石墨消解-原子荧光光谱法测定土壤中的总硒

为准确定量土壤硒总量,提出以逆王水(1+1)-石墨消解法消解土壤,氢化物原子荧光光谱法(HG-AFS)测定土壤总硒含量的方法。其中,对消解方式、消解时间和仪器条件进行了探讨,确定最优检测条件。称取0.2g土壤样品加入5mL逆王水(1+1),于石墨消解仪120℃消解1.5h,冷却至室温后用超纯水定容至25mL,原子荧光光度计测定总硒含量。结果显示,9种土壤标准物质测定值都在理论值范围内,其相对标准偏差为2.6%,加标回收率为92.3%～110%,检出限为0.68ng/L。方法测定结果准确,操作简单、实验周期短、成本低、安全。     

硒芳香杂环化合物的微波固相合成

许多含硒杂环化合物具有抗肿瘤、抗病毒等生物活性及超导性。微波技术由于能量利用率高,操作简便,无污染等优点,已在有机合成中得到了广泛的应用。本文采用微波辐射固相合成法合成了如下目标化合物：     

Erste Reaktionen an der P=C- und an der P–P-Bindung des neuen P-Phosphanylphosphaalkens 1-Bis(trimethylsilyl)methyliden-2,2-diisopropyldiphosphan

The New P -Phosphanylphosphaalkene 1-Bis(trimethylsilyl)methylidene-2,2-diisopropyldiphosphane: First Reactions at its P=C and P–P Bonds (Me₃Si)₂C=PCl ( 1 ) reacts with the trichlorosilylphosphanes RR′PSiCl₃ (R and R′ = t-Bu or i-Pr) providing the new P-dialkylphosphanylphosphaalkenes (Me₃Si)₂C=P–P-i-Pr₂ ( 2 ) and (Me₃Si)₂C=P–P(t-Bu)(i-Pr) ( 3 ) as well as the known (Me₃Si)₂C=P–P-t-Bu₂ ( 4 ). The P=C double bond of 2 can be protected reversibly by a [2 + 4]-cycloaddition with cyclopentadiene resulting in the formation of a P-phosphanyl-phosphanorbornene derivative 5 . The [2 + 4]-cycloaddition of 2 with 2,3-dimethylbutadiene provides the cyclic diphosphane 6 . Reactions of 2 with sulfur and selenium were followed by ³¹P and ⁷⁷Se nmr: Chalcogen insertion into the P–P bond leads to the products (Me₃Si)₂C=P–X–P-i-Pr₂ 9 a (X = S) and  9 b (X = Se). Subsequent σ³λ³ → σ⁴λ⁵ oxidation steps of 9 a with S and of 9 b with Se lead to compounds (Me₃Si)₂C=P–X–P(=X)-i-Pr₂ 10 a (X = S) and 10 b (X = Se), which contain phosphinic acid functions with the phosphaalkene moieties attached to S or Se. 10 a and 10 b were not isolated in a pure state. However, trapping 10 b from an enriched solution by [2 + 4]-cycloaddition with cyclopentadiene allowed the isolation of the P-diseleno-phosphinato-phosphanorbornene 12 . The constitution of new compounds 2 , 3 , 5 , 6 and 12 was confirmed by elemental analyses, nmr and mass spectra. The structures of cycloadducts 5 and 6 were determined by X-ray diffraction analysis.