Luminescence study of Si/Ge quantum dots

We present a photoluminescence (PL) study of Ge quantum dots embedded in Si. Two different types of recombination processes related to the Ge quantum dots are observed in temperature-dependent PL measurements. The Ge dot-related luminescence peak near 0.80 eV is ascribed to the spatially indirect recombination in the type-II band lineup, while a high-energy peak near 0.85 eV has its origin in the spatially direct recombination. A transition from the spatially indirect to the spatially direct recombination is observed as the temperature is increased. The PL dependence of the excitation power shows an upshift of the Ge quantum dot emission energy with increasing excitation power density. The blueshift is ascribed to band bending at the type-II Si/Ge interface at high carrier densities. Comparison is made with results derived from measurements on uncapped samples. For these uncapped samples, no energy shifts due to excitation power or temperatures are observed in contrast to the capped samples.     

Radiative recombination of indirect exciton in type-II ZnSeTe/ZnSe multiple quantum wells

The tunability of the emission energy, oscillator strength and photoluminescence (PL) efficiency by varying the well thickness and excitation density was demonstrated in the ZnSe_0.8Te_0.2/ZnSe multiple quantum wells. A significant blueshift about 260 meV of the PL peak energy was observed as the well width decreased from 5 to 1 nm. An extraordinary long lifetime (300 ns) of the recombination for the widest sample was detected. The binding energy of the indirect excitons is determined as 12 meV for the thinnest sample. The reduction of PL efficiency by thermal energy is greatly suppressed by employing a high excitation power.     

The Role of Silicon Oxide Layers in Luminescence of Ensembles of Silicon Quantum Dots

Based on the quantum confinement-luminesecence center model,to ensembles of spherical silicon nanocrystals (nc-Si)containg two kinds of luminescence centers(LCs) in the SiOx layers surrounding the nc-Si,the relationship between the photolumincescence(PL) and the thickness of the SiOx layer is studied with the excitation energy flux density as a parameter.When there is no SiOx layer surrounding the nc-Si,the electron-heavy hole pair can only recombine inside the nc-Si,then the PL bluehift with reducing particle sizes roughly accords with the rule predicted by the quantum confinement model of Canham.When there presences a SiOx layer,some of the carriers may tunnel into it and recombine outside the nc-Si at the LCs to emit visible light.The thicker the SiOx layer is,the higher the radiative recombination rate occurred outside the nc-Si will be.When the central Scale of the nc-Si is much smaller than the critical scale,the radiative recombination rate outside the nc-Si dominates,and visible PL will be possible for some nc-Si samples with big average radius,greater than 4nm,for example.When there is only one kind of LC in the SIOx layer,the PL peak position does not shift with reducing particle sizes.All these conclusions are in accord with the experimental results.When there are two or more kinds of LCs in the SiOx layer,the PL peak position energy and intensity swing with reducing particle sizes.     

Time-resolved photoluminescence study of the red emission in nanoporous SiGe alloys

Porous Si_1−xGe_x (PSiGe) layers with efficient room temperature visible photoluminescence (PL) were elaborated by anodical etching from p-type doped epitaxial layers with Ge contents from 5 to 30%. The luminescence is characterised by a broad PL band centred at 1.8 eV. Time resolved photoluminescence decay is studied in porous silicon germanium as a function of germanium content, temperature, emission energies and surface passivation. The PL decay line shape is well described by a stretched exponential in all cases. The effective lifetime at low temperature in as prepared porous Si_1−xGe_x is 400 μs, i.e. an order of magnitude less than in porous silicon. After the formation of a 20 Å thick oxide surface layer we observe a decrease of the effective lifetime to 20 μs at T=4 K.     

Visible and infrared photoluminescence from Er-doped SiOx

The annealing behaviors of photoluminescence of SiO_x and Er-doped SiO_x grown by molecular beam epitaxy in the wavelength range of visible and infrared light are studied. For SiO_x, four PL bands located at 510, 600, 716 and 810 nm, respectively, are observed. For Er-doped SiO_x, the 716 nm band, which is believed to be originated from the electron–hole recombination at the interface between crystalline Si and amorphous SiO₂, disappears in the annealing temperature range of 500–900°C. It is suggested the enhancement of Er luminescence is partially due to the energy transfer from the recombination at the interface between crystalline Si and SiO₂ to Er ions.     

