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Thin films of tungsten(W)-doped thermochromic vanadium dioxide(VO2) were deposited onto soda-lime glass and fused silica by radio frequency magnetron sputtering.The doped VO2 films were characterized by X-ray diffraction,optical transmittance measurement,and near field optical microscopy with Raman spectroscopy.X-ray diffraction patterns show that the(011) peak of W-doped thermochromic VO2 film shifts to a lower diffraction angle with the increase of W concentration.The optical measurements indicated that the transmittance change(△T) at wavelength of 2500 nm drops from 65%(T at 35℃ and 80℃ for undoped VO2 film) to 38%(T at 30℃ and 42℃ for the doped VO2 film).At the same time,phase transition temperature drops from 65℃ to room temperature or lower with the increase of W concentration.Near field optical microscopy image shows that the surface of W-doped VO2 film is smooth.Raman results show that the main Raman modes of W-doped VO2 are centered at 614 cm1,the same as that of undoped VO2,suggesting no Raman mode changes for lightly W-doped VO2 at room temperature,due to no phase transition appearing under this condition. 相似文献
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In-situ characterization of electrochromism based on ITO/PEDOT:PSS towards preparation of high performance device 下载免费PDF全文
Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)(PEDOT:PSS) is usually sandwiched between indium tin oxide(ITO) and a functional polymer in order to improve the performance of the device. However, because of the strong acidic nature of PEDOT:PSS, the instability of the ITO/PEDOT:PSS interface is also observed. The mechanism of degradation of the device remains is unclear and needs to be further studied. In this article, we investigate the in-situ electrochromism of PEDOT:PSS to disclose the cause of the degradation. X-ray photoelectron spectroscopy(XPS) was used to characterize the PEDOT:PSS films, as well as the PEDOT:PSS plus polyethylene glycol(PEG) films with and without indium ions. The electrochromic devices(ECD) based on PEDOT:PSS and PEG with and without indium ions are carried out by in-situ micro-Raman and laser reflective measurement(LRM). For comparison, ECD based on PEDOT:PSS and PEG films with LiCl, KCl, NaCl or InCl_3 are also investigated by LRM. The results show that PEDOT:PSS is further reduced when negatively biased, and oxidized when positively biased. This could identify that PEDOT:PSS with indium ions from PEDOT:PSS etching ITO will lose dopants when negatively biased. The LRM shows that the device with indium ions has a stronger effect on the reduction property of PEDOT:PSS-PEG film than the device without indium ions. The contrast of the former device is 44%, that of the latter device is about 3%. The LRM also shows that the contrasts of the device based on PEDOT:PSS+PEG with LiCl, KCl, NaCl, InCl_3 are 30%, 27%, 15%, and 18%, respectively. 相似文献
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