理学ZSX PrimusⅡX射线荧光光谱仪日常维护及常见故障维修

主要介绍了理学ZSX PrimusⅡX射线荧光光谱仪的一些日常保养和出现故障的现象及处理方法。     

VD—1A型X射线衍射仪电流稳定器的故障排除

以故障实例详细地叙述了岛津VD-1A型X射线衍射仪电流稳定器系统的故障分析及排除方法。     

ZSX Primus Ⅱ型X射线荧光光谱仪样品室常见故障现象与排除方法

介绍了日本理学公司ZSX Primus Ⅱ型X射线荧光光谱仪样品室常见的故障现象及简单可行的排除方法.     

ZSX Primus Ⅱ型X射线荧光光谱仪故障处理与维护

介绍了日本理学ZSX Primus Ⅱ型X射线荧光光谱仪使用中所出现的几例故障现象,对其产生的原因进行了分析,归纳总结了故障排除的方法与过程。     

VD—1A型X射线衍射仪高压系统的故障分析及排除

本文以三个故障实例详细地叙述了岛津VD-1A型X射线衍射仪高压系统的故障分析和排除方法。     

SRS系列X射线荧光光谱仪使用注意事项及常见故障排除

介绍SRS系列X射线荧光光谱仪在使用过程中的注意事项及常见故障,分析故障产生的可能原因,并提出了可行的解决方法。     

X射线晶体分析仪综合故障的分析与检修

X射线晶体分析仪出现故障的环节很多,本文分类列出常见故障的现象,分析故障的原因并介绍检修技巧,提高检修工作的主动性与针对性,克服盲目性与片面性,以期收到快捷准确的检修效果。     

X射线晶体学在高等教育中的通识性

X射线晶体学是一门研究物质晶体结构的科学,X射线衍射技术已成为当今化学、材料、生命等众多科学领域中对物质结构研究的必要手段与方法。本文从X射线晶体学的诞生、发展和迅速普及的角度,谈谈X射线晶体学的发展历程对人类文明的贡献,以及X射线晶体学在当今高等教育中的重要性,从而阐述在高等学校通识教育中加强与推广X射线晶体学的必要性与可行性。     

X射线成像技术在能源材料研究中的应用

随着人类对可持续能源的需求不断增长,先进的表征方法在能源材料研究等领域变得越来越重要。借助X射线成像技术,我们可以从二维和三维角度实时获取能源材料的形貌、结构和应力变化信息。此外,借助高穿透性X射线和高亮度同步辐射源,设计原位实验,可以获取充放电过程中样品的定性和定量变化信息。本文综述了基于同步加速器的X射线成像技术及其相关应用,讨论了包括X射线投影成像、透射式X射线显微成像、扫描透射X射线显微成像、X射线荧光显微成像以及相干衍射成像等几种主要的X射线成像技术在能源材料研究领域的应用,展望了未来X射线成像的应用前景及发展方向。     

基于蒙特卡洛方法的X射线探测器能谱响应研究

为解决X射线荧光测量过程中的仪器刻度和校正难题,通过理论研究并运用蒙特卡洛方法对X射线荧光仪进行建模,得到了X射线探测器能谱响曲线。结果表明:模拟的X射线探测器能谱响应全谱与实测情况基本一致,而主成份谱线则高度一致,特征峰半高宽相对误差均在5%以内。方法为X射线荧光测量的仪器刻度和校正提供重要的研究信息,不仅为元素分析工作节省大量人力物力,也为无标样X射线荧光分析提供了有力的理论支撑。方法也可用于X射线荧光分析过程中的其他研究领域。     

Development of confocal micro X-ray fluorescence instrument using two X-ray beams

A new confocal micro X-ray fluorescence instrument was developed. This instrument has two independent micro X-ray tubes with Mo targets. A full polycapillary X-ray lens was attached to each X-ray tube. Another half polycapillary lens was attached to a silicon drift X-ray detector (SDD). The focal spots of the three lenses were adjusted to a common position. The effects of the excitation of two X-ray beams were investigated. The instrument enabled highly sensitive three-dimensional X-ray fluorescence analysis. We confirmed that the X-ray fluorescence intensity from the sample increased by applying the two independent X-ray tubes in confocal configuration. Elemental depth profiling of black wheat was demonstrated with the result that each element in the surface coat of a wheat grain showed unique distribution.     

Depth profiling in surface regions of oxidized metal alloys by low energy PIXE

As a nondestructive technique for depth profiling of elements the PIXE-method was applied to determine the concentration profile of elements in the near surface of oxidized metal alloys. The outer region of about 1 m was investigated using low energy protons for X-ray excitation. A set of X-ray yield measurements was carried out at proton energies of 150 to 300 keV. The unfolding of the X-ray yields was performed by calculation of proton energy loss, X-ray production cross section and X-ray attenuation.     

The birth of the X-ray refractive lens

In the X-ray region, no optics based on the principle of refraction existed since the discovery of the X-rays by Röentgen in November 1985, although mirrors and zone-plates that use the principle of reflection and diffraction have been employed. The idea of a practical X-ray refractive lens was first disclosed in February 1994, i.e., just one year before the centenary of the discovery of X-rays. The present paper reviews why the X-ray lens did not appear for so many years, and how the design was born. The paper also discusses technologies to be developed for high performance X-ray lenses, and advantages of refractive X-ray lenses over other X-ray optics.     

