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X射线衍射增强成像技术可以精确得到样品内部结构的折射角信息, 对提高轻元素物质的成像衬度有着重要的意义. 本文对楔型和圆形两种模型样品进行了DEI实验的研究, 对3种不同能量的X射线均精确得到了样品的折射角信息, 与理论计算值吻合的很好. 利用边界可见度(Edge Visibility)对楔形样品进行了定量的分析. 结果表明, 对于特定折射角的界面, 能精确计算其最佳可见度的位置, 并与实验结果吻合的较好. 最后对一块实际医学肿瘤样品边界处的可见度进行了定量的研究, 讨论了获得最佳成像衬度的条件. 相似文献
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Er2O3 thin films are grown on oxidized Si (111) substrates by molecular beam epitaxy. The sample grown under optimized condition is characterized in its microstructure, surface morphology and thickness using grazing incidence x-ray diffraction (GIXRD), atomic force morphology and x-ray reflectivity. GIXRD measurements reveal that the Er2O3 thin film is a mosaic of single-crystal domains. The interplanar spacing d in-plane residual strain tensor ell and the strain relaxation degree ε are calculated. The Poisson ratio μ obtained by conventional x-ray diffraction is in good agreement with that of the bulk Er2O3. In-plane strains in three sets of planes, i.e. (440), (404), and (044), are isotropic. 相似文献
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