基于时域小波变换相位提取的三维形貌测量

提出基于时域小波变换的连续振动物体相位提取方法,恢复连续振动物体的瞬时三维形貌。将小波变换用于序列影栅云纹相位分析中,对连续振动物体的序列影栅图像进行处理,利用小波变换的多分辨力特点,对各点的灰度变化进行连续复小波变换,通过提取小波脊所对应的相位,得到各点相对于基准光栅的完整相位调制信息,从而获取运动物体的瞬时三维形貌。利用该方法对连续振动悬臂梁进行了分析,得到连续振动悬臂梁的瞬时速度及瞬时三维形貌,再现了悬臂梁的连续振动过程。为研究动态物体瞬时特性提供了一种新的方法。     

Determination of curvature and twist by digital shearography and wavelet transforms

A new technique based on digital shearography for determining the transient curvature and twist of a continuously deforming object from a series of speckle patterns is presented. The intensity variation of each pixel is analyzed along the time axis by using a complex Morlet wavelet transform. The absolute sign of the phase variation is determined by introduction of a temporal carrier when the speckle patterns are captured by a high-speed camera. A high-quality spatial distribution of the deflection derivative is extracted at any instant without the need for temporal or spatial phase unwrapping. The continuous Haar wavelet transform is subsequently processed as a differentiation operator to reconstruct the instantaneous curvature and twist of a continuously deforming object.     

Statistical searching of deformation phases on wavelet transform maps of fringe patterns

A wavelet transform (WT) analysis is presented to obtain the deformation phases from the fringes with non-uniform carrier frequency, which may appear in the pattern of varied-periodic fringes generated in displacement measurement. Based on the phase maps of the Morlet WT coefficients distributed in a space-scale spectrum, a statistical processing is carried out to search the compacted density of the phase intervals over the scale, and from that the phase modulations related to the object deformation can be determined. Numerical simulation demonstrates the validity of the pattern-processing technique, and the experimental results show the applications to the measurement of the in-plane displacement by the digital speckle pattern interferometry (DSPI) and the measurement of the out-of-plane deflection by the projecting Moiré fringes.     

A numerical spatial carrier for single fringe pattern analysis algorithm

Hilbert transform and continuous wavelet transform are combined to form an algorithm for the analysis of a single fringe pattern with open or closed fringes. Only one recorded fringe pattern is needed to extract the phase information. A second π/2 phase shifted fringe pattern should first be generated from the other using Hilbert transform to superpose numerically the spatial carrier. Several phase extraction techniques are conceived to demodulate fringe patterns. In this paper, the wavelet technique is used to obtain the required phase distribution. The algorithm offers an advantage that it is appropriate when the spatial carrier is impossible to be added experimentally. Finally, a simulation was carried out to validate the algorithm, giving good results.     

自参考光谱相干法的小波变换相位重建

将小波变换法引入光谱相位相干电场重建法的相位重建，从光谱干涉条纹的小波变换中直接 读取条纹相位，消除了传统傅里叶方法滤波过程中产生的相位噪声. 这种方法将有利于超宽 带、单周期超短脉冲的产生，更适用于超短脉冲的评价. 关键词： 超短脉冲 相位重建 小波变换     

一种基于希尔伯特变换实施相移的相位解调算法

相移法因其精度高、运算简单,所以被广泛应用于形貌检测中的相位解调。该方法的弱点是:不仅要采集多幅相移图像,而且不能克服相移器的移相误差。将小波分析与希尔伯特变换结合起来,采用小波分析去除直流背景成分,利用希尔伯特变换方法实现90°相移;利用相移法解调形貌相位,由于是采用软件来实现相移的,因此只需采集一幅变形栅线图。对该方法与传统相移技术进行了模拟比较实验,结果表明,该方法具有较高的精度。     

基于小波变换的解相技术研究

提出一种基于小波变换的频域解相技术。对调制栅线图像进行小波变换,生成被测物体背景图像,两幅图像相减得到相对变形栅线图像,分析基频谱,由于背景成分基本消除,利于有用频带的提取,可以实现大梯度变化曲面和复杂形面的自动轮廓测量。     

