Dynamics and thermodynamics of tetragonal zirconia determined by 111In/Cd TDPAC

For several years this research group has been using ¹¹¹In/Cd TDPAC to study oxygen vacancies in pure and lightly doped zirconia powders at temperatures up to 1400°C. This paper includes a brief survey of important results from those studies and some recent results. In particular, our new measurement showing negligible relaxation due to vacancy hopping above 600°C provides a major breakthrough in our ability to analyze PAC data and to determine accurately hopping and trapping rates and enthalpies for vacancies in tetragonal zirconia. This revised version was published online in August 2006 with corrections to the Cover Date.     

A curved image‐plate detector system for high‐resolution synchrotron X‐ray diffraction

The developed curved image plate (CIP) is a one‐dimensional detector which simultaneously records high‐resolution X‐ray diffraction (XRD) patterns over a 38.7° 2θ range. In addition, an on‐site reader enables rapid extraction, transfer and storage of X‐ray intensity information in ≤30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X‐ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X‐ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high‐temperature XRD.     

Nanoscale Control of Homoepitaxial Growth on a Two‐Dimensional Zeolite

Nanoscale crystal growth control is crucial for tailoring two‐dimensional (2D) zeolites (crystallites with thickness less than two unit cells) and thicker zeolite nanosheets for applications in separation membranes and as hierarchical catalysts. However, methods to control zeolite crystal growth with nanometer precision are still in their infancy. Herein, we report solution‐based growth conditions leading to anisotropic epitaxial growth of 2D zeolites with rates as low as few nanometers per day. Contributions from misoriented surface nucleation and rotational intergrowths are eliminated. Growth monitoring at the single‐unit‐cell level reveals novel nanoscale crystal‐growth phenomena associated with the lateral size and surface curvature of 2D zeolites.