排序方式: 共有6条查询结果,搜索用时 8 毫秒
1
1.
A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction (SAXRD). Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope (AFM). Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory (NSRL). Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity. 相似文献
2.
采用共沉淀法制备了高钛含量的复合氧化物TiO2/SiO2.用BET、XRD、FT-IR和正胺吸附等分析手段,研究了煅烧温度对TiO2/SiO2表面酸量的影响.研究发现,随着煅烧温度的升高,TiO2/SiO2表面羟基密度、比表面积逐渐减少,TiO2晶粒尺寸变大,造成TiO2/SiO2表面酸量降低.当煅烧温度达到600℃到800℃之间,表面酸量基本不再改变. 相似文献
3.
4.
5.
6.
1