Analysis on fringe pattern demodulation by use of 2-D CWT

We discuss the wavelet transform profilometry based on the continuous wavelet transform technique as viewed from frequency analysis. We deduce the expression of one-dimensional (1-D) and two-dimensional (2-D) wavelet transform in frequency domain and analyze their characteristics in the application of demodulating the fringe patterns. We also compare 1-D CWT and 2-D CWT in demodulating the oblique fringe patterns with dual carrier frequency components. When oblique fringe patterns are processed, the direction normal to the grating line and x axis or y axis is not identical. By 1-D CWT, in which wavelet transform is carried out row by row, we cannot obtain the most similarity between local signal and the wavelet functions with different dilation values. While a fan 2-D continuous wavelet transformation can deal with the fringe pattern as a 2-D unit as well as has multi-directions, its advantage is that it can be used to exact the information in the spatial direction. However, its spatial localization ability is not very good, which leads that it is not suitable for demodulating the fringe patterns with high phase variation. Computer simulations and experiments have verified our analysis.     

大剪切电子散斑干涉的载频调制与位移场测量

将电子散斑干涉场的载波调制引入到大剪切电子散斑干涉中,通过对参考物的微小偏转引入载波条纹;利用傅里叶变换法,解调出了变形场的相位,从而实现了物体变形场的精确测量。讨论了大剪切载频的调制机理,理论分析表明,调制条纹的空间频率与参考面偏转的角度成正比;因此,控制参考面的偏转角度可实现不同位移量系统的调制。利用中心加载周边固定圆盘进行了典型实验,实验结果证明在大剪切电子散斑干涉技术中可以通过参考面的旋转高质量地实现电子散斑干涉条纹的调制,求解位移场。该系统具有系统简单,不需要专门引入参考光,条纹质量好等优点。该技术可扩展电子散斑干涉的应用范围,有一定的实际应用价值。     

Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

Spectral phase in a white-light interferogram contains information about the absolute optical path difference (OPD) in the interferometer. Evaluation of spectral phase is therefore important in applications such as profilometry with white light. In spectrally resolved white-light interferometry (SRWLI) the white-light interferogram is spectrally decomposed by a spectrometer in order to determine this phase. Several single-frame techniques in SRWLI have been proposed for the evaluation of the phase including Fourier transform, Hilbert transform, spatial phase shifting, windowed Fourier transform and wavelet transform. In this paper we present a comparative study of these techniques in this application in relation to the temporal phase-shifting technique which is a multi- frame method. Further, we also propose a modified method to remove the influence of source spectrum modulation in Hilbert transform procedure.     

Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier

Recently, a phase evaluation method was proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase change introduced by the deformation is in the range [0,π) rad. This method is based on the evaluation of a correlation coefficient between two speckle interferograms generated by both deformation states of the object. In this paper, we present a novel technique to measure non-monotonous displacements in temporal speckle pattern interferometry using a correlation method without a temporal carrier. In this approach, the sign ambiguity is resolved automatically due to the introduction of a function that determines the correct sign of the displacement between two consecutive speckle interferograms. The rms phase errors introduced by the proposed method are determined using computer-simulated speckle interferograms. An application of the phase retrieval method to process experimental data is also presented.     

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.     

三维电子散斑干涉载频调制及其在柴油机上的应用

将电子散斑干涉场的三维载波调制技术应用到三维物体变形测量中.用水平方向、竖直方向及垂直试件表面的三路相干光分别照明物体，在水平和竖直方向通过控制反射镜的微小偏转引入载波，实现位移场干涉条纹的调制；利用物体的微小偏转实现离面位移场干涉条纹的调制；结合傅里叶变换法，分别解调出变形场的位相，从而实现了物体三维变形场的精确测量.将该技术应用到柴油机油泵的三维位移测量上，成功测量了油泵的三维位移场.     

Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry

We proposed a new method for retrieving the phase from wavelength-scanning interferogram by wavelet transform. We demonstrate, with both theoretical and experimental data, that this method provides a reliable technique for retrieving phase in the wavelength-scanning interferometry. We show that the proposed method by wavelet transform can reconstruct the nonlinear phase better than the conventional Fourier transform and direct spectral phase calculation method by simulation. The patterned thin film is measured to get the thickness and surface profile simultaneously with the developed wavelength-scanning interferometry.     

