Polymeric membrane studied using slow positron beam

A radioisotope slow positron beam has been built at the Chung Yuan Christian University in Taiwan for the research and development in membrane science and technology. Doppler broadening energy spectra and positron annihilation lifetime have been measured as a function of positron energy up to 30 keV in a polyamide membrane prepared by the interfacial polymerization between triethylenetetraamine (TETA) and trimesoyl chloride (TMC) on modified porous polyacrylonitrile (PAN) asymmetric membrane. The multilayer structures and free-volume depth profile for this asymmetric membrane system are obtained. Positron annihilation spectroscopy coupled with a slow beam could provide new information about size selectivity of transporting molecules and guidance for molecular designs in polymeric membranes.     

Applications of slow positrons to cancer research: Search for selectivity of positron annihilation to skin cancer

Slow positrons and positron annihilation spectroscopy (PAS) have been applied to medical research in searching for positron annihilation selectivity to cancer cells. We report the results of positron lifetime and Doppler broadening energy spectroscopies in human skin samples with and without cancer as a function of positron incident energy (up to 8 μm depth) and found that the positronium annihilates at a significantly lower rate and forms at a lower probability in the samples having either basal cell carcinoma (BCC) or squamous cell carcinoma (SCC) than in the normal skin. The significant selectivity of positron annihilation to skin cancer may open a new research area of developing positron annihilation spectroscopy as a novel medical tool to detect cancer formation externally and non-invasively at the early stages.     

Silicide formation in Co/Si system investigated by depth-resolved positron annihilation and X-ray diffraction

The transformation of Co/Si to CoSi₂/Si in the temperature range of 300-1170 K has been investigated using depth-resolved positron annihilation and Glancing incidence X-ray diffraction (GIXRD). The different silicide phases formed are identified from the experimental positron annihilation characteristics, which are consistent with the GIXRD results. The present study clearly indicates the absence of vacancy defects in the silicide overlayer.     

Slow positron beam study of corrosion-related defects in pure iron

Corrosion-related defects of pure iron were investigated by measuring Doppler broadening energy spectra (DBES) of positron annihilation and positron annihilation lifetime (PAL). Defect profiles of the S-parameter from DBES as a function of positron incident energy up to 30 keV (i.e. ∼1 μm depth) were analyzed. The DBES data show that S-parameter increases as a function of positron incident energy (mean depth) after corrosion, and the increase in the S-parameter is larger near the surface than in the bulk due to corrosion. Furthermore, information on defect size from PAL data as a function of positron incident energy up to 10 keV (i.e. ∼0.2 μm depth) was analyzed. In the two-state trapping model, the lifetime τ₂ = 500 ps is ascribed to annihilation of positrons in voids with a size of the order of nanometer. τ₁, which decreases with depth from the surface to the bulk, is ascribed to the annihilation of positrons in dislocations and three-dimensional vacancy clusters. The corroded samples show a significant increase in τ₁ and the intensity I₂, and near the surface the corroded iron introduces both voids and large-size three-dimensional vacancy clusters. The size of vacancy clusters decreases with depth.     

Oxidation and thermal reduction of the Cu(1 0 0) surface as studied using positron annihilation induced Auger electron spectroscopy (PAES)

Changes in the surface of an oxidized Cu(1 0 0) single crystal resulting from vacuum annealing have been investigated using positron annihilation induced Auger electron spectroscopy (PAES). PAES measurements show a large increase in the intensity of the annihilation induced Cu M_2,3VV Auger peak as the sample is subjected to a series of isochronal anneals in vacuum up to annealing temperature 300 °C. The intensity then decreases monotonically as the annealing temperature is increased to ∼600 °C. Experimental probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons are estimated from the measured intensities of the positron annihilation induced Cu M_2,3VV and O KLL Auger transitions. Experimental PAES results are analyzed by performing calculations of positron surface states and annihilation probabilities of surface-trapped positrons with relevant core electrons taking into account the charge redistribution at the surface, surface reconstructions, and electron-positron correlations effects. The effects of oxygen adsorption on localization of positron surface state wave function and annihilation characteristics are also analyzed. Possible explanation is proposed for the observed behavior of the intensity of positron annihilation induced Cu M_2,3VV and O KLL Auger peaks and probabilities of annihilation of surface-trapped positrons with Cu 3p and O 1s core-level electrons with changes of the annealing temperature.     

