In-plane ESPI using an achromatic interferometer with low-coherence laser source

The use of an achromatic interferometer is explored as a means of doing in-plane ESPI measurements using a laser diode as the light source. This interferometer type, which uses a diffraction grating in place of the conventional beamsplitter, has two features that make it suitable for making ESPI measurements over extended areas, even when using a low-coherence laser diode source. First, the parallelogram optical geometry of the interferometer causes all rays passing through to have the same optical path lengths. Second, the interferometer is achromatic, whereby the piezo-actuated mirror that steps the illumination light does so by the same phase angle, independent of wavelength. This latter feature accommodates the spectral impurity of a laser diode source. A periodic variation of fringe visibility is observed in experiments, where narrow ranges of high visibility occur at regular spatial intervals. This behavior derives from the clustered discrete spectral character of laser diode light output. A method to “tune” the interferometer by slightly rotating the diffraction grating is described so as to achieve consistent high fringe visibility throughout the measured images.     

Simultaneous two-axis shearographic interferometer using multiple wavelengths and a color camera

Multi-component measurements in shearography and other applications of Electronic Speckle Pattern Interferometry (ESPI) are typically achieved using multiple optical configurations that are activated sequentially to measure each desired quantity separately. A novel optical setup is introduced here where orthogonal shearography measurements are simultaneously made using a single color-camera imaging multiple monochromatic light sources of different wavelengths. The Red–Green–Blue (RGB) sensors of a conventional Bayer type camera are read separately, thereby providing three independent color signals and independent ESPI phase maps. Orthogonal axis shearography is achieved using a modified shearography interferometer where a dichroic filter is added to provide a second wavelength-dependent measurement. The availability of the two surface slopes gives the opportunity for the data to be summed numerically to give the surface displacement shape. This application is of significant practical interest because the surface displacement measurement can be made under field conditions by taking advantage of the well-known optical stability of shearography measurements. The two simultaneously measured surface slopes also offer the possibility to mathematically compensate for non-uniformity and non-orthogonality in the image shear caused by mirror non-flatness and/or mirror misalignments.     

Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.     

Fabricating blazing grating on NGD by photochemical etching

This paper tries to introduce the reader to the method of using photochemical re-action to copy holographic optical elements(HOEs)in relief.The holographic blazing gratingso copied is groove depth adjustable phase modulability enlarged through copying and 3.3times the diffraction efficiency(DE)of the original grating.It is expected that the newmethod will lead to the mass production of the light-weight HOEs at low cost.     

Contrast enhanced and phase controlled stroboscopic additive fibre optic TV-holography for whole field out-of-plane vibration analysis

A new technique for real-time contrast enhancement and phase control of fringes in additive Stroboscopic TV-holography applied to out-of-plane vibration analysis and its implementation on a fibre-optic electronic speckle pattern interferometer (FOESPI) are presented. Synchronous Stroboscopic illumination, firing two pulses per object vibration period, is combined with simultaneous inter-pulse (high frequency) and inter-frame (low frequency) phase modulation in the reference arm of the ESPI yielding a sequence of frames (interferograms) that are grabbed and processed in real-time. With this technique both speckle and fringe phases are independently controlled by means of the parameters of modulation enabling speckle contrast inversion, as required to enhance the visibility of fringes by sequential subtraction, as well as dynamic fringe phase shifting to solve peakvalley ambiguities.     

Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation

The thickness change of transparent plates was measured by electronic speckle pattern interferometry (ESPI) method and digital image correlation (DIC) method. An out-of-plane ESPI system was developed based on the Michelson interferometer, and a new thickness measurement method was designed, which is on the basis of Snell's law of refraction and DIC. The main principles and experimental procedures of these two methods were presented. The thickness change of polymethyl specimens under uniaxial tensile loading were measured by the optical techniques and compared with each other. The results reveal that the data obtained with DIC method achieve better linearity than ESPI.     

The investigation of high frequency vibration modes of PZT-4 transducers using ESPI techniques with reference beam modulation

In this paper the experimental vibration amplitudes together with the vibration modes of the PZT-4 transducer radiating front face are presented for generation in various media. The studies were carried out using an electronic speckle pattern interferometer (ESPI) with reference beam modulation to give resolution down to 20 Å of surface amplitude. Analogies are drawn between these transducers and the resonant vibration modes of thin plates. The relationship between the surface vibration amplitudes and the radiation beam pattern of the transducers is also presented.     