A fringe carrier technique for unambiguous determination of fringe orders in shearography

Shearography is an interferometric method which measures displacement derivatives. This paper presents a technique which eliminates the ambiguity in shearographic fringe interpretation. The technique is based on generating a carrier fringe pattern. Introduction of the carrier fringes results in the formation of a fringe pattern which has monotonically increasing fringe orders, thus allowing fringe orders to be determined in a straightforward manner and without ambiguity. The phase change due to deformation alone is then obtained by simply subtracting the known undeformed carrier fringe orders from the deformed carrier fringe orders. Elimination of fringe ambiguity has paved a way for automatic data acquisition in shearography.     

小波变换轮廓术在双频光栅条纹中的应用

为了解决非连续物体三维面形测量中所存在的非连续相位解包问题,采用计算机生成的两频率之比为一无理数的电子光栅作为空间载频光栅条纹投影到待测物体表面。另外结合伽博小波变换分析的相位解调原理,在一幅变形双频光栅图像中分析得到两个频率各自所对应的包络相位分布,并且应用钟金钢等所提出的双频条纹查表法进行解包得到确定的调制相位分布。提出的双频光栅-小波变换-查表相位解包法很好地解决了傅里叶变换轮廓术,以及连续相位解包法在非连续物体三维面形测量中所存在的问题。给出了详细完整的理论推导过程、计算机模拟以及实验验证,证实了该方法的可行性。     

Demodulation of a single interferogram based on continuous wavelet transform and phase derivative

A novel method based on continuous wavelet transform (CWT) and guidance of phase derivative is developed to measure the phase of a single fringe pattern which contains closed fringes. Wrapped phase values are retrieved by ridge extraction algorithms based on CWT which has the capability of better noise reduction and thus increases the resolution of measurement significantly. To further reduce the noise, the scales detected by maximum ridge algorithm are filtered iteratively before retrieval of wrapped phase. The proposed method also identifies any ambiguous point in a non-monotonous fringe pattern by directly tracking an inflexion point from an unwrapped phase map without the use of a carrier. The algorithm developed is validated by computer simulation and experimental results. Based on micro interferometry the experimental results for both static and dynamic deformations of a micro structure demonstrate that the proposed method is an effective tool for the analysis of closed fringe patterns and subsequent deformation measurement. However, the proposed technique is limited to measurement of surface which is relatively smooth compared to the mean wavelength of the light source. In addition, prior knowledge of the sign of surface slope is required in cases where a spatial carrier is not available or adaptable.     

Discuss the measuring range of dual-frequency wavelet transform profilometry

We discuss the structure condition and sampling condition of wavelet transform profilometry (WTP) based on dual-frequency fringe pattern in this work. In the mentioned method a grating fringe with dual-frequency components is projected onto an object. And two wavelet ridge lines can be extracted by means of wavelet analysis, from which we can calculate two groups of wrapped phase information. Afterwards the retrieved phase with higher precision can be obtained through phase unwrapping process. However, it should be noted that the spectral aliasing of the deformed fringe pattern must be avoided in order to restore the correct phase information. And the two fringe carrier frequencies have to obey some rules as well. In this paper, the structure condition and sampling condition of the proposed method is deduced from the point of view of frequency analysis. It is proven that there would be no frequency overlapping in the deformed fringe pattern only when both of the two conditions mentioned previously are fulfilled. The results of computer simulations and experiments verify the validity of our theory.     

Determination of interferometer phase distributions by use of wavelets

A new technique for directly extracting phase gradients from two-dimensional (2-D) interferometer fringe data is presented. One finds the gradients by tracking the maximum modulus of the continuous wavelet transform of the fringe data and the phase distribution that is obtained, with a small error, by integration. Problems associated with phase unwrapping are thereby avoided. The technique is compared with standard methods, and excellent agreement is found. In common with Fourier-transform methods, the technique is capable of extracting the full 2-D phase distribution from a single image.