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Halogen bonding (XB) has emerged as an important bonding motif in supramolecules and biological systems. Although regarded as a strong noncovalent interaction, benchmark measurements of the halogen bond energy are scarce. Here, a combined anion photoelectron spectroscopy and density functional theory (DFT) study of XB in solvated Br? anions is reported. The XB strength between the positively‐charged σ‐hole on the Br atom of the bromotrichloromethane (CCl3Br) molecule and the Br? anion was found to be 0.63 eV (14.5 kcal mol?1). In the neutral complexes, Br(CCl3Br)1,2, the attraction between the free Br atom and the negatively charged equatorial belt on the Br atom of CCl3Br, which is a second type of halogen bonding, was estimated to have interaction strengths of 0.15 eV (3.5 kcal mol?1) and 0.12 eV (2.8 kcal mol?1).  相似文献   

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The atomic/molecular layer deposition (ALD/MLD) technique provides an elegant way to grow crystalline metal–azobenzene thin films directly from gaseous precursors; the photoactive azobenzene linkers thus form an integral part of the crystal framework. Reversible water capture/release behavior for these thin films can be triggered through the transcis photoisomerization reaction of the azobenzene moieties in the structure. The ALD/MLD approach could open up new horizons for example, for the emerging fields of remotely controlled drug delivery and gas storage.  相似文献   

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Rezensionen     
《Nachrichten aus der Chemie》2010,58(10):1062-1064
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