Experimental study of surface crystallization on integrated circuit chips

A surface crystallization phenomenon on bonding pads and wires of integrated circuit chip is reported in this paper. Through a lot of experiments, an unknown failure effect caused by mixed crystalline matter is revealed, whereas non-plasma fluorine contamination cannot cause the failure of bonding pads. By experiments combined with infrared spectroscopy analysis, the surface crystallization effect is studied. The conclusion of the study can provide the guidance for IC fabrication, modelling and analysis.     

无碰撞空间等离子体中的Kelvin-Helmholtz不稳定性

本文将无碰撞等离子体的宏观方程和带电粒子的引导中心近似相结合,发展了一种漂移动力学(DK)方法,导出了无碰撞等离子体低频MHD波的色散万程,进而研究了由宏观速度跃变引起的K-H不稳定性。计算表明,在无碰撞等离子体中温度各自异性对K-H不稳定性的激发有重要的影响;波-粒子作用可加热等离子体,降低增长率,但不能使不稳定性窒息。此外还比较了DK近似和传统的MHD近似下K-H不稳定波的特性。