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应用在位电阻率测量方法研究高压下锐钛矿TiO2的电学性质。通过研究电阻率随压力变化的异常变化点,观察到了TiO2从锐钛矿-柯铁矿-斜锆石的相变。卸压后,电阻率数值和初始值相差2个数量级,说明该相变为不可逆相变。结合第一性原理计算结果表明,柯铁矿结构更小的带隙是导致TiO2电阻率减小的根本原因。 相似文献
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塞曼石墨炉原子吸收光谱法直接测定高纯稀土氧化物中微量钙 总被引:1,自引:0,他引:1
固体悬浮液进样,石墨炉原子吸收法直接测定高纯稀土氧化物中的微量钙,迄今尚未见有公开报导。该法具有灵敏度高、空白低、操作简便、快速准确的优点。我们采用该法测定了高纯氧化镧、氧化钇、氧化镥中的微量钙,结果令人满意。实验部份1.仪器及操作条件180-80型Zeeman原子吸收光谱仪056型双笔记录仪,日立普通石墨管和钙空心阳极灯,上海611型加热磁力搅拌 相似文献
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The theta (t) -type oscillatory singular integral operators has been discussed.With the non- negative locally integrable weighted function , the weighted norm inequality of theta (t)-type oscillatory singular integral operators is proved, and the weighted function hasreplaced by action of Hardy-Littlewood maximal operators several times . 相似文献
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采用水热合成法制备了锐钛矿相TiO2纳米线,并通过原位高压阻抗谱测量技术研究了TiO2纳米线晶粒和晶界性质及电输运行为随压力的变化关系.研究结果表明:在0—34.0 GPa压力区间,锐钛矿TiO2纳米线的传导机制为电子电导.TiO2纳米线晶粒和晶界电阻以及弛豫频率在8.2—11.2 GPa压力区间均出现了不连续变化行为,此压力区域对应着由锐钛矿相到斜锆石相的结构转变,并且相变从晶粒表面逐渐延伸到晶粒内部.晶粒激活能和晶界激活能均随压力的增加而减小,说明压力对样品电导率的贡献为正.在所测压力范围内,空间电荷势始终为正值,表明在空间电荷区阴离子缺陷更易形成,氧缺陷是TiO2纳米线相变的主要诱因. 相似文献
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弹性反冲探测分析技术(ERDA)对轻元素的测定具有灵敏度高、包含深度信息的优势,因此在材料氦行为研究中发挥着重要作用。镍基哈氏N合金被认为是未来熔盐堆的结构材料,氦脆是其服役性能下降的主要因素之一。利用掠入射模式的ERDA,解析了哈氏N合金样品中的氦原子浓度及其分布,但仅局限于0~175 nm深度范围内。结果表明:在800℃的退火条件下,距离样品辐照表面~33 nm深度区域内,出现了氦原子逃逸现象。更高温度的退火(1 050℃)可加剧氦原子的逃逸,但样品中仍有氦原子滞留。另外,采用透射式的ERDA,极大地扩大了对氦原子分析的深度范围,得到了纯镍薄膜在0~950 nm深度区域内的氦原子浓度分布。这表明将块体材料制备成薄膜样品,利用透射模式的ERDA,将可以得到氦原子在更大范围内的扩散、逃逸行为。Since the elastic recoil detection analysis (ERDA) technique has the advantages of high sensitivity and deep information in analyzing the light elements, it plays an important role in the study of helium behavior in materials. Helium embrittlement is one of the main reasons for the degradation of the Hastelloy N alloy, which has been considered as the promising candidate structural material for the further molten salt reactor. In this work, the profile of helium concentrationin sample of Hastelloy N alloy was analyzed by ERDA experiments applying grazing-incidence geometry. However, the result was limited within the depth range of 0~175 nm, and it shown that helium atoms escaped in the range from the irradiated surface of the sample to the depth of ~33 nm when annealing the sample at 800℃ The annealing at higher temperature (1 050℃) increased the escape of helium atoms, but a small fraction of helium atoms still trapped in the sample. In addition, the profile of helium concentration was obtained in the helium-irradiated pure nickel film in the depth range of 0~950 nm, using the ERDA experiments in transmission geometry. This indicates that the diffusion behavior of helium atoms in bulk samples can be completely obtained using the ERDA experiments in tranmission geometry if the bulk material can be prepared into a thin film sample. 相似文献
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