铁冷轧形变以及热处理对形变缺陷的影响

采用常用冷轧设备对铁进行冷轧引入形变缺陷。研究形变量和温度对形变缺陷的影响。形变样品中的微观缺陷、物相结构和形貌分别使用正电子湮没技术（PAT）、X射线衍射仪（XRD）和透射电子显微镜（TEM）进行表征分析。对经过673 K热处理的形变样品前后进行XRD测试,结果显示,随着形变量的增加,样品中晶面方向（200）具有择优生长趋势,673 K热处理后,择优趋势更加明显,同时晶粒的尺寸也增大。利用正电子湮没寿命谱和多普勒展宽能谱对样品中形变缺陷的热力学稳定性进行研究,发现形变引入的空位型缺陷约在673 K回复完毕,723 K后位错缺陷开始回复。The pure iron was cold rolled with the thickness reduction from 0% to 75%. The microstructure defects, crystallographic structure and morphology of deformed specimens were characterized by positron annihilation technique (PAT), X-ray diffraction (XRD) and transmission electron microscopy (TEM). The XRD results show that the intensity of (200) increased with increasing deformation, 673 K heat-treatment promote the preference of (200) and the grain size of (200) was increased. The PAT results show that the vacancy type defect was annihilated at 673 K and the dislocation type defects start to annihilate at 723 K.     

A study of defects in deformed FeSi alloys using positron annihilation techniques

Steels with high amounts of silicon are used in electrical applications due to their low magnetostriction, high electrical resistivity and reduced energy losses, but they exhibit poor formability. The slow positron beam of Gent is used to investigate defects in different deformed FeSi alloys. It was found that the concentration of defects for the alloys deformed at high temperatures are different from the ones related to the alloys deformed at room temperature. These results are correlated to the results of positron annihilation lifetime spectroscopy (PALS).     

Application of positron annihilation spectroscopy on the ion implantation damaged Fe-Cr alloys

Four different Fe-Cr binary alloys with Cr content 2.5-11 wt% were studied in details using various methods. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) were applied to obtain basic information, required for standard positron annihilation lifetime spectroscopy (PALS) spectra analysis. Additionally, PALS measurements were performed on as-received state as well as on helium implanted specimens. The He implantation was proposed for simulation of radiation damage and obtain high doses even in near surface areas (up to 1 μm). The implantation was based on the SRIM code simulation and next DPA calculations. Final concentration of vacancy type defects were calculated for 250 keV He²⁺ beam and the maximum was determined in 600 μm depth. Such specimens are very suitable for positron beam study of vacancy type defect mobility as a result of thermal treatment, which will be performed simultaneously in the future.     

Hydrogen damage in AISI 304 stainless steel studied by Doppler broadening

Hydrogen damage of AISI 304 stainless steel has been systemically investigated by measuring Doppler broadening of positron annihilation. Defect profiles of the S-parameter, the low-momentum annihilation fraction as a function of positron incident energy up to 30 keV (i.e. ∼1 μm depth) have been analyzed. Experimental results show that hydrogen damage between the surface and the bulk has a significant variation with depth, and strongly depends on the condition of hydrogen-charging, i.e. current density and charging time. It has been suggested that the increase in S-parameter near the surface after hydrogen-charging mainly comes from the formation of voids; however the increase in S-parameter in the bulk after hydrogen-charging mainly comes from the production of structural defects (dislocations). Defect densities induced due to hydrogen-charging in some cases (e.g. dislocation density in the bulk) are estimated based on the simple two-state trapping model.     

Strain-enhanced sintering of iron powders

Sintering of ball-milled and un-milled Fe powders has been investigated using dilatometry, X-ray, density, and positron annihilation techniques. A considerable sintering enhancement is found in milled powders showing apparent activation energies that range between 0.44 and 0.80 eV/at. The positron annihilation results, combined with the evolution of the shrinkage rate with sintering temperature, indicate generation of lattice defects during the sintering process of milled and un-milled powders. The sintering enhancement is attributed to pipe diffusion along the core of moving dislocations in the presence of the vacancy excess produced by plastic deformation. Positron annihilation results do not reveal the presence of sintering-induced defects in un-milled powders sintered above 1200 K, the apparent activation energy being in good agreement with that for grain-boundary diffusion in -Fe. PACS 81.20.Ev; 81.20.Wk; 78.70.Bj     

Electron—Positron annihilation in the narrow-band semiconductor Hg1−xCdxTe

Positron annihilation processes in mercury—cadmium—telluride semiconductor compounds have been studied. Calculations of the positron thermalization time, the bulk annihilation rate, and the positron capture rate for the simplest crystal lattice structural defects have been carried out. The annihilation properties of materials containing growth defects and defects induced by high-energy particles have been determined experimentally. The profiles of vacancy-type defects formed during ion implantation were determined using slow positrons. The positron annihilation data are compared with the results of electrophysical measurements.V. D. Kuznetsov Siberian Physicotechnical Institute, Tomsk State University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 10, pp. 3–21, October, 1995.     

