一种高精度偏振遥感探测方式的精度分析

检偏器的角度误差是影响偏振遥感探测精度的重要因素之一,是许多高精度定量化偏振遥感需要考虑的一个问题。在检偏器(0°,60°,120°)放置的测量系统中,当入射光偏振角接近于0°或180°时偏振测量易产生最大误差值,而偏振角接近30°,90°和150°时,偏振度的测量具有很高的精度;在检偏器(0°,45°,90°)放置方式中,偏振角接近45°的光束测量易具有最大误差值,而偏振角接近于0°,90°和135°时,角度误差对偏振度测量精度的影响很小。除了个别偏振角外,对高偏振度入射光束的偏振测量通常具有较大的偏振测量误差。因此,引进线偏振光的平均偏振度测量精度描述偏振测量装置的优劣,结果表明检偏器(0°,60°,120°)放置方式优于检偏器(0°,45°,90°)放置方式。     

利用变偏振光谱技术实现显微成像深度选择

在正交偏振光谱(OPS)微循环成像系统的基础上,提出了通过改变信号光的偏振态来实现成像深度的选择。传统的OPS系统利用的是正交线偏振光,只能获得图像在某一断层的二维信息,但作者通过控制系统起、检偏单元椭圆偏振光的椭圆度,可以在不进行机械扫描的情况下将成像光束聚焦在不同的断层,从而获得不同深度处的组织信息。构建的变偏振光谱成像系统将光源发射光谱与红血球吸收光谱相匹配,可以实现微血管的探测,且具有较高的信噪比。对一块含标记物的猪肉脂肪进行实验,并通过图像处理得到了对比度与信号光偏振态间的定量关系。实验结果表明：椭圆度由0°～45°增大,即从线偏振光向圆偏振光转变的过程中,对比度逐渐增大,可探测到的最大深度增大。最后利用该系统,对裸鼠耳廓微血管进行了变偏振光谱测量实验,实验证明了控制偏振态可以实现对血管不同深度的探测,为微血管断层光谱成像提供了一种新的研究手段。     

偏振光谱的土壤湿度遥感方法实验研究

偏振探测作为一种新型遥感技术,是对传统光谱遥感探测的有益补充,为目标遥感探测提供更丰富的信息。用地物偏振光谱仪实验测量,分析土壤湿度与偏振光谱的相关性,同时研究不同观测角下的土壤表面反射光偏振光谱特性。结果表明：在土壤湿度较高的情况下,偏振光谱与土壤湿度具有一定的相关性,尤其在500～700 nm波段,湿度与偏振度呈正比关系;低湿度的情况下,偏振光谱与土壤湿度相关性不明显;此外,不同观测角对偏振光谱也有影响,如入射角固定为50°,观测角在20°～60°区间测量时,偏振度随观测角增大而增大,且观测角愈大,偏振度随湿度的变化愈显著。     

温室番茄缺素叶片偏振反射特征分析

为提高番茄植株营养胁迫定量分析模型的精度,探究偏振检测在植物单叶尺度进行无损检测的优势,利用自行研制的偏振反射光谱系统检测不同生长期温室番茄缺素叶片偏振反射特征。对影响番茄单叶偏振反射的主要因素：方位角、入射天顶角、探测天顶角、光源偏振片起偏角度、探测器偏振片起偏角度进行了讨论,通过正交试验的极差分析获取光谱仪各测量角度参数的优水平,并通过实验进一步验证,最终分析得到偏振光谱系统检测番茄缺素叶片的角度组合及主次排序为：入射天顶角60°、光源起偏角度0°、探测器起偏角度45°、探测天顶角45°、方位角180°,在此基础上对不同生长期的缺氮、缺磷、缺钾叶片以及不同缺素程度的叶片进行分析比较,结果显示偏振反射比随番茄叶片的生长周期呈现正相关关系,缺素和营养过量均能导致偏振反射比的下降,偏振反射比在结果期和采收期的降幅较为明显。对于偏振反射光谱在植物单叶尺度营养快速检测的深入研究具有一定的理论和实践意义。     

