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A polarization Fizeau interferometer based on birefringent thin film is presented. The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams. Advantages include ease of implementation on large-aperture interferometer, measuring test optics from long distance, and achieving high fringe visibility. The phase shift is obtained by combining a quarterwave plate and an analyzer. The concepts illustrated are verified experimentally. 相似文献
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为了研究波长在255.3nm的铜蒸气激光倍频在亚微米光刻中的可行性,设计了带宽为1nm的1:1折反射式投影光刻物镜和一个带散射板的光管式均匀照相系统,获得了0.6μm的光刻分辨率。此结果表明,铜激光倍频光可作为亚微米光刻的照明光源。 相似文献
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