Multi-cracks problem for piezoelectric materials strip subjected to dynamic loading

This paper analyses and models the dynamic interaction among permeable multi-cracks in a piezoelectric strip under anti-plane shear waves by the Schmidt method. The Fourier transform is applied and then two pairs of triple integral equations can be solved using the Schmidt method. The results show that the stress and the electric displacement intensity factors of cracks depend on not only the crack length and the piezoelectric coefficient, but also the thickness of the piezoelectric strip, the distance between multi-cracks and the frequency of incident wave.     

基于变芯径光纤的光学系统在光造型中的应用

光学系统采用变芯径光纤，可大幅度提高光的传输效率，增加光学子系统柔性。描述了光造型工作原理及其理论依据，在介绍所研制的光的成型系统光学子系统的基础上，阐述了紫外光源的选择与设计，及变芯径光纤的设计、传输、耦合与聚焦等技术。该套基于变芯径光纤的光学子系统成本低、体积小、效率高，巳成功应用于所研制的台式低成本快速成型系统中，为该系统的进一步推广奠定了技术基础。     

广义Hénon映射的滑模变结构控制同步

基于可线性化的非线性离散变结构跟踪控制方法实现了广义Hénon映射混沌系统的同步.广义Hénon映射的混沌吸引子比Hénon映射的混沌吸引子要复杂得多,对于保密通信来说,这种复杂性正是所期望的.提出的同步方法允许参数有适当的失配程度,这对工程实现是非常有利的,理论分析和仿真结果证实了该方法的有效性 关键词： 广义Hénon映射 混沌 同步 变结构控制     

HL－1装置中LHCD和等离子体参数的关系

本文研究了在ＨＬ－１托卡马克的不同放电阶段的低混杂波驱动特性。给出了驱动电流及驱动效率和等离子体参数，如电子平均密度ｎｅ、等离子体电流Ｉｐ及纵向磁场的关系。也给出和分析了波驱动和入射波功率的关系。在放电平段，对正反向驱动效率进行了研究和比较。     

Studies on self-pumped phase conjugation in Cu-doped (K0.5Na0.5)0.2(Sr0.61Ba0.39)0.9Nb2O6 crystals

The use of Cu-doped (K_0.5Na_0.5)_0.2(Sr_0.61Ba_0.39)_0.9Nb₂O₆ as self-pumped phase conjugators using internal reflection is reported. Reflectivities as high as 63% at 5145.5 nm and 60% at 632.8 nm were realized. It was found that the photorefractive response changes significantly at different doping concentration. The responses of the crystals to the laser wavelength, incident angle and dopant concentration are studied.     

Silber

Ohne Zusammenfassung     

Crystallographic report: Bis[bis(N,N‐dibenzyldithiocarbamato)cadmium(II)]

The centrosymmetric structure of {Cd[S₂CN(CH₂Ph)₂]₂}₂ features both bridging and chelating dithiocarbamate ligands so that a square pyramidal S₅ coordination geometry results. Copyright © 2004 John Wiley & Sons, Ltd.     

Harze und Harzs?uren

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Zur Bestimmung von Schwefel und Halogenen

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Korrosion und Schutzanstriche

Ohne Zusammenfassung