主振荡功率放大短脉冲光纤激光系统的偏振特性研究

对自行研制的主振荡功率放大结构短脉冲双包层光纤激光系统(2W,30ps)的偏振特性进行了研究.分别研究了种子源激光和经过包层泵浦放大后输出激光在连续工作和脉冲输出情况下的偏振特性,结果表明在不加偏振控制措施情况下,系统输出为椭圆偏振光,偏振度和偏振角都容易受到光纤扰动的影响;在激光腔内加入起偏器后,输出线偏振光,偏振态相对比较稳定,但是偏振角度仍然容易受到光纤扰动的影响.实验证明:经过高功率放大后,输出激光的偏振态稳定性有一定程度的下降,在进行激光相干合成前需进一步加以控制.     

基于LabVIEW的光偏振态转换及检测仿真设计

利用LabVIEW软件设计了光偏振态转换以及检测的仿真系统,该系统可实现线偏振光、圆偏振光、椭圆偏振光、非偏振光和部分偏振光的电场振动面的实时显示,并且能够准确仿真出半波片、1/4波片以及偏振片等偏振转换器件对光偏振状态的转换,最后还能实现偏振光的强度检测仿真.     

连续偏振光谱的稻种发芽率检测方法研究

针对目前传统稻种发芽率检测方法周期长、精度低的问题,提出新颖的基于连续偏振光谱技术实现稻种发芽率快速、无损检测的方法。以不同老化天数稻种为检测目标,10 min为检测时间点,使用起偏器将光纤准直光源调制成线偏振光垂直入射稻种浸出液,而后以5°为间隔旋转检偏器,并通过光纤光谱仪检测透射的光谱,对检测的偏振光谱通过归一化预处理后,根据不同发芽率稻种检测时偏振角及波长的贡献给出特征偏振角和特征波长,特征偏振角为0°,5°和25°,特征波长为576,620和788 nm,将获取的连续偏振光谱以特征偏振角和特征波长处的透射率为输入,构建稻种发芽率检测模型。分别比较运用偏最小二乘法回归(partial least squares regression,PLSR)、BP神经网络(back propagation neural network,BPNN)、径向基神经网络(radial basis function neural network,RBFNN)三种建模方法建立稻种发芽率检测模型。分别用老化天数为0,2,4,6 d的稻种,在不同的偏振角共测量1 520组实验数据,其中912组数据作为校正集,608组数据作为预测集,建模结果表明三种模型预测精度较高,其中RBFNN模型预测精度最高,其相关系数r为0.976,均方误差RMSE为0.785,平均相对误差MRE为0.85%。表明利用连续偏振光谱技术通过多维度光谱信息能够有效实现稻种发芽率的快速、准确检测。     

法拉第镜旋转角的偏振分束测量法

提出了基于偏振分束法的法拉第镜偏振旋转角的测量方法.利用非偏振分束器改变法拉第镜出射光的方向,偏振分束器将该出射光分为p光和s光,分别测量其光强,应用后续"差除和"信号处理方案消除光源波动的影响,推导出法拉第镜偏振旋转角的理论表达式.分析了起偏器的消光比非0及起偏角误差对输出结果的影响,分别是0.057 29°和-0.100 0°.实验验证了该方法的可行性,重复测量结果为89.68°,均方值为0.014 93.     

量子光通信中偏振光空间姿态传递

通过设计正交偏振光信标器,实现了空间信标姿态的单光路传递,为星地量子光链路的建立提供了条件.通过分析光学器件,尤其是镀膜器件中偏振信标光的传递特性,仿真分析不同入射角、旋转角条件下,出射信标光的偏振模式.分析了由光学器件引入的位相差和不同反射率、透射率对偏振模式的影响.利用琼斯矩阵推导了马吕斯定律在椭圆偏振光入射时的表达形式,建立起测量椭圆偏振光主偏振方位角模型.利用光电位置传感器接收正交信标光,结合光电位置传感器的光点位置检测能力解耦信标光的俯仰角和方位角,利用光电位置传感器的光强探测能力解耦信标光的偏振基矢角,实现了单器件三维信标姿态测量.实验表明,所述系统具有完成信标光三维姿态检测的能力,可用于星地量子光通信、空间信标姿态检测.     

