Influence of the sample-probe coupling on the resolution of transmitted near-field optical image

Numerical simulation of photon scanning tunneling microscopy is presented to study the near-field distribution in the vicinity a dielectric surface with one-dimensional sub-wavelength structures. Multiple scattering between the probe tip and the sample has been taken into account implicitly by matching electromagnetic boundary conditions at interfaces. The near-field intensity in transmission mode through two ridges on surface has been modeled in order to analyze the resolution of the system. The effects on the signal by the sample-tip coupling, the polarization of the incident light, and the angle of incidence are investigated. We find that the capability to recognize the feature will be improved when the tip–object interaction is strong.     

Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

An internal reflection mode is introduced for scanning near-field optical microscopy (SNOM) with the tetrahedral tip. A beam of light is coupled into the tip and the light specularly reflected out of the tip is detected as a photosignal for SNOM. An auxiliary STM mode is used to control the distance during the scanning process and to record the topography of the sample simultaneously with the SNOM image. Images were obtained of different metallic samples which show a contrast in the order of 10% of the total reflected photosignal. In images of metallic samples an inverted contrast is consistently obtained compared to images previously obtained of comparable samples in a transmission mode. The contrast shows a pronounced dependence on the polarization of the incident beam with respect to the orientation of the edges of the tip. In the case of gold surfaces, the photosignal as a function of distance between the tip and the surface shows a pronounced peak in the near-field range of 0–20 nm which is tentatively attributed to the excitation of surface plasmons on the gold surface. The pronounced near-field effects and the strong contrast in the near-field images and the resolution well below 50 nm are an indication of a highly efficient coupling of the incident beam to a local excitation of the tip apex which is essential for the function of the tip as a probe for SNOM. Received: 17 May 1999 / Accepted: 18 May 1999 / Published online: 21 October 1999     

Theoretical Analyses on the Resolution of Collection Mode Scanning Near-Field Optical Microscopy

Numerical simulations have been carried out in the framework of waveguide theory to model collection mode scanning near-field optical microscopy (SNOM). The theoretical model includes the optical fiber end and describes the metal coated aperture on the probe tip. The developed formalism goes beyond the existing Bethe-Bouwkamp theories for electromagnetic transmission of subwavelength apertures. The finite coating and optical fiber end are now taken into account. The new features enable us to simulate the near-field probes that are widely used in the collection mode SNOM. The emphases of the numerical analyses have been mainly on the resolution mechanism of the microscopy. Influence on the resolution from important parameters of the probe tips, such as the size of the apertures and the probe-sample distance, is extensively studied. The resolution dependence has been analyzed in the light of the near-field coupling efficiency of the probe tip. An optimum tip size has been found which is balanced between the significant signal transmission and the resolution of the device.     

Mapping an on-chip terahertz antenna by a scanning near-field probe and a fixed field-effect transistor

In the terahertz(THz) regime,the active region for a solid-state detector usually needs to be implemented accurately in the near-field region of an on-chip antenna.Mapping of the near-field strength could allow for rapid verification and optimization of new antenna/detector designs.Here,we report a proof-of-concept experiment in which the field mapping is realized by a scanning metallic probe and a fixed AlGaN/GaN field-effect transistor.Experiment results agree well with the electromagnetic-wave simulations.The results also suggest a field-effect THz detector combined with a probe tip could serve as a high sensitivity THz near-field sensor.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

Fabrication and Evaluation of Silica-based Optical Fiber Probes by Chemical Etching Method

A sensor probe with a microstructure, which is used for near-field scanning optical microscopes, plays an important role in the resolution and detection sensitivity of the microscope system. In this study, we devised a system for sharpening optical fibers, by which we could fabricate tapered tips of silica-based optical fibers reproducibly in a desired shape by controlling the solution temperature, etching time, and etching depth when applying chemical etching techniques using hydrofluoric acid. Furthermore, we evaluated the diameter of the core tip of an optical fiber by measuring the near-field pattern and comparing it with the Gaussian beam pattern of a non-edge-etched optical fiber. A strong correlation between the ratio of the 1/e²-value width of the beam profile of the near-field pattern to that of the Gaussian beam and the diameter of the extreme tip of the core became apparent. © 2005 The Optical Society of Japan     

FABRICATION AND APPLICATION OF NEAR-FIELD OPTICAL FIBRE PROBE

In this paper, the fabrication of a large cone angle near-field optical fibre probe, using the two-step chemical etching method and bent probe, is introduced, and the controlling parameters of the coated Cr－Al film at the probe tip are presented. The scanning electron microscopy images display that the tip diameter of the uncoated large cone angle fibre probe obtained is less than 50nm, the cone angle over 90°, and the diameter of light aperture at the coated probe tip is less than 100nm. The measured results of the optical transmission efficiency for various probe tips show that the uncoated straight optical fibre probe, film-coated straight probe and film-coated bent probe are 3×10^-1, 2×10^-3, and 1×10^-4 times that of the flat fibre probe, respectively. In addition, the force images and near-field optical images of a standard sample are acquired using a large cone angle and film-coated bent probe.     