High-speed ESPI and related techniques: overview and its application in the automotive industry

This paper provides an overview of recent developments and applications of high-speed electronic speckle pattern interferometry (ESPI) and related techniques ranging from high-speed pulsed laser techniques to high-speed camera methods. Different methods for extracting the phase distribution from high-speed ESPI fringe patterns are compared. Unique applications in the automotive industry using these techniques are provided. Finally, the outlook for high-speed ESPI and high-speed digital holographic interferometry are discussed.     

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera.     

电子散斑干涉载频调制形貌测量方法的分析

根据电子散斑干涉载频调制测量物体形貌的基本原理,物体表面的微小偏转可引入包含物体高度信息的载波干涉条纹。将物体的偏转视为变形,对物体变形与载波干涉条纹之间的关系进行了讨论,得出了离面位移引入载波和面内位移引入含有物体高度信息相位的结论。发现利用典型电子散斑干涉系统测量物体形貌效果最好,并通过实验得到了验证。     

Analysis of plastic strain localization by a combination of the speckle interferometry with the bulge test

The process of localization of strains, diffuse and localized necking, up to fracture in equi-biaxial loading was analyzed through the images obtained by electronic speckle pattern interferometry (ESPI). The problem of localization is important in the sheet metal forming processes. The ESPI technique is used to have a better resolution on the measured strains (10⁻⁵) than other technique such as the image correlation (10⁻², 10⁻³). The bulge test is currently used to determine the mechanical properties of materials by measuring the deformation that occurs in response to the application of a controlled pressure. This test is used to determine the mechanical properties of sheet metals submitted to an equi-biaxial loading path, the strains at failure are used as data to determine forming limit diagrams (FLDs).The aim of this study is to detect the localization of plastic strain (diffuse and localized necking) during the bulge test combined with a common speckle interferometer. This paper describes an original technique to detect the localization using the strain rate at different positions on the sample.The main originality of this work is the application of an optical interferometer to determine the field of plastic strain increments and strain rates in the region of the top of the specimen, at various stages of global strains.     

基于迈克尔逊干涉的傅里叶变换散斑形貌测量技术

提出了电子散斑干涉载频调制测量物体形貌的方法。采用典型的迈克尔逊干涉光路,将物体偏转一微小角度（等效为物面与参考面间形成空气楔）产生等厚干涉,可在物体的表面引入包含物体高度信息的载波干涉条纹。用CCD采集该载波条纹图,利用傅里叶变换法可解调出物体高度的位相信息,从而实现物体的形貌测量。介绍了电子散斑干涉载频调制测量物体形貌的原理,并进行了实物测量,给出了实验结果。由于该方法采用散斑干涉方法测量物体形貌,所以具有灵敏度高的优点。     

A comprehensive ESPI based system for combined measurement of shape and deformation of electronic components

This paper describes a very simple and reliable procedure for measuring shape and deformation of electronic components with a single experimental set-up. The procedure is based on two electronic speckle pattern interferometry (ESPI) techniques referred to as conventional ESPI and phase shifting ESPI (PS-ESPI). The present research is motivated by the fact that mismatch in thermal expansion coefficients of the different materials included in electronic packaging (EP) may cause mechanical failures since thermal stresses will change sharply through subsequent loading cycles. ESPI is particularly suitable for measurements on EP since it allows us to perform non–contact testing of non-planar heterogeneous surfaces. It is apparent that gathering detailed topographic information will certainly help us to measure accurately surface deformations of EP along with modeling correctly numerical analysis.As is known, the accuracy of results obtained with ESPI may be significantly improved by phase shifting techniques (PST). Therefore, this paper compares the relative merits of different phase-stepping strategies in order to find which strategy will perform the best for the optical set-up utilized in the experiments. Preliminary investigations on a standard specimen under three-point-bending served to choose properly the optical set-up and phase-stepping procedure which yield the best fringe visibility. Four-phases achieved the best fringe visibility and the minimum number of invalid pixels.These information have been utilized in the experimental campaign on standard and surface mounted technology (SMT) electronic components. ESPI and PS-ESPI have been used for analyzing the transient state and the steady state of devices, respectively. From the experimental results obtained here, it appears possible to measure strains induced by thermal loading cycles. The experimental set-up, based on the Lendeertz's interferometer, proved itself also able to contour specimen surface at a good level of detail. Remarkably, by using the same set-up for deformation and shape measurements we can preserve the pixel by pixel relationship between displacements and surface depth which will hold true if correlation between different exposures is not destroyed.The results obtained in this research justify using PS-ESPI in order to understand better failure mechanisms of electronic components. This fact along with the exact knowledge of object shape may be particularly useful in the different design stages (including FEM modeling and analysis) of electronics for special applications.     

