预制层溅射气压对CIGS薄膜结构及器件的影响

研究了金属预制层制备过程中溅射气压对Cu(In_1-xGa_x)Se₂(CIGS)薄膜及电池器件性能的影响.通过调节溅射气压改变预制层的结晶状态及疏松度与粗糙度,在合适的预制层结构下,活性硒化热处理过程中,可使Ga有效地掺入到薄膜中形成优质的CIGS固溶体.高溅射气压会使预制层过于致密,呈现非晶态趋势.经活性硒化热处理后,CIGS薄膜容易产生CIS与CGS"两相分离"现象,从而导致CIGS薄膜太阳电池的开路电压和填充因子降低,电池转换效率由10.03%降低到5.02%.     

微粗糙结构表面液滴浸润特性的多体耗散粒子动力学研究

超疏水表面因其优异的自洁作用一直是表面科学领域关注的重点.本文使用多体耗散粒子动力学(many-body dissipative particle dynamics, MDPD)方法模拟研究了不同粗糙结构下液滴的浸润特性, 并与Cassie-Baxter理论进行了对比. 研究使用了一种具有长吸短斥作用的流固作用函数来获得不同的液滴浸润性, 并利用一种简洁的数值方法来测量接触角. 模拟结果表明本研究方法能够稳定地捕捉到液滴在粗糙表面的静态和动态特性. 模拟了粗糙结构对三相接触线运动的黏滞作用, 与物理实验结果相符合, 表明Cassie-Baxter理论在实际应用中尚存在一定局限性. 研究分析了在动态铺展过程中的能量转化关系, 并指出在低值表面容易引起液滴反弹.     

AlN插入层对AlxGa1-xN/GaN界面电子散射的影响

本文研究AlN作为Al_xGa_1-xN/GaN插入层引起的电子输运性质的变化, 考虑了Al_xGa_1-xN和AlN势垒层的自发极化、压电极化对Al_xGa_1-xN/AlN/GaN双异质结高电子迁移率晶体管(HEMT)中极化电荷面密度、二维电子气(2DEG) 浓度的影响, 分析了AlN厚度与界面粗糙度散射和合金无序散射的关系; 结果表明, 2DEG 浓度、界面粗糙度散射和合金无序散射依赖于AlN层厚度, 插入一层1–3 nm薄的AlN层, 可以明显提高电子迁移率.     

Study of temperature distribution of sliding block with asperity surface

In this study, a numerical thermal model is developed for sliding block contact under various loads, sliding velocities and surface roughness. The temperature distributions are shown for perfectly insulated thermal conditions along noncontact surfaces. For a particular five‐peaks contact model, the maximum temperature at the central peak is slightly lhigher than the others. The temperature profile decreases as the distance to the symmetry axis increases, and then decreases dramatically at the noncontact area. It is clear to see that the maximum temperature locates at the symmetry central peak of the asperity contact area instead of the leading head of the smooth surface. The maximum temperature rise parameter increases as the pressure, sliding velocity and asperity roughness increased or conductivity decreased. This phenomenon becomes obvious for cases at high pressure, velocity and roughness and low conductivity. Particularly, the influence of roughness is not significant for low velocity. Similar results are found for the maximum temperature rise parameter difference between peaks or peaks/valleys. The simulation results of this asperity surface sliding block contact model are able to provide essential information for the components of microelectro—mechanical systems (MEMS) and biochemical reaction mechanism. Copyright © 2011 John Wiley & Sons, Ltd.     