新型内反射旋光光学滤波器研究

基于氯酸钠晶体的各向同性和旋光色散特性,利用线偏振光以Brewster角内反射时P分量反射率为零的特性,研制出一种新型内反射旋光光学滤波器,该光学滤波器仅需采用单个偏振片,即可达到良好的滤波效果.利用Mueller矩阵对该滤波器的滤波特性进行理论分析以及实验测试,结果表明对含有532 nm和632.8 nm谱线的线偏振光,改变起偏器角度即可连续调制出射红、绿光的光强,当起偏器较初始位置旋转过133.36°和173.06°时,绿光和红光分别消光,绿光和红光的隔离度可达10 dB. 关键词： 光学滤波器 各向同性 旋光色散 偏振     

一种液晶透镜盒间隙的测试方法

针对当前液晶透镜盒间隙测试存在的难题, 文中提出采用线偏振干涉法测试方法, 采用光强均匀分布的单色光入射, 检偏器的偏光轴方向与起偏器的偏光轴垂直或者平行, 液晶透镜的液晶取向层的摩擦方向与起偏器偏振轴夹角为45°, 此时干涉条纹亮暗差别最明显. 利用液晶透镜中心保持预倾角不变的透过率以及其他位置透过率最大值来计算液晶透镜的盒间隙, 该方法简单、可靠, 因采用光学手段测试, 其精确度相对较高. 关键词： 液晶透镜 盒间隙 线偏振光干涉 透过率     

用电光采样法测量相对论电子束团长度

 介绍了电光采样法测量电子束束团长度的实验原理和装置,理论分析并模拟计算了被测电子束团库仑场分布、ZnTe晶体的电光效应与束团电场的关系,并利用琼斯矩阵法分析了探测光通过电光晶体时在束团电场作用下的偏振变化、测量信号与束团长度的关系等。分析表明：测量中应使束团库仑场垂直于ZnTe的［001］方向,探测光偏振方向与ZnTe晶体y″轴成45°或者135°夹角,1/4波片快轴与探测光偏振方向夹角应取45°,这时平衡探测器输出信号与束团库仑场Eb成正比。1/4波片的作用是将电光晶体的工作点从非线性段移到线性段,平衡探测的作用是简化信号与Eb的关系,并提高信噪比。为实际测量应用提供参考。     

基于多角度偏振差值曲线的目标识别初探

多角度偏振遥感在目标识别和地物观测中具有广阔的应用前景.从目标地物的偏振探测机理出发,讨论了它们偏振反射光谱的空间特征,以及由反射光的垂直振动分量和平行振动分量构成的偏振差值曲线的变化规律.结果显示:反射光的垂直振动分量与平行振动分量之差R⊥//随着折射率的变化而不同,且均在入射角80°附近达到最大;随着折射率的增加,...     

Manipulation of the overall polarization orientation in the focal volume of high numerical objectives

We propose an approach for tuning the three-dimensional polarization of a focusing subwavelength spot by a high numerical aperture objective. The incident beams are composed of a radially polarized beam, an azimuthally polarized beam, and a linearly polarized beam with three different weighting factors, respectively. A specially designed adjustable amplitude angular selector is also inserted at the back aperture of the objective for tuning the polarization azimuthally. It is shown that any desired overall polarization orientation can be obtained. We calculated the overall polarization orientation in the focal volume. It is found that the polar angle of the overall polarization orientation can be arbitrarily tuned by the combination of a radially polarized beam and a linearly polarized beam with different weighting factors, and the azimuthal angle can be tuned by rotating the orientation of the linearly polarized beam azimuthally.     

Optical activity of a cadmium diphosphide crystal

We have experimentally studied the characteristic features of a laser beam, polarized at angles of ± 45° to the horizontal (vertical), passing through plates of varying thickness cut from a CdP₂ crystal and placed between crossed polarizers, as a function of their angle of rotation relative to the vertical axis. We show that a periodic variation in the intensity is connected with the variation in polarization of the laser beam. We have established that the laser beam remains linearly polarized not only when it passes through the sample along the optic axis, but also when it travels at up to a 17.5° angle to the optic axis. In this case, the specific rotation of the plane of polarization along the optic axis is 68.2 degrees/mm for a thicker plate and 83.3 degrees/mm for a thin plate. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 73, No. 5, pp. 690–693, September–October, 2006.     