Measurement of the decay lengths of the near-field signal in tapping mode

In near-field optics, the use of vertical vibration of the probe is of great interest in order to prevent the tip crash, in tapping mode. The optical signal is often obtained through a lock-in amplifier using a feedback on this vertical vibration. Therefore, harmonics of the optical signal are available. The reconstruction of the near-field signal, from these harmonics, enables the knowledge of the vertical variations of the near-field signal, without the use of the slower technique of approach curves or the use of photocounter. In this work, we use this reconstruction to measure the vertical decay lengths of the near-field data with the Prony’s and the simplex methods. We compare both methods and we discuss the results in terms of filtering by the lock-in.     

Role of the probe quadrupole moment in apertureless near-field optical microscopy

A theory of an apertureless scanning near-field optical microscope is developed that takes into account the quadrupole moment of the probe in forming the near field and the scattered wave in the far-field zone. It is shown that the quadrupole moment can lead to a change in the conditions for the resonant coupling of the probe tip with the sample surface, as well as to the appearance of additional resonances in the frequency dependence of the response of a near-field microscope. The theory developed is found to be in good agreement with known experimental data in the region of resonant tip—sample coupling.     

Combined AFM and laser lithography on hydrogen-passivated amorphous silicon

We report a novel combination of AFM lithography and laser direct writing on hydrogen-passivated amorphous silicon surfaces to fabricate combined silicon milli-, micro- and nanostructures. Selective oxidation is performed by focusing a laser beam (λ=458 nm) on a hydrogen-terminated silicon surface, forming the millimetre-size contact pads for connection of nanometre-scale patterns. The nanostructures are made by electric-field-enhanced oxidation using a contact mode AFM equipped with a metal-coated tip. Both techniques are based on selective oxidation of hydrogen-passivated amorphous silicon, where the oxide is used as an etch mask in a single etch step. The lithographic process has also been demonstrated using a reflection mode scanning near-field optical microscope with an uncoated fiber probe.     

A virtual optical probe based on evanescent wave interference

A virtual probe is a novel immaterial tip based on the near-field evanescent wave interference and small aperture diffraction, which can be used in near-field high-density optical data storage, nano-lithography, near-field optical imaging and spectral detection, near-field optical manipulation of nano-scale specimen, etc. In this paper, the formation mechanism of the virtual probe is analysed, the evanescent wave interference discussed theoretically, and the sidelobe suppression by small aperture is simulated by the three-dimensional finite-difference time-domain method. The simulation results of the optical distribution of the near-field virtual probe reveal that the transmission efficiency of the virtual probe is 10²－10⁴ times higher than that of the nano-aperture metal-coated fibre probe widely used in near-field optical systems. The full width at half maximum of the peak, in other words, the size of virtual probe, is constant whatever the distance in a certain range so that the critical nano-separation control in the near-field system can be relaxed. We give an example of the application of the virtual probe in ultrahigh-density optical data storage.     

SETUP AND APPLICATION OF SCANNING NEAR-FIELD OPTICAL MICROSCOPY

The research on the setup and application of scanning near-field optical microscopy (SNOM) performed in our laboratory is reviewed in this report. We have constructed a versatile low temperature scanning near-field optical microscope with the capability of near-field imaging and spectroscopy, operating at liquid nitrogen temperature. A special designed coaxial double lens was used to introduce the illumination beam through a 200μm fiber; the detected optical signal was transmitted via a fiber tip to an avalanche photon detector. The performance test shows the stability of the new design. The shear force image and optical image of a standard sample are shown. A system of SNOM working at room temperature and atmosphere was used to characterize semiconductors and bio-molecular samples. It revealed the unique features of semiconductor microdisks in the near-field that is significantly different from that of far-field. The effects of different geographic microstructures on the near-field light distribution of InGaP, GaN, and InGaN multi-quantum-well microdisk were observed.     

