An Atomic Force Microscopy Investigation of the Tracks Made by C1^＋－C4^＋ Bombardment on CR－39 Detectors

Carbon micro-clusters are accelerated by an HI-13 tandem accelerator. The plastic nuclear track detectors CR-39are irradiated by C1-C4 beams from the HI-13 tandem accelerator and the tracks in CR-39 are studied using anatomic force microscope (AFM). The depths and diameters of C1-C4 tracks are measured for the first time in ananometre scale. An enhancement of the energy loss is obtained for carbon clusters related to single carbon ionswith the same velocity. The results show that the AFM observation is very useful in the quantitative analysis ofclusters in the track detector CR-39.     

表面高分辨弹性反冲探测分析

在中国原子能科学研究院 HI- 1 3串列加速器上建立了用 Q3D磁谱仪动量分析和ΔE- E粒子分辨对材料表面进行高分辨的弹性反冲探测分析技术 .用 1 0 0 Me V12 7I对 C/Li F多层样品的深度分布分析表明 ,表面分辨达到 1 .2 nm.所建立的ΔE(气体 ) - E(半导体 )望远镜探测器可同时分析从轻至中重的所有元素 .实测了新光电材料 Ga N,La2 Sr Cu O4 超导膜和新超硬材料 C3N4 (Si)等样品. High resolution depth profiling technique with elastic recoil detection analysis has been developed at the HI 13 tandem accelerator of CIAE. A depth resolution of 1.2 nm was achieved at the surface of the samples with the Q3D magnetic spectrometer and the focal plane detector. From light to medium heavy elements were simultaneous analyzed with a small Δ E E telescope. The method was applied to depth profile analysis of C/LiF multilayers, La 2SrCuO 4 superconductor and GaN foil samples.     

α-Si1-xCx:H薄膜材料的弹性反冲探测分析

介绍在中国原子能科学研究院HI-13串列加速器上，对α-Si1-xCx:H薄膜样品进行弹性反冲探测分析的方法和结果．用该加速器提供的高品质^127Ⅰ束流轰击α-Si1-xCx:H薄膜材料样品，用△E(gas)一E(PSD)望远镜探测器，在前角区(30。角)测量从该样品中反冲的各元素的能谱．然后用离子束分析(IBA)程序SIMNRA对能谱进行拟合，得到样品中H，C和Si的比分及深度分布．Elastic recoil detection analysis of α-Si_(1-x)C_(x)∶H foils has been performed at the HI-13 tandem accelerator of CIAE. High quality~(127)I beam bombards the target of α -Si_(1-x)C_(x)∶H_( ) thin film. A ΔE(gas)-(E(PSD)) telescope was used to measure the energy spectra of all elements recoiled from the samples at the angle of 30° in laboratory system. Components of H, C and Si and the profiles were obtained by simulation of the energy spectra using the program SIMNRA calculation.     

Atomic Force Microscopy Measurement of DNA Fragment Induced by Heavy Ions

Choosing ^7 Li and ^12C heavy ions respectively with different linear energy transfer (LET) values, purified plasmid DNA samples in aqueous solution are irradiated with various doses. The atomic force microscopy (AFM) is used for analysis of DNA fragments induced by both the kinds of heavy ions. There is a change of three forms of DNA, i.e. supercoiled, open circular and linear form, as the dose is observed. The distribution function of DNA fragment length is obtained for the first time and fitted with the Tsallis entropy statistical theory. The result indicates that AFM is a useful tool for analysis of the short fragment of DNA, high-LET heavy ion radiation induces DNA double strand breaks (DSBs) more effectively, and the distributions of the DSBs are more local and dense in comparison with low-LET radiation.     

16O+94Zr和16O+116Sn的弹性散射角分布测量

用北京Q3D磁谱仪及其重离子焦面探测器系统测量了两个体系的14个弹性散射角分布,即¹⁶O+⁹⁴Zr体系在52,57,59,62,72,82和92MeV 7个能量点及¹⁶O+¹¹⁶Sn体系在57,59,62,67,72,82和92MeV 7个能量点的弹性散射角分布.用耦合道理论的ECIS计算程序拟合数据,初步观察到了“阈反常”现象.     

18O+148Nd的准弹性碰撞研究和耦合道分析

用Q3D磁谱仪及其焦面探测器系统,在90.72MeV处测量了¹⁸O+¹⁴⁸Nd的弹性散射和非弹性散射角分布,利用DWBA和耦合反应道计算程序FRESCO,对实验结果进行了拟合.在对弹性散射分析中,引入极化势的DWBA计算与耦合道计算有类似的结果.讨论了非弹性散射激发过程中的核–库仑激发的相干效应,得出了描述相干强度的近似因子.     

北京HI-13串列加速器上单粒子效应辐射装置简介

在北京HI-13串列加速器上建立了微电子器件单粒子效应地面模拟辐照试验装置. 利用Q3D磁谱仪的高分辨特性和散焦特性, 获得了强度均匀分布、注量率可调的单能重离子束流, 开展了大量星用器件抗单粒子效应性能评估试验研究. 为了深入研究单粒子效应机制, 采用针孔准直技术, 建立了重离子微束单粒子效应辐射装置, 获得了最小束点尺度为2.3μm×3.5μm的重离子微束.     

7Li和12C离子致DNA链断裂的研究

选用HI-13串列加速器产生的不同传能线密度的⁷Li和¹²C重离子,以不同的剂量对纯化的质粒DNA水溶液进行了辐照.利用原子力显微镜对这两种重离子诱发的DNA损伤进行了纳米水平的结构分析,并用ScionImage分析软件完成了DNA碎片长度的测量.得到了DNA分子超螺旋、开环和线性三种形态随剂量的变化情况以及DNA碎片长度的分布函数,并用Tsallis熵统计理论对实验结果进行了拟合.     

高分辨的弹性反冲探测分析技术

在中国原子能科学研究院HI－13串列加速器上建立了一套高分辨的弹性反冲探测分析技术,用高质量的127I重离子束轰击薄膜或块材靶样品,利用Q3D磁谱仪及其焦面探测器和纵向型双向型双电离室ΔE－E望远镜探测器两套探测系统,在前角区测量了靶中各种元素的反冲能谱,利用卢瑟福散射截离子在靶材料中的阻止本领,将能谱转换成元素的深度分布,利用Q3D磁谱仪系统,对C和H等轻元素的分析得到纳米级的深度分频谱,用ΔE－E望远镜探测器可同时得到靶材料上从轻至中重各种元素的深度分布,其深度分辨率达0－30nm。     

α-Si_(1-x)C_x∶H薄膜材料的弹性反冲探测分析

介绍在中国原子能科学研究院HI 13串列加速器上,对α Si1-xCx∶H薄膜样品进行弹性反冲探测分析的方法和结果.用该加速器提供的高品质127I束流轰击α Si1-xCx∶H薄膜材料样品,用ΔE(gas) E(PSD)望远镜探测器,在前角区(30°角)测量从该样品中反冲的各元素的能谱.然后用离子束分析(IBA)程序SIMNRA对能谱进行拟合,得到样品中H,C和Si的比分及深度分布.