Continuous photoluminescence, time resolved photoluminescence and optically detected magnetic resonance measurements of PbI2 nanometer-sized particles, embedded in SiO2 films

The nanometer sized particles of PbI₂ were embedded in SiO₂ films. X-ray diffraction and the TEM pictures showed the preservation of the bulk layered structure and symmetry. The PL spectrum of the nano-particles exhibited a pronounced blue shift of the exciton band due to quantum size effect. The Lead Iodide represents an exceptionally small exciton Bohr radius (a_B = 19 Å) and a special case in which m_e m_h. The prepared samples contained particles with mean radii, a, in the range a_B < a < 3a_B. Within this limit (with m_e m_h), the experimental results suggest that the electron is localized nearly at the center of the particle, enabling the hole to move around it. Thus, the size confinement permits the creation of an acceptor-like exciton. The PL spectrum revealed additional states, associated with stoichiometric defects either at the interior or surface sites of the nano-particles. These defects act either as donor or acceptor states. The dynamics of the various recombination processes has been investigated by measuring the time resolved PL spectra. The results show a multiexponential behavior of the various recombination emission bands, indicating the occurrence of trapping and detrapping processes. Analysis of these results suggests that the existence of surface states give rise to these complex radiative decay processes. The correlation between donor-acceptor recombination emission bands in the aforementioned samples and lattice imperfections was examined, utilizing optically detected magnetic resonance (ODMR) spectroscopy. The results identified the following imperfection sites: an acceptor site associated with an isotropic Lead vacancy defect, [V⁻]_pb²⁺ and a donor site, associated with an anisotropic Iodine vacancy, [V⁰]_Iodine.     

Cathodoluminescence properties of silicon nanocrystallites embedded in silicon oxide thin films

Cathodoluminescence (CL) spectra for the Si nanocrystallites embedded in a matrix of silicon oxide films are measured at room temperature. The CL spectra consist of two principal bands whose peak energies are in a near-infrared (NIR) region (<1.6 eV) and in a blue region (2.6 eV), respectively. The spectral feature of the NIR CL band is similar to the corresponding PL spectra. The strong correlation between the presence of Si nanocrystallites and the formation of the NIR CL band are found as well as the PL spectrum. The peak energy of the blue CL band is slightly lower than that of the luminescence band originating from oxygen vacancies (≡Si–Si≡) in SiO₂. Therefore, the blue CL band is considered to come from Si_n clusters with n3 in the oxide matrix. Under irradiation of electron beams, degradation of the intensity is observed for both the CL bands but the decay characteristics are different.     

Abnormal Energy Dependence of Photoluminescence Decay Time in InGaN Epilayer

We employ photoluminescence (PL) and time-resolved PL to study exciton localization effect in InGaN epilayers.By measuring the exciton decay time as a function of the monitored emission energy at different temperatures,we have found unusual behaviour of the energy dependence in the PL decay process. At low temperature, the measured PL decay time increases with the emission energy. It decreases with the emission energy at 200K, and remains nearly constant at the intermediate temperature of 12OK. We have studied the dot size effect on the radiative recombination time by calculating the temperature dependence of the exciton recombination lifetime in quantum dots, and have found that the observed behaviour can be well correlated to the exciton localization in quantum dots. This suggestion is further supported by steady state PL results.     

Assessing Carrier Recombination Processes in Type‐II SiGe/Si(001) Quantum Dots

In this work, it is shown how different carrier recombination paths significantly broaden the photoluminescence (PL) emission bandwidth observed in type‐II self‐assembled SiGe/Si(001) quantum dots (QDs). QDs grown by molecular beam epitaxy with very homogeneous size distribution, onion‐shaped composition profile, and Si capping layer thicknesses varying from 0 to 1100 nm are utilized to assess the optical carrier‐recombination paths. By using high‐energy photons for PL excitation, electron‐hole pairs can be selectively generated either above or below the QD layer and, thus, clearly access two radiative carrier recombination channels. Fitting the charge carrier capture‐, loss‐ and recombination‐dynamics to PL time‐decay curves measured for different experimental configurations allows to obtain quantitative information of carrier capture‐, excitonic‐emission‐, and Auger‐recombination rates in this type‐II nano‐system.     

Probing individual localization centers in an InGaN/GaN quantum well

Photoluminescence (PL) spectroscopy with subwavelength lateral resolution has been employed to probe individual localization centers in a thin InGaN/GaN quantum well. Spectrally narrow emission lines with a linewidth as small as 0.8 meV can be resolved, originating from the recombination of an electron-hole pair occupying a single localized state. Surprisingly, the individual emission lines show a pronounced blueshift when raising the temperature, while virtually no energy shift occurs for increasing excitation density. These findings are in remarkable contrast to the behavior usually found in macro-PL measurements and give a fundamental new insight into the recombination process in semiconductor nanostructures in the presence of localization and strong internal electric fields. We find clear indications for a biexciton state with a negative binding energy of about -5+/-0.7 meV.     