High Performance Dynamic X-ray Flexible Imaging Realized Using a Copper Iodide Cluster-Based MOF Microcrystal Scintillator

X-ray imaging technology has achieved important applications in many fields and has attracted extensive attentions. Dynamic X-ray flexible imaging for the real-time observation of the internal structure of complex materials is the most challenging type of X-ray imaging technology, which requires high-performance X-ray scintillators with high X-ray excited luminescence (XEL) efficiency as well as excellent processibility and stability. Here, a macrocyclic bridging ligand with aggregation-induced emission (AIE) feature was introduced for constructing a copper iodide cluster-based metal–organic framework (MOF) scintillator. This strategy endows the scintillator with high XEL efficiency and excellent chemical stability. Moreover, a regular rod-like microcrystal was prepared through the addition of polyvinyl pyrrolidone during the in situ synthesis process, which further enhanced the XEL and processibility of the scintillator. The microcrystal was used for the preparation of a scintillator screen with excellent flexibility and stability, which can be used for high-performance X-ray imaging in extremely humid environments. Furthermore, dynamic X-ray flexible imaging was realized for the first time. The internal structure of flexible objects was observed in real time with an ultrahigh resolution of 20 LP mm⁻¹.     

Co-Ni合金薄膜的电化学外延及同步辐射XMCD研究

采用电化学循环伏安法在单晶GaAs(001)衬底上外延沉积了Co-Ni二元合金薄膜. 扫描电子显微镜观察结果显示, 薄膜厚度约180 nm, 其表面由约40 nm大小的颗粒组成. 用X射线荧光法确定了薄膜的组分为Co66Ni34, XRD确定了其为面心立方结构. 用同步辐射圆偏振软X射线分别测量了样品中Co和Ni的吸收谱(XAS), 从而得到X射线磁性圆二色(XMCD)谱, 通过加和定则分别计算出了合金中Co和Ni的轨道磁矩和自旋磁矩, 与纯的Co和Ni样品相比, 它们都有不同程度的增加.     

Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D Microanalysis.

A comprehensive three-dimensional (3D) microanalysis procedure using a combined scanning electron microscope (SEM)/focused ion beam (FIB) system equipped with an energy-dispersive X-ray spectrometer (EDS) has been developed. The FIB system was used first to prepare a site-specific region for X-ray microanalysis followed by the acquisition of an electron-beam generated X-ray spectral image. A small section of material was then removed by the FIB, followed by the acquisition of another X-ray spectral image. This serial sectioning procedure was repeated 10-12 times to sample a volume of material. The series of two-spatial-dimension spectral images were then concatenated into a single data set consisting of a series of volume elements or voxels each with an entire X-ray spectrum. This four-dimensional (three real space and one spectral dimension) spectral image was then comprehensively analyzed with Sandia's automated X-ray spectral image analysis software. This technique was applied to a simple Cu-Ag eutectic and a more complicated localized corrosion study where the powerful site-specific comprehensive analysis capability of tomographic spectral imaging (TSI) combined with multivariate statistical analysis is demonstrated.     

Focused beam total reflection X-ray fluorescence with low power sources coupled to doubly curved crystal optics

A focused beam total X-ray fluorescence technique was developed based on doubly curved crystal optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power X-ray sources were used to demonstrate the benefit of the X-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The detection capability of the focused beam Total reflection X-ray fluorescence system was investigated with dried droplets of calibrated low concentration solutions. Detection limits at the femtogram level were demonstrated.     

卤化银微晶的含碘结构的测定

用超薄切片法及X-射线线扫描法研究了半个碘溴化银微晶中碘的成层分布,结果与预想的碘的分布相一致。横扫过薄样品的X-射线线扫描提供了一个比较准确的测定含有不同碘量成层结构的技术。这有助于我们改进碘溴化银乳剂的制备。文章还讨论了在该种工作条件下,X-射线源的空间分辨率和超薄切片的厚度。 利用这种方法,把一种商用多层彩色片做超薄切片,用X-射线线扫描法直接对超薄切片中卤化银微晶的断面扫描,得到了各个轧剂层中的卤化银微晶的含碘结构。     

电沉积铁族薄膜的磁性圆二色研究

采用循环伏安法在GaAs(100)单晶表面电沉积了铁族金属单质薄膜. 扫描电子显微镜(SEM)结果显示, Fe族金属薄膜的晶粒较小, 薄膜平整度较高。通过X射线衍射(XRD)谱分析了Fe, Co, Ni在GaAs(100)晶面上的外延生长. 使用磁光克尔效应装置研究了Fe族金属薄膜的宏观磁性, 用同步辐射圆偏振软X射线测量了铁族单质磁性薄膜的吸收谱, 获得了X射线磁性圆二色谱, 并通过加和定则计算了磁性薄膜中Fe族金属原子的轨道磁距和自旋磁矩.