SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles

Four simple methods are evaluated to determine their accuracies for establishing the interface location in secondary ion mass spectrometry intensity depth profiles of organic layers where matrix effects have not been measured. Accurate location requires the separate measurement of each ion's matrix factor. This is often not possible, and so estimates using matrix-less methods are required. Six pure organic material interfaces are measured using many secondary ions to compare their locations from the four methods with those from full evaluation with matrix terms. For different secondary ions, matrix effects cause the apparent interface positions to vary over 20 nm. The shifts in the intensity profiles on going from a layer of P into a layer of Q are in the opposite direction to that for going from Q into P, so doubling layer thickness errors. The four methods are as follows: M1, use of the median interface position in the intensity profiles for the five lightest ions for 15 ≤ m/z ≤ 150; M2, extrapolation of the position for each ion to m/z = 0 for ions with m/z ≤ 150; M3, as M2 but for m/z ≤ 300; and M4, the extreme positions for all m/z ≤ 100. Comparison with the location using matrix terms shows their ranking, from best to worst, to be M4, M3, M1, and M2 with average errors of 10%, 12%, 14%, and 17%, respectively, of the profile interface full widths at half maximum. Use of pseudo-molecular ions is very much poorer, exceeding 50%, and should be avoided.     

星载海洋激光雷达最佳工作波长分析

星载激光雷达是实现海洋垂直剖面探测的有效工具,也是目前迫切需求的海洋光学遥感手段。对星载海洋激光雷达的波长参数进行评估对保证探测有效性具有重要意义。本文从探测深度和信噪比两方面分析了星载海洋激光雷达探测全球海洋的最佳波长。利用MODIS 10个波段的水体光学特性数据,估算全球海水探测深度及相应的最优波长;并根据太阳夫琅禾费暗线特性,对信号信噪比进行优化。结果表明:在探测深度方面,最优探测波长在488 nm波段的海洋占全球海洋面积的70%左右,并且全球95%以上的海域在488 nm波段的探测深度优于0.8倍的真光层深度;在信噪比方面,相对于488 nm波段,486.134 nm夫琅禾费暗线处采用0.1 nm带宽的滤光片可以将背景光强度降低70%,相应地回波信噪比整体提升了约5.0%。就全球海洋探测来说,使用486.134 nm作为探测波长可以提高探测深度,有效抑制太阳背景光,提高信噪比,因此,486.134 nm是星载海洋激光雷达的最佳工作波长。     

皮肤组织容积脉搏波400~1000 nm光谱特性仿真研究

根据皮肤组织解剖结构特性建立了六层层状模型,并给出了皮肤组织各层的特性参数;考虑了氧合血红蛋白和还原血红蛋白的吸收特性,依据皮肤组织各层的水、血、脂肪、血氧饱和度含量以及血管大小给出了皮肤组织各层的光谱吸收系数;对不同波长散射系数做了适当简化,给出了皮肤组织各层的光谱散射系数。利用蒙特卡罗方法仿真血管组织在收缩与舒张两种状态下, 400~1 000 nm波长光在皮肤组织多层模型中的传输过程,并通过统计大量光子的分布特性,获得了皮肤组织光谱反射系数,并利用模拟所得的两种状态下的反射系数计算得到了光谱容积脉搏波幅度。仿真结果表明,当入射光强一定时,绿光的容积脉搏波幅度优于红光和蓝光。通过计算不同波长光沿皮肤组织深度方向光能流率衰减为1/e时对应的皮肤组织深度,获得了皮肤组织光谱穿透深度。结果显示,血管舒张状态下蓝光和绿光的穿透深度较小,蓝光大部分只能达到表皮层,绿光能到达微循环层,红光可直达真皮层。考虑到光在皮肤组织中传播包含了一个从收缩到舒张的动态过程,基于此,根据穿透深度定义了脉搏波信号产生深度,利用血管舒张与收缩两种不同状态下的穿透深度计算得到了光谱产生深度。结果表明,不同波长光产生深度大于其穿透深度,蓝光产生深度较浅,且其受到的血液吸收调制较小,因而其获得的脉搏信号易受噪声干扰;红光的容积脉搏波产生深度较大,但是相比于绿光其受血液吸收调制较小,且绿光产生深度足够达到真皮血管层,因而红光容积脉搏波的幅度小于绿光。上述仿真结果明确了皮肤组织部分光谱特性,为皮肤组织多光谱容积脉搏波的精确获取及其他相关研究提供了一定的理论基础。     

Study of water uptake in poly(ether ether ketone) irradiated by MeV O+ and Au+ ions

Poly(ether ether ketone) (PEEK) was irradiated with 4?MeV O⁺ and 5 and 10?MeV Au⁺ ions to the fluences from 10¹² to 10^14?cm^?2 and then treated in 5 M/l water solution of LiCl for one month at room temperature. After drying and removal of LiCl surface contamination, the depth distribution of LiCl embeded in PEEK was measured by the neutron depth profilig method (NDP) sensitive to ⁶Li isotope. Embeded LiCl is believed to map distribution of water diffusing into PEEK interior. The results show that the PEEK irradiated to the fluences above 1.10¹³cm^?2 is prone to water penetration to the depths of few microns. On the pristine PEEK and that irradiated to lower ion fluences only a surface Li contamination is observed.     

