Cd S QD films on Si nanowire substrates with Au NPs is significantly increased,which can reach 8-fold higher than that of samples on planar Si without Au NPs. The results of finite-difference time-domain simulation indicate that Au NPs induce stronger localization of electric field and then boost the PL intensity of QDs nearby. Furthermore, the time-resolved luminescence decay curve shows the PL lifetime, which is about 5.5 ns at the emission peaks of QD films on planar, increasing from 1.8 ns of QD films on Si NWs to4.7 ns after introducing Au NPs into Si NWs.     

Synthesis and characterization of brightly photoluminescent CdTe nanocrystals

A new synthesis procedure for the preparation of spherical shaped CdTe nanocrystals (NCs) is presented, exhibiting bright luminescence with exceptionally high quantum efficiency (up to 85%). The growth of these NCs occurs in a non-coordinating solvent, octadecene, with the addition of oleic acid/tri-octylphosphine stabilizers, CdO as a precursor for the Cd monomers and additional Cd metal particles as a supplementary Cd reservoir source. The dependence of the crystalline quality and the optical properties of the CdTe NCs, on the initial Cd:Te precursors’ molar ratio, and the reaction duration were investigated. It was demonstrated that the NCs’ properties improved significantly as the initial Cd:Te molar ratios are increased. The obtained NCs’ properties were correlated with measurements of the Cd⁰ concentration in Cd metal particles, CdTe NCs and in Cd monomer solutions.     

Physical properties of vacuum evaporated CdTe thin films with post-deposition thermal annealing

This paper presents the physical properties of vacuum evaporated CdTe thin films with post-deposition thermal annealing. The thin films of thickness 500 nm were grown on glass and indium tin oxide (ITO) coated glass substrates employing thermal vacuum evaporation technique followed by post-deposition thermal annealing at temperature 450 °C. These films were subjected to the X-ray diffraction (XRD),UV-Vis spectrophotometer, source meter and atomic force microscopy (AFM) for structural, optical, electrical and surface morphological analysis respectively. The X-ray diffraction patterns reveal that the films have zinc-blende structure of single cubic phase with preferred orientation (111) and polycrystalline in nature. The crystallographic and optical parameters are calculated and discussed in brief. The optical band gap is found to be 1.62 eV and 1.52 eV for as-grown and annealed films respectively. The I–V characteristics show that the conductivity is decreased for annealed thin films. The AFM studies reveal that the surface roughness is observed to be increased for thermally annealed films.