The role of quenched‐in vacancies for the decomposition of aluminium alloys

The very early stages of decomposition during room temperature storage, i.e. just a few minutes after quenching, are investigated by positron annihilation lifetime spectroscopy for both an AlMgSi alloy and an AlCuMg alloy. It turns out that by freezing the decomposition kinetics during measurements we can detect vacancy–solute atom pairs. The formation of larger solute clusters with structural vacancies is seen by an increase of the mean positron lifetime in the course of storage at room temperature (RT). Earlier findings concerning aging at RT were unable to discover this effect. The detected changes are interpreted in terms of cluster formation. Thus we show that positron annihilation spectroscopy (PAS) is one of the very few methods to access early stages of decomposition in metallic alloys. Moreover, the lower limit of the concentration of quenched‐in vacancy‐like defects is calculated to be at least 2 × 10^–5 per atom. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Doppler-broadening measurements of microvoids at the Au/GaAs interface

Recent positron lifetime studies made on the Au/GaAs interface with an applied electric field returning a significant fraction of bulk implanted positrons to the interface have revealed the presence of microvoids( 1 nm diameter) at the interface. In this work an attempt has been made to study these microvoids by observing the Doppler broadening on the annihilation radiation coming from them. This is done both by observing theS-parameter as a function of applied bias and by applying the generalized least-squares method to the deconvolution of the annihilation radiation lineshape. The general conclusion is that the Doppler-broadened data are consistent with the majority of positrons trapping into microvoids, probably associated with grain boundaries. The data suggest that these open volume defects are more associated with the Au film rather than the Au-Ga alloyed interfacial region.Paper presented at the 132nd WE-Heraeus-Seminar on Positron Studies of Semiconductor Defects, Halle, Germany, 29 August to 2 September 1994     

Thermal evolution of defects produced by implantation of H, D and He in Silicon

Despite decades of study, voids in silicon produced by implantation of H or He followed by annealing continue to be a topic of interest. There are two key applications: gettering of heavy metal impurities, and “ion cutting” used in silicon-on-insulator fabrication. Positron annihilation is one of the few techniques that can probe the vacancies and vacancy clusters that are the precursors to void formation. Data from recent studies will be discussed, including (I) isotopic substitution, in which comparisons of H vs. D implantation permit examination of the impact of primary point defects vs. chemical effects. Remarkable differences exist between H and D in blistering of silicon - ion doses 2-3 times higher are required for blistering with D than with H, despite a higher rate of primary defect production for D; (II) the effect of annealing temperature ramp-rate, in which we show that ramp-rate has a significant impact on residual defects, despite which it is so disregarded as to often be omitted from published reports; and (III) comparisons with electron microscopy which suggest that positron annihilation can be insensitive to large voids. In these studies, positron annihilation augments data from techniques including ion channelling, Raman scattering and electron microscopy; the suite of techniques allows elucidation of the interplay between implanted impurities and the vacancies and interstitials created by implantation.     

Tunable monoenergy positron annihilation spectroscopy of polyethylene glycol thin films

Doppler broadening and coincidence Doppler broadening of annihilation radiation experiments have been performed in three kinds of polyethylene glycol(PEG) membrane formed with different average molecular weight using the tunable monoenergy slow positron probe as a function of implantion energy. The obtained positron annihilation parameters are interpreted from two aspects: surface effect and differences in micro-structure or chemical environment of positron annihilation. The experimental results show that the regulation of densification of PEG molecular packing and distribution uniformity from the near surface layer to the bulk region in the film forming process can be well realized by changing its molecular weight. Combining a variable monoenergetic slow positron beam and these two positron annihilation spectroscopy methods is a powerful tool to study positron annihilation characteristics and for polymeric thin-film fine structure analysis.     

