Absorption Related to Electrochromism in Cubic Boron Nitride Single Crystals

A unusual electrochromism is observed in amber cubic boron nitride （cBN） single crystals when breakdown possibly related to impurities and defects occurs. The electrochromism induces an abrupt increase in the absorption coefficient of the cBN crystals within the visible and infrared region. The change of the absorption coefficient of cBN crystal can be increased linearly by raising the current after the electrochromism occurs, whereas it is irrelevant to the polarization of the incident light. The absorption related to the electrochromism in the cBN single crystal has potential applications in designing and manufacturing electro-optical modulators, optical switches, and other optoelectric devices.     

用电调制反射光谱的方法确定能带中临界点的位置

本文用通常的仪器和简单的方法,测量了半导体材料的电调制反射光谱,从而确定出能带中临界点的位置。其特点是把半导体二极管作为光电倍增管的负载以自动实现交、直流两种讯号相除的方法,测量了反射的相对调制(ΔR)/(R),并给出了由测量过程本身自洽地确定二极管的有效动态电阻区的方法。     

Quadratic nonlinear response to 1.56-μm continuous wave laser in semi-insulating GaAs

The nonlinear photoresponse to a 1.56μm infrared continuous wave laser in semi-insulating （SI） galliu- marsenide （GaAs） is examined. The double-frequency absorption （DFA） is responsible for the nonlinear photoresponse based on the quadratic dependence of the photocurrent separately on the coupled optical power and bias voltage. The electric field-induced DFA remarkably affects the native DFA in SI GaAs. The surface electric field or the surface band-bending of SI GaAs significantly affects the magnitude variation of the Dhotocurrent and dark current     

Experimentally distinguishing electro-optic effects in silicon

Different electro-optic effects, such as Kerr effect, Pockels effect induced by the electric field or strain, and plasma dispersion effect exist in silicon. Experimentally distinguishing these effects is necessary for designing silicon-based electro-optic devices. According to their different polarization dependencies and frequency responses, these effects are measured and distinguished successfully via a transverse electro-optic modulation experiment based on the near-intrinsic silicon sample. The results indicate that Pockels effect induced by the electric field or strain is primary among these effects in the near-intrinsic silicon sample.     

立方氮化硼单晶紫外吸收光谱的研究

对于在高温、高压下合成的人工立方氮化硼(cBN)片状单晶进行了紫外吸收光谱和第一性原理的能带结构研究。实验中采用了UV WINLAB光谱分析仪,数据分析由MOLECULAR SPECTROSCOPY软件进行拟合运算,通过特殊的石英夹具对样品的测试表明cBN的紫外吸收波长限为198 nm,带隙为6.26 eV。结合第一性原理计算的cBN的能带结构和电子态密度的计算,可以证实导致紫外光吸收的过程是价带电子吸收光子到导带的间接跃迁。文章实验结果与目前报道的cBN能带结构中禁带宽度的吻合较好,表明cBN具有良好的紫外特性,是一种具有发展前景的紫外光电和高温半导体器件材料。     

砷化镓高速集成电路内部电信号的光探针直接取样

本文介绍了电光取样技术原理报道了砷化镓高速集成电路内部电信号在片直接电光取样测量系统,它的时间分辨率优于20ps,空间分辨率优于3μm.通过对砷化镓共面波导的测量证实该系统可以对砷化镓高速集成电路内部电信号进行在片直接电光取样测量。     

Measurement of third-order nonlinear optical susceptibility of synthetic diamonds

Diamonds are wide-gap semiconductors possessing excellent physical and chemical properties;thus,they are regarded as very appropriate materials for optoelectronic devices.Based on the Kerr effect,we introduce a simple and feasible method for measuring the third-order nonlinear optical susceptibility of synthetic diamonds.In the experiments,synthetic type I diamond samples and transverse electro-optic modulation systems are utilized.As for the laser with the wavelength of 650 nm,the third-order susceptibility and Kerr coefficient of the diamond samples are obtained at χ(3)1212= 2.17 × 10-23 m2/V2 and S44 = 1.93 × 10-23 m2/V2,respectively.     

Physical mechanism of two-photon response in semi-insulating GaAs

The physical mechanism of two-photon response （TPR） in semi-insulating GaAs is studied. The measured photocurrent generated from the fabricated hemispherical GaAs sample responding to 1.3μm continuous wave laser shows a quadratic dependence on the coupled optical power and no saturation with the bias. The angular dependence of the photocurrent on the azimuth is in agreement with the anisotropy of double-frequency absorption （DFA） in GaAs single crystals. These results demonstrate DFA is the dominant mechanism of TPR in GaAs.     

亚微米外部电光检测技术

将固浸透镜技术与电光检测技术相结合，建立了具有亚微米空间分辨率的外部电光检测系统，通过使用GaAs半球作外部电光探头，用数值孔径为0.3的显微物镜对波长为1.3μm的探测光束进行聚焦，得到了半峰全宽直径为0.7μm的聚焦光斑，成功测量了微带线上10kHz的正弦波信号，验证了系统的线性响应特性，并得到了6mV/√Hz的电压灵敏度。     

微小尺寸立方氮化硼晶体蓝紫光发射光谱的测量与分析

对于微小尺寸的N型宽禁带立方氮化硼(CBN)半导体晶体,在施加恒稳电场的情况下,观察到电致发光现象。通过置CBN单晶样品于光栅单色仪抛物面反射镜焦点的方法,对于CBN的蓝紫光辐射获得了测试系统的最大入射光通量和理想的信噪比。在350～450 nm波长范围内,CBN加上4.7×106 V·cm-1恒稳电场条件下,测量出立方氮化硼的蓝紫光发射光谱。同时,结合基于第一性原理的GGA方法计算出的立方氮化硼能带结构和电子态密度,以及测量得到的非线性j-E关系和电击穿特性,讨论了发光机理。提出了在雪崩击穿前的缺陷偶极子极化和击穿后,产生大量的激发态电子,电子在Γ能谷和X能谷间迁移的发光机制。