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Vacancies ordered in screw form (VOSF) and layered indium selenide thin film deposition by laser back ablation
Authors:Kenneth M Beck  William R Wiley  Fumio Ohuchi
Institution:a Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, POB 999, K8-8, Richland, WA 99352, United States
b Dept. of Chemistry, University of Washington, Seattle, WA 98195, United States
c Dept. of Material Science and Engineering, University of Washington, Seattle, WA 98195, United States
Abstract:Indium selenide thin films are important due to their applications in non-volatile memory and solar cells. In this work, we present an initial study of a new application of deposition-site selective laser back ablation (LBA) for making thin films of In2Se3. Invacuo annealing and subsequent characterization of the films by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) indicate that control of substrate temperature during deposition and post-deposition annealing temperature is critical in determining the phase and composition of the films. The initial laser fluence and target film thickness determine the amount of material deposited onto the substrate.
Keywords:81  15  Fg  79  20  Ds  42  60  Jf  68  55  Nq  68  55  ag  64  70  kg
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