Influence of the quantum-confined Stark effect on the temperature-induced photoluminescence blueshift of In GaN/GaN quantum wells in laser diode structures

Measurements of the excitation power-dependence and temperature-dependence photoluminescence(PL) are performed to investigate the emission mechanisms of In Ga N/Ga N quantum wells(QWs) in laser diode structures. The PL spectral peak is blueshifted with increasing temperature over a certain temperature range. It is found that the blueshift range was larger when the PL excitation power is smaller. This particular behavior indicates that carriers are thermally activated from localized states and partially screen the piezoelectric field present in the QWs. The small blueshift range corresponds to a weak quantum-confined Stark effect(QCSE) and a relatively high internal quantum efficiency(IQE) of the QWs.     

Nonlinear Photoluminescence from ZnO Nanobelts

The nonlinear photoluminescence （PL） including second-harmonic generation （SHG） and the multiphoton luminescence （MPL） around 385 nm and 530 nm from ZnO nanobelts are investigated by using near-infrared excitations. The excitation wavelength dependence of MPL intensity reveals resonant energy transfer from SHG to MPL near the band gap excitation. The lifetime measurement of the MPL shows a much slower decay process of the defect emission, which results from the generation and recombination of both donors and acceptors on the disordered surface of the ZnO nanobelts.     

Optical and photoconductivity studies of Cu2O nanowires synthesized by solvothermal method

The solvothermal method has been employed to synthesize cuprous oxide (Cu₂O) nanowires using a precursor of cupric acetate monohydrate (CuAc₂) and ethylene glycol (EG) as the solvent. By optimizing the reaction temperature and reaction time, we have prepared Cu₂O nanowires with a diameter of approximately 7 nm and a length of several nanometers. The UV-visible absorption spectrum of the nanowires shows obvious blueshift compared to the bulk Cu₂O, which arises from the quantum confinement effect of the excitonic transition expected for Cu₂O nanowires. Here we also report the role of different excitation energies on the photoluminescence (PL) properties of the Cu₂O nanowires by steady-state and time-resolved PL spectroscopy. The decay times vary from nanoseconds to picoseconds. Decay kinetics indicates that the average lifetime 〈τ〉 of the nanowires increases with increasing excitation energy. The current-voltage (I-V) curves of the nanowires give the photocurrent density 16 times larger than the dark current density.     

Optical properties of InGaN quantum dots

We present time-resolved and spatially-resolved photoluminescence (PL) measurements of InGaN inclusions in a GaN matrix. The structures were grown by metal-organic chemical vapor deposition on sapphire and Si(111) substrates. Nonresonant pulsed excitation yields a broad PL peak, while resonant excitation into the nonresonant PL intensity maximum results in an evolution of a sharp resonant PL peak, having a spectral shape defined by the excitation laser pulse and a radiative decay time close to that revealed for PL under nonresonant excitation. Observation of a resonantly excited narrow PL line gives clear proof of the quantum dot (QD) nature of luminescence in InGaN–GaN samples. Cathodoluminescence (CL) and micro-PL measurements demonstrate sharp emission lines from single QD states. The recombination dynamics of single QD’s and the whole QD ensemble were investigated. Monoexponential decay was observed for the PL of single QD’s. For similar transition energies different time constants were obtained. Therefore the nonexponential decay observed for the whole ensemble is attributed to the coexistence of QD’s having similar ground-state transition energies, but significantly different electron–hole overlap.     

CdTe/CdZnTe多量子阱激子复合动力学性质的研究

报道了分子束外延制备的高质量CdTe/Cd_0.64Zn_0.36Te多量子阱结构的光学性质,由变温光致发光光谱讨论了随温度升高辐射线展宽和辐射复合效率降低的机理.在变密度激发的皮秒时间分辨光谱中,发现不同激发密度下发光衰减时间不同,并研究了它的机理.在高激发密度下观测到n=2的重空穴激子发光. 关键词：     

Luminescence from Si-Si1−xGex/Si1−yCy-Si structures

Near band edge photoluminescence has been obtained from Si_1−yC_y quantum well (QW) and neighboring Si_1−xGe_x/Si_1−yC_y double QW (DQW) structures. Enhanced no-phonon recombination is observed from the DQW structures and it is attributed to a breaking of the k-selection rule in the presence of the heterointerface. The luminescence persists for measurement temperatures up to 30–50 K and the intensity exhibits a quenching behavior with an activation energy equal to 8–20 meV. In electroluminescence only recombination in the Si_1−xGe_x layer has been observed from neighboring Si_1−xGe_x and Si_1−yC_y DQW structures.     