Hg1-xCdxTe晶体缺陷的正电子湮没寿命

利用正电子(e⁺)湮没寿命谱实验研究了Hg_1-xCd_xTe晶体样品的空位缺陷.碲溶剂法生长的样品，不论是n型导电还是p型导电都存在大量的Hg空位.经过合适的退火工艺，p型材料转为n型，同时对正电子的俘获效应减小，表现为正电子湮没平均寿命值减小14—17ps.若退火温度高于350℃，正电子湮没寿命值又增大，表明Hg空位浓度增加.得到HgCdTe中正电子的体寿命为τ_b=272ps.根据正电子湮没寿命和电参数的测量结果，得出 关键词：     

Structural changes in TiC-TiNi alloys on deformation

The deformation of a composition material with a binding phase of shearing-unstable alloy, namely, titanium nickelide, is considered. X-ray structural analysis and electron—positron annihilation methods are used to investigate the structural changes in the composite material as a function of the degree of deformation. It is shown that the deformation produces the structural phase transition B2 B19, which is confirmed by x-ray structural investigations and electron positron annihilation.Institute of Strength Physics and Materials Science, Siberian Branch, Russian Academy of Sciences. Translated from Izvestiya Uchebnykh Zavednii, Fizika, No. 4, pp. 100–103, April, 1994.     

氘化对KH2PO4晶体微观缺陷影响的正电子湮没研究

采用传统降温法从不同程度氘化(x=0, 0.51, 0.85)的生长溶液中生长氘化KH₂PO₄(KDP) 晶体, 利用正电子湮没技术(正电子寿命谱和多普勒展宽谱)、结合X射线衍射谱(XRD) 结构分析, 对KDP晶体氘化生长的微观缺陷进行了研究, 讨论了氘化程度对晶体内部微观结构特性、缺陷类型和浓度的影响. XRD结果显示晶胞参数a, b值随氘含量的增加而增加, c值无明显变化; 正电子寿命谱结果发现随着氘化浓度的提高, KDP晶体内部中性填隙缺陷以及氧缺陷不断增加, 引起晶体晶格畸变; 氢空位、K空位、杂质替位缺陷不断发生缔合反应形成复合缺陷, 缺陷浓度不断减少; 团簇、微空洞等大尺寸缺陷也在不断发生聚合反应, 缺陷浓度表现为不断减少. 多普勒实验结果表明随着氘化程度的提升, 晶体内部各类缺陷表现为同步变化. 实验结果表明, KDP晶体在低浓度氘化生长(50%以内)下缺陷反应较弱, 而在高浓度氘化(50%以上)下的缺陷反应显著增强.     

Defects in semiconductors observed by positron annihilation

The origin of the effect of defects on positron annihilation in semiconductors has been studied. The electron-positron momentum densities in elemental semiconductors (Si and Ge), III-V compound semiconductors (GaAs, InP and GaSb), diamond and the proton irradiated Si were investigated by a full-scale use of the two-dimensional angular correlation of positron annihilation radiations (2D-ACAR). The obtained results showed, as a whole, good agreement with the electron momentum distribution of the fully occupied Jones zone with a small exception for the fact that the low density channels are running along the three principal axes. This anisotropy was strong in elemental semiconductors, while it was weakened in compound semiconductors. This anisotropy and its dependence on the material were found to be generally understood by the incorporation of crystal symmetry. The anisotropy will be discussed by group theory in conjunction to the effect of defects on positron annihilation.     

利用正电子湮没技术研究钾掺杂钨合金中的缺陷

钨合金中钾的掺杂会引入大量的缺陷,如尺寸几十纳米的钾泡、高密度的位错以及微米量级的晶粒带来的晶界等,这些缺陷的浓度和分布直接影响合金的服役性能.本文运用正电子湮没谱学方法研究钾掺杂钨合金中的缺陷信息,首先模拟计算了合金中各种缺陷的正电子湮没寿命,发现钾的嵌入对空位团、位错、晶界等缺陷的寿命影响很小;然后测量了不同钾含量掺杂钨合金样品的正电子湮没寿命谱,建立三态捕获模型,发现样品中有高的位错密度和低的空位团簇浓度,验证了钾对位错的钉扎作用,阐述了在钾泡形成初期是钾元素与空位团簇结合并逐渐长大的过程;最后使用慢正电子多普勒展宽谱技术表征了样品中缺陷随深度的均匀分布和大量存在,通过扩散长度的比较肯定了钾泡、晶界等缺陷的存在.