Y-Ba-Cu-O多相超导材料显微结构的研究

用透射电子显微镜观察研究了Y-Ba-Cu-O 超导材料的显微结构。高分辨电子显微术(HREM)及电子衍射图(EDP)分析表明,在这种材料中存在三种相,分别用A、B、C来表示。A相的晶体结构为超导相Ba_2YCu_3O_7,HREM结构象进一步证实了这种结构中金属原子的排列方式,而且还发现在A相中有微畴及层错等缺陷。B相具有简单正交晶体结构,其晶格常数为:α=0.71nm,b=0.555nm,c=1.195nm。C相为残余的Y_2O_3相。X-射线能谱(EDS)显微分析表明,比之于A相,B相中Y/Cu较高,而Ba/Cu较低。B、C 相的存在与原始成份配比有直接关系。初步认为,这种材料的超导性主要由A相所决定。     

Quantitative HRTEM and its application in the study of oxide materials

On the basis of a state-of-the-art aberration-corrected transmission electron microscope, the spherical aberration coefficient CSof the objective lens can be tuned to either a positive or a negative value. The use of a negative value of CS combined with an overfocus setting of the objective lens leads to the development of the negative CSimaging(NCSI) technique. Images obtained using the NCSI technique show superior contrast and signal intensity at atomic column positions than the corresponding positive CSimages, especially for weakly scattering oxygen columns that are in close proximity to strongly scattering cation columns in oxides. Based on the images obtained under the NCSI condition, quantification of the image contrast allows measurements of the atom positions with a precision of a few picometers and the local chemistry on atomic scale. In the present review, we discuss firstly the benefits of the NCSI technique in studies of oxide materials,and then show a procedure for quantitative analysis of the image based on the absolute value of contrast. In the last part,examples are given for the application of the quantitative high-resolution transmission electron microscopy(HRTEM) to the study of electric dipoles of oxide ferroelectrics and atomic-scale chemistry of interfaces.     

基于YOLOv3框架的高分辨电镜图像原子峰位置检测

高分辨电镜图像中原子峰位置的检测具有十分重要的现实意义,通过精确定量化原子峰位置可以分析物质在微观尺度上的结构形变、电极化矢量分布等重要信息.近年来深度学习技术在图像目标检测领域取得了巨大突破,这一技术可用在高分辨电镜图像处理上,因为原子位置的检测可以看作是一个目标检测问题.本文利用先进的机器学习方法,通过制作高质量原子图像样本集,使用YOLOv3目标识别框架对原子图像进行自动检测,达到预期效果,实现了深度学习技术在高分辨电镜图像处理领域的应用.该方法的运用有望突破自动处理动态、大量电镜图片的瓶颈问题.