Ce3+, Mn2+共掺的Ca4Y6 (SiO4)6F2的发光性质和能量传递

采用高温固相法制备了Ca_4-xY_5.95 (SiO₄)₆F₂:0.05Ce³⁺, _xMn^{2 +}系列荧光粉,并对其发光性质以及Ce³⁺, Mn^{2 +}在Ca₄Y₆ (SiO₄)₆F₂ (CYSF)基质中的能量传递过程进行了研究.相结构研究表明: CYSF属于一种基于磷灰石结构的类质同象化合物.CYSF: 0.05Ce³⁺, _xMn²⁺荧光粉在200–373 nm为宽带激发光谱,Ce³⁺和Mn²⁺在408 nm和602 nm的发射峰分别由Ce³⁺的5d→4f的跃迁和Mn²⁺的⁴T₁ (⁴G)→ ⁶A₁ (⁶S)的跃迁产生.光谱重叠现象以及荧光寿命测试结果证明了Ce³⁺对Mn²⁺具有敏化作用,能级结构分析进一步证实该体系中存在Ce³⁺→Mn²⁺的能量传递过程,可有效地将Ce³⁺的蓝光转换为红橙光. 关键词： 磷灰石 发光性质 能量传递     

玻璃中CdSeS纳米晶体的室温光致发光谱

对掺有过饱和的镉、硒和少量硫的玻璃在500～800℃分别退火4h,生长了不同尺寸的CdSe_1-xS_x纳米晶体。测量了纳米晶体的室温吸收光谱和光致发光(PL)光谱,550℃生长的样品在300～800nm的范围没有观察到吸收和发光峰,表明温度低于550℃玻璃中不能形成纳米晶体。生长温度在600～650℃,纳米晶体的PL光谱主要为两个宽的发光带,即带边激子发光带和通过表面态复合的发光带。随着生长温度的升高,带边复合发光的蓝移减小,通过表面态的发光逐渐消失,并出现了叠加于宽发光带上的一系列明显的弱发射峰。不同温度生长的样品中,叠加峰的能量相同。同一样品中叠加峰的能量不随激发光波长的变化而变化。     

近800 nm波长张应变GaAsP/AlGaAs量子阱激光器有源区的设计

张应变GaAs_1-xP_x量子阱是高性能大功率半导体激光器的核心有源区,基于能带结构分析优化其结构参数具有重要的应用指导意义.首先,基于6×6 Luttinger-Kohn模型,采用有限差分法计算了张应变GaAs_1-xP_x量子阱的能带结构,得到了第一子带间跃迁波长固定为近800 nm时的阱宽-阱组分关系,即随着阱组分x的增加,需同时增大阱宽,且阱宽较大时靠近价带顶的是轻空穴第一子带lh₁,阱宽较小时靠近价带顶的是重空穴第一子带hh₁.计算并分析了导带第一子带c₁到价带子带lh₁和hh₁的跃迁动量矩阵元.针对808 nm量子阱激光器,模拟计算了阈值增益与阱宽的关系,得到大阱宽有利于横磁模激射,小阱宽有利于横电模激射.进一步考虑了自发辐射和俄歇复合之后,模拟计算了808 nm量子阱激光器的阱宽与阈值电流密度的关系,阱宽较大时载流子对高能级子带的填充使得阈值电流密度增加,而阱宽较小时则是低的有源区光限制因子导致阈值电流密度升高,因此存在一最佳的阱宽-阱组分组合,可使阈值电流密度达到最小.本文的模拟结果可对张应变GaAs_1-xP_x量子阱激光器的理论分析和结构设计提供理论指导.     

Amorphous Si/insulator multilayers grown by vacuum deposition and electron cyclotron resonance plasma treatment

a-Si/insulator multilayers have been deposited on (0 0 1) Si by electron gun Si evaporation and periodic electron cyclotron resonance plasma oxidation or nitridation. Exposure to an O or N plasma resulted in the formation of a thin SiO₂ and SiN_x layer whose thickness was self-limited and controlled by process parameters. For thin-layer (2 nm) Si/SiO₂ and Si/SiN_x multilayers no visible photoluminescence (PL) was observed in most samples, although all exhibited weak “blue” PL. For the nitride multilayers, annealing at 750°C or 850°C induced visible PL that varied in peak energy with Si layer thickness. Depth profiling of a-Si caps on thin insulating layers revealed no detectable contamination for the SiN_x layers, but substantial O contamination for the SiO₂ films.