FT-IR surface analysis of poly [(4-hydroxybenzoic)-ran-(2-hydroxy-6-naphthoic acid)] fiber – A short review

Instrumental techniques such as Fourier Transform Infrared Spectroscopy (FT-IR) constitute well-studied methodologies for polymer characterization, including polymeric fibers. However, a relatively short number of scientific publications involve the characterization of commercial Poly [(4-hydroxybenzoic)-ran-(2-hydroxy-6-naphthoic acid)] (Vectran™) fiber and its surface species. The majority of the published infrared studies uses the medium infrared region (MIR) associated to the Attenuated total reflection (ATR) method. In this scenario, this short review addresses the characteristics of Vectran™ fiber, sample depth data of each FT-IR spectrum mode, reflection and photo-acoustic spectroscopy (PAS), including near infrared (NIR) analysis. This paper addresses also researches on the characterization of Vectran™ by several FT-IR analysis conditions aiming to contribute to future studies. This brief review deals with methodologies developed in the last decade and published by several scientific research groups, emphasizing studies conducted in the last five years. A critical assessment and trends are also included.     

Behavior and process of background signal formation of hydrogen,carbon, nitrogen,and oxygen in silicon wafers during depth profiling using dual-beam TOF-SIMS

The behavior and mechanism of background signals during depth profiling of atmospheric elements using dual-beam time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been experimentally investigated for silicon wafers. The background signals of atmospheric elements were found to be inversely proportional to the sputtering rate. Most of the background signals are largely attributable to the accumulation of components through adsorption and ion bombardment in the pre-equilibrium state. On the other hand, the contribution of real-time adsorption during the instant after the last sputtering in the equilibrium state is negligible under the present experimental conditions. H₂O is dominant in the background formation process of hydrogen and oxygen, which is supported by the higher adsorption coefficients. The background levels of carbon and nitrogen are lower than those of hydrogen and oxygen. Furthermore, the background signal of carbon with respect to the sputtering rate shows a different trend than the other elements. This could be attributed to accumulation in the pre-equilibrium state. These results indicate that the background levels can be lowered close to those of dynamic-SIMS by using an extremely high sputtering rate in dual-beam TOF-SIMS.     

Activation-induced layered structure in NiCoAl by atomic modulation for energy storage application

The surface activation of alloys favors their electrochemical interactions, ion diffusivity, and the rapid kinetics of ions and electrons, leading to the formation of self-supported layered double hydroxides (LDHs) in them. However, the formation of LDHs at different depths in the alloy upon activation, their electronic/atomic structures, and their electrochemical charge storage mechanism, have not been thoroughly explored. Herein, Ni ion-substituted CoAl alloys are prepared by arc melting and activated by KOH electrolyte, which is responsible for the modulation of the atomic configuration as confirmed by XRD. Raman depth mapping demonstrates how the LDHs vary with depth upon activation and that the octahedral and tetrahedral symmetry sites of CoO and Co₃O₄ are responsible for the formation of the layered structures of CoOOH and Co(OH)₂, respectively. The activated Ni₁₀Co₈₅Al₅ has a superior volumetric capacitance of 4.15 F/cm³ at 0.5 mA/g, which is 38.6 times that of an unactivated one, and excellent cyclic stability up to 5000 cycles, and a voltage of 0.54 V generated from a fabricated supercapacitor cell. X-ray Absorption Spectroscopy (XAS) analysis indicates greater charge transfer by Co than by Ni and the modulation of the local atomic structures facilitates electrochemical charge storage in Ni₁₀Co₈₅Al₅. This work presents an easy route for the development of advanced LDHs, and the mechanism of electrochemical charge storage in them.     

Fabrication and characteristics of self‐aggregation nanoparticles used for conformance control treatment

In order to alleviate the contradiction between injectability of the profile control agent and its profile control performance, a novel core‐shell heterogeneous structure colloidal particles (CSA) were synthesized, and the mechanism of self‐aggregation plugging was proposed. Cross‐linking inside the nanoparticles and chain‐growth polymerization via capturing acrylamide in the aqueous phase result in the formation of core‐shell heterogeneous structures as proved by TEM observation and XPS analysis. Moreover, CSA nanoparticles exhibit good hydrophilic properties, outstanding thermal stability and limited expansion capacity. Effects of different metal cations and surface group on the self‐aggregation time of CSA nanoparticles were systematically studied. Results showed that divalent cations contributed to more significant aggregation of CSA nanoparticles in comparison to monovalent cations. The increasing cations concentration and valency decreased the thickness of electric double layer, which lead to a decrease in the zeta potential. Core flooding test shows that the injection of nanoparticles which diameter is much smaller that of pore‐throats into the target reservoir can not only successfully enter the depth of porous media, but also effectively block the high permeability areas by the formation of self‐aggregation particle clusters. This study provides a new method for the equilibrium between nanoparticles injectivity and in‐depth profile control of nanoparticles.     

SIMS depth profiling of ‘frozen’ samples: in search of ultimate depth resolution regime

We have performed secondary ion mass spectrometry depth profiling analysis of III–V based hetero‐structures at different target temperatures and found that both the surface segregation and surface roughness caused by ion sputtering can be radically reduced if the sample temperature is lowered to ?150 °C. The depth profiling of ‘frozen’ samples can be a good alternative to sample rotation and oxygen flooding used for ultra‐low‐energy depth profiling of compound semiconductors. Copyright © 2016 John Wiley & Sons, Ltd.     

Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces

Secondary ion mass spectrometry (SIMS) relies on the fact that surface particles ejected from a solid surface are ionized under ion bombardment. By comparing the signal of molecular secondary ions desorbed from an organic film with that of the corresponding sputtered neutral precursor molecules, we investigate the variation of the molecular ionization probability when depth profiling through the film to the substrate interface. As a result, we find notable variations of the ionization probability both at the original surface and in the interface region, leading to a strong distortion of the measured SIMS depth profile. The experiments show that the effect can act in two ways, leading either to an apparent broadening or to an artificial sharpening of the observed film‐substrate transition. As a consequence, we conclude that care must be taken when assessing interface location, width, or depth resolution from a molecular SIMS depth profile.