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Simulations from Laboratory Sourceless Object Counting System (LabSOCS) software were used to determine self-attenuation correction factor, which is defined as the efficiency ratio of the sample with the absorbing medium to that of the sample without absorbing medium. The semi-empirical self-attenuation correction formula F(μ) used to correct self-attenuation of a sample was applied. A comparison of the two methods reveals that formula of sample with φ 75 mm× 25 mm and φ75 mm× 10 mm can be, respectively, used in the self-attenuation correction for μ in the ranges of 0 to 0.5 cm-1 and 0.5 cm-1 to 2.0 cm-1, indicating that the semi-empirical formula will not be used when μ has exceeded the interval. The semi-empirical formula value is consistent with the experimental value, within 7.9% accuracy. Therefore, this method is correct and effective. Both of our two methods can accurately produce a relative self-attenuation correction factor when the composition of the sample is known. The self-attenuation correction of a sample with unknown composition can only be carried out using a semi-empirical formula method.  相似文献   
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介绍了Si-PIN中子探测器的结构和测量原理,分析了探测器对14MeV中子的灵敏度.利用该探测器测量了等离子焦点装置的D-T脉冲中子产额,实验结果与SDIN500探测器测量结果在5?%不确定度范围内一致  相似文献   
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