铝板带冷轧过程中磨损影响因素 及磨损作用机制研究

轧后铝材表面磨损量是影响铝材轧制过程的重要因素,脱落的铝粉恶化产品表面质量、影响轧制效率。本文选用不同的添加剂配制轧制油,对铝板材进行冷轧试验,重点研究添加剂种类、铝材原始表面质量、轧制压下率三方面对铝材表面磨损性能及磨损机制的影响。结果表明：双组分添加剂轧制油中油性剂在金属表面吸附成膜,犁削磨损现象较无润滑和纯基础油轧制有明显改善,轧后铝材表面磨损量小;轧件轧前表面粗糙度大,轧辊对轧件微凸体的碾压作用加剧,被碾压下来的大量铝粉成为轧辊和轧件外的“第三体”,造成磨粒磨损加剧;化学磨损和犁削磨损同时存在于轧制过程中,油膜厚度较大时,前者是主要磨损机制;反之,后者起主导作用。     

接触表面不平度对摩擦尖叫噪声的影响

针对摩擦尖叫的间歇性特点,建立了考虑摩擦接触表面不平度的3自由度摩擦自激振动机理模型.应用数值方法分析了接触表面不平度倾角对系统稳定性及瞬态动力学特性的影响,并进行了基于销-盘装置的摩擦尖叫噪声试验研究.结果表明:系统的稳定性主要取决于系统自身的耦合特性,但也与摩擦特性和接触表面不平度倾角的综合作用有关.当接触表面不平度倾角增大时,系统趋向不稳定,会激发尖叫噪声.     

Atomic force microscope studies of membranes: Surface pore structures of Cyclopore and Anopore membranes

Non-contact atomic force microscopy has been used to investigate the surface pore structure of Cyclopore and Anopore microfiltration membranes in air. Three Cyclopore membranes and three Anopore membranes of different pore sizes were studied. Excellent high resolution images were obtained. Analysis of the images gave quantitative information on the surface pore structure, in particular the pore size distribution. Non-contact AFM is an excellent means of obtaining such information for microfiltration membranes.     

Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)

The Scanning Electron Microscope (SEM) is an excellent tool for the characterization of surfaces. In order to evaluate the accuracy of the reconstruction of a 3D dataset, a known depth standard for tactile depth measurement devices with a step height of 92 μm was investigated by SEM. The reconstruction of surfaces using two tilted images (StereoCreator) or three different tilted images (TriCreator) is affected by the tilt angle itself, the image resolution and the working distance. We compare the results of the obtained data from different combinations of tilt angles and working distances in relation with the type of reconstruction…. To compare the accuracy and reliability of the 3D datasets from the new Infinite Focus Measurement Machine (IFM) with the datasets reconstructed from the well known SEM technique, we utilized a groove standard with six trapezoidal grooves with known width and depth certified by the PTB – Braunschweig – Germany (Physikalisch – Technische Bundesanstalt Braunschweig – calibration mark 035PTB04 – measured with a traceable stylus instrument according to DIN EN ISO 3274). The great advantage of the SEM/ESEM (Environmental Scanning Electron Microscope) and IFM technique compared to tactile-profile-measurement instruments is that it is a non-tactile and a non-destructive method. The potential and accuracy of these methods in comparison to tactile measurement systems is shown and discussed in this paper.     

Surface roughness influence on the pull-in voltage of microswitches in presence of thermal and quantum vacuum fluctuations

In this work we investigate the influence of the combined effect from random self-affine roughness, finite conductivity, and finite temperature on the pull-in voltage in microswitches influenced by thermal and quantum vacuum fluctuations through the Casimir force and electrostatic forces. It is shown that for separations within the micron or sub-micron range the roughness influence plays a dominant role, while temperature starts to show its influence well above micron separations. Indeed, increasing the temperature leads to higher pull-in voltages since it leads to an increased Casimir force. The temperature influence is more significant for relatively large roughness exponent H ∼ 1, while its influence is significantly lower with increasing lateral roughness correlation length ξ or due to long wavelength surface smoothness.     

Highly resolved scanning tunneling microscopy study of Si(0 0 1) surfaces flattened in aqueous environment

A surface preparation method with fine SiO₂ particles in water is developed to flatten Si(0 0 1) surfaces on the nanometer scale. The flattening performance of Si(0 0 1) surfaces after the surface preparation method is investigated by scanning tunneling microscopy. The observed surface is so flat that 95% of the view area (100 × 100 nm²) is composed of only three atomic layers, namely, one dominant layer occupying 50% of the entire area and two adjacent layers. Furthermore, a magnified image shows the outermost Si atoms regularly distributed along the 〈1 1 0〉 direction on terraces.