多壁碳纳米管膜湿敏特性的研究

研究了多壁碳纳米管(MWNTs)薄膜的湿敏特性，实验所用的多壁碳纳米管是用热灯丝化学气相沉积法(CVD)合成的.分别对未修饰和修饰的多壁碳纳米管膜温度和湿度特性进行研究后发现，修饰的多壁碳纳米管对温度和湿度非常敏感，且对湿度的响应时间和恢复时间短，重复性好.而未修饰的多壁碳纳米管对温度和湿度不太敏感.对修饰多壁碳纳米管的湿敏特性进行了理论分析，给出了其理论表示式. 关键词： 多壁碳纳米管 化学修饰 湿敏特性 物理吸附     

MgB2交流响应teff的电流效应

本文并从磁通守恒方程出发,详细求导了Slab样品(厚度为d)交流磁化率的测量方程,并以MgB2为例,测量了在不同外场H和交流信号的频率γ交流磁化率,求得Ueff和J的关系实际上是满足Zeldov关系,实验结果和理论假设完全自洽.     

高频单线圈双调谐NMR单晶探头的研制

本文报道了一种测角单晶NMR探头。该探头采用单线圃双调谐电路,工作频率在90MHz-110 MHz连续可调,可进行交叉极化大功率去耦实验。文中提出了一种简单而有效的测角装置,可使单晶绕三个互相垂直轴转动实现单晶的NMR测量。作为典型的应用例子,本文利用该探头实现了单晶DGO(2NH₂CH₂COOH·H₂C₂O₄)屏蔽张量的测量。     

Field Emission from Silicon Nanocrystallite Films with Compact Alignment and Uniform Orientation

Patterned silicon nanocrystallite (SINC) films were fabricated on (100) orientation p-type boron-doped sificon wafer by the hydrogen ion implantation technique and the anodic etching method. The efficient field emission with low turn-on field of about 3.5V/μm at current density of 0.1μA/cm^2 was obtained. The emission current density from the SiNC films reached 1mA/cm^2 under a bias field of about 9.1V/μm. The experimental results demonstrate that there are great potential applications of the SiNC films for fiat panel displays. A surface treatment with hydrogen plasma was performed on the SiNC films and a significant improvement of emission properties was achieved.     

带干扰的Erlang(2)风险模型的不破产概率

本文讨论了带干扰的Erlang(2)风险模型,通过构造一个延迟更新过程,我们得到了不破产概率满足的积分-微分方程,进而得到了不破产概率的明确表达式．     

A Comparison of Different Measures for Dynamical Event Mean Transverse Momentum Fluctuation

Various measures for the dynamical event mean transverse momentum fluctuation are compared with the real dynamical fluctuation using a Monte Carlo model. The variance calculated from the G-moments can reproduce the dynamical variance well, while those obtained by subtraction procedures are approximate measures for not very low multiplicity. Фpt, proposed by Gadzicki M and Mrowczynski S [Z. Phys. C 54 (1992)127], can also serve as an approximate measure after being divided by the square root of mean multiplicity.     

一个数学问题的再探讨

命题若复数z_1,z_2,z_3满足z_1+z_2+z_3=0,|z_1|=|z_2|=|z_3|=1,则复平面内以z_1,z_2,z_3所对应的点为顶点的三角形是内接于单位圆的正三角形。文[1]的作者给出了该命题的一种证法。并探讨了该命题的逆命题。若复平面内以模为1的复数z_1,z_2,z_3所对应的点为顶点的三角形是正三角形,则z_1+z_2+z_3=0。容易证明此命题也正确(略)。作者还对该命题进行了推广,笔者读后受益非浅。本文将进一步探讨以上两个命题在解题中的应用。下面以例示明。例1 (1986年苏州市数学竞赛题) 已知复数z满足|z|=1,z~(11)+z=1,求z。解∵ |z|=1, ∴|z~(11)|=|z|=|-1|=1 又z~(11)+z+(-1)=0 ∴z~(11),z,-1所对应的三点构成一个正三角形。故z=(-1)(cos120°±sin120°)=(1/2)±3~(1/2)/2i 例2 (1987年第二届全国高中数学冬令营赛题)     

变In组分沟道的MM-HEMT材料电子输运特性研究

在变缓冲层高迁移率晶体管（MM_HEMT）器件中，二维电子气的输运性质对器件性能起着决定作用.通过低温下二维电子气横向电阻的量子振荡现象，结合变温度的Hall测量，系统研究了不同In组分沟道MM_HEMT器件中子带电子迁移率和浓度随温度的变化关系.结果表明，沟道中In组分为0.65的样品，材料电学性能最好，In组分高于0.65的样品，严重的晶格失配将产生位错，引起迁移率下降，大大影响材料和器件的性能. 关键词： 变缓冲层高迁移率晶体管 Shubnikov_de Hass 振荡