Apertureless near-field laser nanotechnology

We consider apertureless near-field optics that provides subwavelength resolution. We study the enhancement of the electromagnetic field near nanospheres and under the tip of a scanning probe microscope using the finite difference time-domain (FDTD) method. We discuss the mechanisms of field enhancement connected with the system geometry (“lightning rod effect”) and resonance excitation of local plasmon eigenmodes for different materials of the tip and various geometrical parameters of the system. We describe the possible applications in nano-optics and nanotechnology. We present the experimental achievements in apertureless near-field nanolithography.     

Light focusing by slot Fabry-Perot photonic crystal nanoresonator on scanning tip

We numerically investigate the propagation of light through the photonic crystal (PhC) waveguide on low refraction index material for near-field light focusing at the visible wavelength (635 nm) by incorporating a center air slot and Fabry-Perot resonator on the scanning tip. Perturbations by water and substrate refraction index changes of the PhC are analyzed by the finite-difference time-domain method to show minimal impact on light confinement and throughput. Such a total dielectric probe tip design has great potential to complement the current widely used metal-coated optical-fiber-based light confinement probe.     

基于光导微探针的近场/远场可扫描太赫兹光谱技术

太赫兹技术已经成为涉及公共安全、军事国防和国民经济等国家核心利益的前沿研究领域.以往太赫兹测量技术中通常以远场测量为主,如常用的太赫兹时域光谱仪.近年来太赫兹近场技术得到了迅猛的发展,特别是基于光导天线的探针技术的发展,为可扫描的太赫兹近场测量提供了可能.本文详细报道了我们近期在可扫描太赫兹近场光谱仪研究中的进展.采用光纤耦合的光导微探针实现了方便灵活的太赫兹近场/远场三维扫描,并同时获得振幅和相位信息.该系统将有可能广泛应用于人工微结构、石墨烯、表面等离子激元、波导传输、近场成像、生物样品检测、芯片检测等研究领域.     

Communication modes in scalar diffraction

The communication modes are a useful concept in studies of optical resolution, wave propagation, and image synthesis. We present an overview of earlier results on the communication modes in scalar diffraction theory. Besides the general theory, the modes are reviewed for the far-field and Fresnel regimes, and new eigenequations are derived for wide-angle diffraction. We prove a conjugate relationship between the transmitting and receiving modes in a general symmetric system. We also suggest an approximate method for far-field and Fresnel domain propagation, in which propagation amounts to a rotation of each mode in the complex plane. The main focus is on the near-field communication modes, where we present numerical examples of the modes and coupling strengths for a near-field geometry with a sub-wavelength size receiving domain. These results provide insights, for example, into the understanding of near-field scanning probe techniques.     

Sub-wavelength probing and modification of photonic crystal nano-cavities

In this work we present a sizeable and reversible spectral tuning of the resonances of a two-dimensional photonic crystal nano-cavity by exploiting the introduction of a sub-wavelength size glass tip. The comparison between experimental near-field data and results of numerical calculations shows that the spectral shift induced by the tip is proportional to the local electric field intensity of the cavity mode. This observation proves that the electromagnetic local density of states in a microcavity can be directly measured by mapping the tip-induced spectral shift with a scanning near-field optical microscope. Moreover, a non-linear control on the cavity resonance is obtained by exploiting the local heating induced by near-field laser excitation at different excitation powers. The temperature gradient due to the optical absorption results in an index of refraction gradient which modifies the dielectric surroundings of the cavity and shifts the optical modes.     

近场光学虚拟光探针的数值分析

虚拟光探针是基于近场光学隐失场干涉原理产生的一种非实体探针，可以应用于近场光学超高密度存储、纳米光刻、近场光学成像、光谱探测、纳米样品的近场光学操作等领域。本研究采用三维时间域有限差分（FDTD）方法对近场光学虚拟光探针的光场分布特性进行了数值模拟计算和比较，分析了孔的形状、大小及偏振态等因素对虚拟光探针光场分布的影响，研究结果表明虚拟光探针的通光效率较普通的纳米孔径光纤探针提高10^2-10^4倍；其光场分布的中间峰的半峰全宽（即虚拟光探针的尺寸）在一定距离范围内基本保持不变，从而可以解决近场光学系统中纳米间距控制的难题，避免光学头与介质的磁撞。优化虚拟光探针的设计参量能有效的抑制虚拟光探针中的旁瓣。文章还给出了应用虚拟探针实现高密度光存储的原理方案。     

High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.