The separation of out-of-plane displacement from in-plane components by fringe carrier method based on large image-shearing ESPI

A fringe carrier method for separating out-of-plane displacement from in-plane components based on large image-shearing electronic speckle pattern interferometry (ESPI) is presented. If the test object is respectively illuminated by two expanded symmetric illuminations in large image-shearing ESPI, two interferometers are formed. Carrier fringe patterns can be introduced by tilting reference surface a small angle. The carrier fringe patterns are demodulated after deformation of the object. Two phase maps, which include out-of-plane and in-plane displacement, can be obtained by using Fourier transform. Then out-of-plane displacement can be easily separated from in-plane displacement by simple operation between two unwrapped phase distributions. The principle of spatial carrier frequency modulation in large image-shearing ESPI is discussed. A typical three-point-bending experiment is completed. Experimental results are offered. The results show that the method offers high visibility of carrier fringes. And the system presented does not need a special beam as a reference light and has simple optical setup.     

Quantitative three-dimensional holographic interferometry for flow field analysis

Holographic interferometry offers the potential for quantitative, wholefield analysis of three-dimensional compressible flows. The technique is non-intrusive, does not require the introduction of seeding particles, and records the entire flow information within the pulse duration of a Q-switched ruby laser (˜30ns). At present, however, holographic interferometry is mainly used qualitatively due to the practical restrictions of data recording, acquisition and processing.To address the potential of holographic flow analysis a prototype multi-channel interferometer has been designed and preliminary wind tunnel results have been obtained. The proposed configuration uses specular illumination which, unlike comparable diffuse systems, does not suffer from fringe localisation and speckle noise. Beam collimation and steering through the flow field is achieved in a single operation by the use of holographic optical elements (HOEs). The resulting design is compact, light efficient, has aberration compensation, and the recorded data are conducive to both tomographic analysis and direct comparison to computational fluid dynamics (CFD) predictions.Holograms have been recorded of simple two-dimensional and axisymmetric compressible flows, to compare the accuracy of holographic density measurements with data from conventional pressure sensors and CFD codes. Data extraction from the holograms, and the elimination of rigid body motion, was achieved using digital Fourier transform fringe analysis. The introduction of phase errors by image processing has been investigated by analysing simulated fringe patterns generated from a combination of experimental amplitude information and computer generated phase data.     

平行式向列液晶实现相移剪切电子散斑干涉术的研究

研究了向列型液晶的相位调制特性，采用平行式向列液昌作为相移器建立了相移剪切电子散斑干涉计量系统。该方法将相移技术引入到剪切电子散斑干涉术中，提高了检测精度，采用了相关条纹法求解相位，简化了计算；相移方法简单，可靠。用该系统进行应变场的测量实验，取得了满意的效果。     

单幅对称变形相位图分离二维变形分量的相移电子散斑干涉技术

提出了利用相移电子散斑干涉测量物体二维变形分量的方法.单光束照明的传统电子散斑干涉技术,测量得到的是一幅物体变形的混合相位场.当物体具有对称变形时,可由这一幅相位图求得二维变形分量.方法是将该相位图镜像翻转得到第二幅相位图,通过二幅相位图的叠加、复位和分离运算,获得物体的二维变形场的分量值.利用三点加载的简支梁进行了实验,给出了实验结果,并与对称光照明实验结果进行了对比,验证了该方法的正确性.     

Batch skeleton extraction from ESPI fringe patterns using pix2pix conditional generative adversarial network

Optical Review - The key to measurement by electronic speckle pattern interferometry (ESPI) is to obtain accurate phase information from the ESPI fringe patterns. We propose a fast batch skeleton...     

热传导方程在散斑条纹图相位提取中的应用

去除电子散斑十涉条纹图中的噪声是提取条纹图相位的关键问题.利用热传导方程去除条纹图中的噪声,定性和定量分析了该方法的滤波性能.在此基础上,进一步将MBO算法和热传导方程应用于条纹二值化和相位图平滑过程中,并成功地从单幅模拟条纹图中提取了条纹图的相位.研究结果表明,热传导方程能有效减少散斑条纹图中的噪声,改善二值条纹图的边界.进而获得准确的相位分布.     

利用全息元件处理大面积图象

本文提出了一种专门制作的全息元件作照明器的图象处理系统,它可以利用白光照明实时处理大面积图象。这种系统可以进行两张图象差异的彩色显示、黑白图象的假彩色编码和彩色合成,以及对体视对图片的体视观察等。本文最后给出了实验结果。