基于曲线拟合的亚像素边缘定位方法的研究

图像的边缘定位是图像测量的关键之一,随着测量精度要求的提高,已由早期的像素级边缘定位发展到了现在的亚像素级边缘定位。根据地球在地球敏感器CCD阵面中的成像特性,提出了一种基于曲线拟合的亚像素边缘定位方法以获取地球“灼热圆盘”的边缘。该方法利用曲线拟合获得的拟合斜率以及灰度值来提取图像的边缘。仿真结果表明,采用曲线拟合亚像素边缘定位法可使图像的边缘定位精度达到百分之几个像素,具有较高的精度。     

子孔径拼接技术在大口径高陡度非球面检测中的应用

 为了能够精确地完成对大口径高陡度非球面在细磨和抛光过程中的测量，提出了一种将子孔径拼接技术和补偿技术相结合的检测方法。介绍了该方法的基本原理，建立了合理的数学模型，编制了拼接计算软件。利用该方法对一外形尺寸为400 mm×300 mm的高次离轴非球面进行了测试，通过最小二乘法拟合消去各子孔径相对基准子孔径的调整误差以及整个系统的装调定位误差，得到了准确的全孔径面形分布。对实验精度和误差来源进行了分析，并将拼接面形与全孔径测量面形相对比，二者是一致的。     

基于DSP的光纤光栅应变传感器信号检测实验研究

针对光纤光栅应变传感器接收信号弱且信噪比低这一问题,提出了应用DSP技术来抑制噪声,提高Bragg峰值波长检测精度的方法.实验结果表明所设计的498阶Kaiser窗低通FIR数字滤波器能够显著提高光纤光栅应变传感器的信号检测精度.采用DSP技术可以较好地解决光纤光栅传感器的波长解调这一技术难题.     

一种简便的计算层析系统X射线硬化校正方法

以实物拍摄为依据,用一种最简便的修正方法解决计算机X射线层析术成像时由于硬化效应引起的切片图灰度失真问题。用高性能数字X射线机FAXITRON MX-20(射线管焦点20μm,探测板灰度等级16位)对不同厚度的物体进行透射成像,测得对应的透射光强度,并利用新创的指数拟合法得到理想的拟合曲线,由此推导硬化效应的指数校正公式;最后利用实验室的微型计算机层析设备进行扇形束扫描,并逆投影重建生成计算层析断层图像,验证了该校正方法的实用性。该指数拟合法的误差不到常用的二阶多项式拟合法的1/3,对物体计算层析重构,硬化校正以前有明显的“杯状”伪迹,切片灰度不均匀,用指数法修正以后该伪迹消失,切片灰度均匀。     

湍流大气中光波闪烁的圆环孔径平均因子

利用弱起伏条件下球面波在大气湍流中传输的光强起伏(闪烁)理论和圆环孔径滤波函数,获得了圆环孔径平均因子的精确表达式。将圆环孔径平均因子关于一个无量纲参量(孔径半径与菲涅耳尺度的比值)拟合成2阶多项式,再找出多项式系数与孔径内外径之比的函数关系,获得了圆环孔径平均因子关于该参量和孔径内外径之比的函数关系式。通过误差分析确定了拟合关系式的适用范围,在此范围内,拟合式与精确式的相对误差小于25%。分别用Tatarskii谱和修正Hill谱分析了湍流内尺度对圆环孔径平均因子的影响,结果显示:在其他条件不变的情况下,内尺度越大,孔径平均效应相对越小。     

双染料敏化光致聚合物的光化动力学研究

研究了光致聚合物的光化学反应理论模型及其动力学参量。合成了染料藻红B和亚甲基蓝作为联合光敏剂共同敏化的全息光存储光致聚合物材料。对材料测试分别得到在曝光波长为633 nm与曝光强度为65 mW/cm2时,透射率随曝光条件的变化关系以及材料各光化学参量。结果表明,随着曝光波长与曝光强度的增加,光致聚合物的光化漂白速率常数k与量子产率Φ增大,当曝光强度为65 mW/cm2时透射率在短波长下出现了下降,光化漂白速率常数k出现负值,而摩尔吸收系数ε在条件不同时则表现了不同的变化趋势。     

Long‐range analysis of density fitting in extended systems

Density fitting scheme is analyzed for the Coulomb problem in extended systems from the correctness of long‐range behavior point of view. We show that for the correct cancellation of divergent long‐range Coulomb terms it is crucial for the density fitting scheme to reproduce the overlap matrix exactly. It is demonstrated that from all possible fitting metric choices the Coulomb metric is the only one which inherently preserves the overlap matrix for infinite systems with translational periodicity. Moreover, we show that by a small additional effort any non‐Coulomb metric fit can be made overlap‐preserving as well. The problem is analyzed for both ordinary and Poisson basis set choices. © 2008 Wiley Periodicals, Inc. Int J Quantum Chem, 2008     

Inequalities for formal power series and entire functions

We present several integral and exponential inequalities for formal power series and for both arbitrary entire functions of exponential type and generalized Borel transforms. They are obtained through certain limit procedures which involve the multiparameter binomial inequalities, integral inequalities for continuous functions, and weighted norm inequalities for analytic functions. Some applications to the confluent hypergeometric functions, Bessel functions, Laguerre polynomials, and trigonometric functions are discussed. Also some generalizations are given.     

三角级数属于Ba空间的充分必要条件

该文给出了正弦级数和余弦级数在系数满足NBV条件时属于Ba空间的充分必要条件,所得结论 为Ba空间中的首个此类结果,同时也是对L_p空间中已有结论的本质性推广.     

Modeling structural recovery in glasses: An analysis of the peak‐shift method

Amorphous polymers below their glass‐transition temperature are inherently not at equilibrium. As a result, their structures continuously relax in an attempt to reach the equilibrium state. The current models of structural recovery can quantitatively describe the process. One of the parameters needed for the models is the nonlinearity parameter x. It has been proposed that x can be obtained from experimental data with the so‐called peak‐shift method. In this work, we use the Tool–Narayanaswamy–Moynihan model to identify the factors that determine the accuracy of the peak‐shift method and to quantify the errors in the value of x obtained from the peak‐shift method. In addition, we determine the influence of the error in x on the evaluation of the nonexponential model parameter β. Finally, the peak‐shift method is compared with the traditional curve‐fitting method for model parameter determination. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 2027–2036, 2002