Simple system for evaluating retardation of liquid crystal cells using grating type liquid crystal polarization splitters

We propose a unique optical system for measuring the retardation of birefringent films using a pair of liquid crystal (LC) gratings; that is, the examined birefringent films are inserted between two LC gratings. Because the LC grating functions as a polarization beam splitter for circularly polarized light, the proposed system is optically equivalent to the measurement system using a pair of two circular polarizers. First, the polarization splitting performance of the LC grating is discussed. It is found that a sufficiently high voltage (such that the retardation is less than a half wavelength) has to be applied for the almost pure circularly polarized diffracted light. Next, the measurement of the retardation of a homogeneous LC cell as an examined birefringent film was demonstrated using the proposed method. The proposed method is revealed to have the same measurement performance as that of the conventional method using a pair of linear polarizers and has an advantage that there is no need for the optic axis of the test birefringent specimen to be set at a specific angle.     

Two-dimensional birefringence measurement system with a polarization modulator and a rotating analyzer

The measuring system of two-dimensional birefringence distribution with a polarization modulator and a rotating analyzer using a rotating analyzer method is presented. The system simply consists of a laser diode, two polarizers, two quarter wave plates and a CCD camera. Thanks to an imaging system, the mechanism to scan a sample is unnecessary and two-dimensional measurement is possible and easy. The birefringence of retardation and orientation of the optic axis can be determined by the azimuth angle of an elliptically polarized light passing through a sample. The azimuth angle is obtained by applying the phase shifting algorithm to measure the polarization properties; by improving the calculation algorithm, wide range measurement is accomplished. The measurement procedure and a number of results are described.     

光源的偏振态对动态光散射颗粒测量结果的影响

研究了在动态光散射纳米颗粒测量中,光源的偏振态对测量结果的影响。采用了粒径为100nm、体积浓度为0.5%的标准颗粒作为样品,使He-Ne激光通过起偏器得到0°～180°方向的偏振光,测量了散射光强、偏振度和粒径测量值的变化,计算了相应的粒径均值偏差和标准差,并将这一结果与无偏振He-Ne激光入射进行了比较。结果表明,当入射光为线偏振光时,偏振方向垂直于散射面时测量效果最好;另一方面,由于颗粒系散射迭加造成的散射光偏振度降低,使线偏振光源与无偏振光源产生的散射光偏振度无明显差别,证明在测量中可以使用无偏振He-Ne激光代替。     

Effect of polarization on focal depth in high numerical apertures optical systems

The generalized cylindrical vector beam is just a linear combination of radial and azimuthal polarization. For radially polarized light in the focal plane, there are two electric field components, the radial component and z-component whose magnitude increase with the increase of numerical aperture. By contrast, for azimuthally polarized light in the focal plane, there is only one electrical field component in the azimuthal polarization, it is easy to understand the difference between the two polarization effects. In this paper, we demonstrate how this phenomenon can be harnessed to make a properly selected polarization component to achieve high focal depth in high numerical aperture systems. Numerical simulations show that the evolution of the focal shape is very considerable by changing polarization rotation angle of the generalized cylindrical vector beam. And some interesting focal spots and focal split may occur. And if the ratio of radial and azimuthal polarization is set properly by changing the polarization rotation angle, a largest focal depth is achieved. The tunable range of the focal depth is very considerable. The ratio of radial and azimuthal polarization is different in different NA optical system for obtaining the largest focal depth. We will denote a technique of polarization-assisted high focal depth in high numerical aperture systems.     

部分偏振光通过透镜时的偏振像差分析

本文定量推导了轴上物点发出的部分偏振光通过透镜时其偏振度、偏振分量方位角和椭率角与透镜参数和入射光参量间的关系。对已知参数的透镜进行了定量计算，表明处于一定偏振状态的部分偏振光经透镜后其偏振度、偏振分量方位角和椭率角在出射光束截面上呈一定分布，产生偏振像差。给出了部分偏振光基本参量变化的数量级。指出在高精度光学测量中为避免透镜偏振像差影响，应尽可能减小光束半径和发散角。