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采用等离子体化学气相沉积系统生长非晶硅薄膜并用原位等离子体氧化的方法制备出具有不同子层厚度的非晶Si/SiO2多层膜,然后利用限制性晶化原理使非晶硅层晶化生成纳米硅。利用Raman、TEM等手段对薄膜结构进行了系统表征,在室温下观测到了光致发光信号,其发光峰峰位在750nm附近。进而在样品上下表面蒸镀电极,构建了电致发光原型器件并观测到了室温下的电致发光谱,开启电压约为6V,有两个明显的发光带,分别位于在650nm和520nm处。初步探讨了纳米硅及纳米硅/二氧化硅界面态对发光特性的影响。 相似文献
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利用等离子体化学气相沉积技术在100℃的衬底温度下,制备了具有不同组分比的系列非晶碳化硅薄膜。结合傅里叶变换红外光谱与喇曼光谱对所制备的薄膜微结构进行了表征与分析,同时,对具有不同组分比的非晶碳化硅薄膜室温光致发光性质进行了系统的研究。结果表明在Ar+离子激光和Xe灯紫外光的激发下,不同组分的样品显示出不同的光致发光特性,并对样品的发光特性与其微结构的联系进行了讨论。在此基础上,用碳化硅薄膜设计和制备了全固体光学微腔,研究了微腔对碳化硅发光行为的调制作用。 相似文献
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Intensive blue photoluminescence (PL) was observed at room temperature from the nanocrystalline-Si/SiO2 (nc-Si/SiO2) multilayers (MLs) obtained by thermal annealing of SiO/SiO2 MLs for the first time. By controlling the size of nc-Si formed in SiO sublayer from 3.5 to 1.5 nm, the PL peak blueshifts from 457 to 411 nm. Combining the analysis of TEM, Raman and absorption measurement, this paper attributes the blue PL to multiple luminescent centres at the interface of nc-Si and SiO2. 相似文献
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Enhanced photoluminescence (PL) at room temperature from thermally annealed a-Si:H/SiO2 multilayers is observed through the step-by-step thermal post-treatment. The correlation between the PL and the crystallization process is studied using temperature-dependent PL, Raman, cross section high-resolution transmission electron microscopy (XHRTEM) and x-ray diffraction (XRD) techniques. An intensified PL band around 820 nm is discovered from the sample annealed near the crystallization onset temperature, which is composed of two peaks centred at 773 nm and 863 nm, respectively. It is found that the PL band centred at 863 nm is related to the pseudo nanocrystal (p-nc-Si) silicon, and the PL band centred at 773 nm is attributed to Si = O bonds stabilized in the p-nc-Si surface. 相似文献
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