共查询到17条相似文献,搜索用时 62 毫秒
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缓冲层厚度对Ge/Si多层膜的影响 总被引:2,自引:2,他引:0
采用离子束溅射技术,通过改变Si缓冲层厚度,在p型Si衬底生长了一系列的Ge/Si多层膜样品.利用Raman光谱、X射线小角衍射以及原子力显微镜等分析测试技术,研究了多层薄膜的结晶、膜层结构、表面形貌等性质.结果表明:通过引入缓冲层,在一定程度上可以提高颗粒的结晶性;随着缓冲层逐渐沉积,来自界面态的影响有了明显的减弱,且多层膜结构的生长得到有效改善.红外吸收光谱实验表明多层膜的吸收特性与其周期结构密切相关,因此可以通过改变缓冲层厚度的方法,实现对多层薄膜红外吸收特性的调制. 相似文献
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以Si为衬底,SiO2+Ge为复合靶,用超晶格方法(SiO2+Ge层和SiO2 + GeO2层交替生长)和磁控溅射技术制备镶嵌于Si/Ge氧化膜中的多层Ge纳米晶.X射线衍射(XRD)结果表明:退火样品中有Ge纳米晶生成.Ge纳米晶的声子限域效应引起Raman散射谱的Ge-Ge振动峰向低频移动.X射线光电子能谱(XPS)分析表明Ge主要以Ge0和Ge4+形式分别存在于所制备的超晶格中的SiO2+Ge层和SiO2+GeO2层中.透射电子显微镜(TEM)研究表明,Ge纳米晶被限制在SiO2+Ge层中且结晶性好.实验结果说明,相比于通常的单层介质膜方法,用该超晶格方法极大地提高了Ge纳米晶的密度,尺寸和空间分布的均匀性. 相似文献
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采用射频磁控溅射方法,在Si(111)和石英衬底上制备了Fe/Si亚层厚度比不同的多层膜.多层膜的总厚度为252 nm,Fe/Si亚层厚度比分别为1 nm/3.2 nm、2 nm/6.4 nm和20 nm/64 nm.在850 ℃, Ar气气氛中退火2 h后,Si衬底上的多层膜完全生成了β-FeSi2相.但石英衬底上同样Fe/Si亚层厚度比的多层膜除了生成β-FeSi2相,还生成了少量的ε-FeSi相.通过增加Si亚层的厚度至Fe/Si亚层厚度比为2 nm/7.0 nm,在石英衬底上也获得了单相的β-FeSi2薄膜, 其光学带隙为0.87 eV,表面均方根粗糙度为2.34 nm. 相似文献
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硫系玻璃是一类优秀的红外光学镜片材料,但其热膨胀系数较大,与Si、Ge等红外光学材料相比,硫系玻璃镜片在镀膜过程中产生的残余应力较大,镀膜后面形变化较大。研究膜层中应力并优化应力的控制方法,可以提高薄膜的力学性能。本文通过测量在As40Se60硫系玻璃上镀膜前后基底的变化量来研究基底上不同材料膜层的残余应力情况,同时使用ANSYS软件对As40Se60/ZnS/Ge/ZnS/Ge/ZnS/YbF3/ZnS红外光学镜片膜系结构的热应力进行理论计算与仿真,验证了模型的合理性。分析了膜系结构中热应力在轴向与径向分布情况,结果显示:轴向热应力主要集中在膜层部分,表面膜层的热应力最大;径向热应力呈均匀分布,在边缘发生突降。分析了最外层保护膜的热应力与沉积温度、相邻膜层、不相邻膜层和基底的关系,结果表明:沉积温度在110℃到200℃的范围内,保护膜的热应力与沉积温度成正比;相邻膜层和不相邻膜层的厚度和材料均不影响保护膜的热应力;基底的厚度会对保护膜的热应力产生影响。 相似文献
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采用Ge浓缩法制备了高质量超薄绝缘体上锗硅(SiGe-on-insulator,SGOI)材料,然后在SGOI上通过超高真空化学气象沉积(UHVCVD)法外延了厚度为15 nm的超薄全局应变硅单晶薄膜,使用电子束光刻和反应离子刻蚀在样品上制备了一组纳米级尺寸不等的应变硅线条和应变硅岛,并利用TEM、SEM、Raman等分析手段表征样品.实验结果表明,本文制备的应变硅由于其直接衬底超薄SiGe层的低缺陷密度和应力牵制作用,纳米图形化的应变Si弛豫度远小于文献报道的无Ge应变硅或者具有Ge组分渐变层SiGe衬底的应变Si材料. 相似文献
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Tomoki Narita Kouhei Naruse Ikumi Suzuki Shunsuke Ogawa Tamio Iida Norimitsu Yoshida Takashi Itoh Shuichi Nonomura 《Journal of Non》2008,354(19-25):2214-2217
To investigate the deposition of Ge films without toxic gas such as germane, we have studied the Ge films prepared by the hot-wire technique, which utilize the reaction between a Ge target and hydrogen atoms generated by the hot-wire decomposition of H2 gas. The films deposited on Si substrate were microcrystalline Ge films and the mean crystallite size of the films increased from 13.3 to 24.8 nm with increasing the substrate temperature from 300 to 500 °C. Moreover, the deposition rate of Ge films deposited on Si substrate was higher than that of Ge films deposited on Corning 1737 substrate. It was found that the substrate temperature and the kind of substrate are key parameters for the preparation of microcrystalline Ge films by the hot-wire technique. 相似文献
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We propose microcrystalline silicon–germanium (μc-SiGe) as a bottom cell material of triple-junction solar cells in order to improve the conversion efficiency of thin film solar cells. The μc-SiGe thin films were prepared by the chemical transport process using Si and Ge targets exposed to hydrogen radicals. We successfully produced highly photosensitive μc-SiGe films with relatively low Ge composition by increasing the gas pressure, and observed the photovoltaic effect in pin solar cell structures. However, it was difficult to produce μc-SiGe films with higher Ge composition. We found that a small amount of argon introduction into the chemical transport process enables us to increase Ge composition at the high pressure. Moreover, the argon introduction seems effective to maintain the electrical properties in relatively high Ge composition. The results suggest that the μc-SiGe thin films prepared by the chemical transport process are one of the candidates for new photovoltaic materials. 相似文献
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《Journal of Non》2006,352(9-20):892-895
We report on the growth of nanocrystalline Si:H and Ge:H films. The films were grown using plasma deposition and hot wire chemical growth techniques. Conditions such as pressure, temperature and hydrogen dilution were systematically varied. It is shown that excessive hydrogen dilution during growth leads to smaller grains in nanocrystalline Si and Ge. Films with very large grains (56 nm) could be obtained using hot wire growth techniques under appropriate conditions of growth. From the data, it is concluded that the natural growth direction for the films is 〈2 2 0〉, and that excessive bonded hydrogen leads to smaller grains. 相似文献
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The formation of Ge nanoislands directly on Si(1 1 1) surface before the completion of a wetting layer was studied by scanning tunneling microscopy and Raman scattering spectroscopy. The mechanism of the wetting layer formation in the Ge/Si(1 1 1) system depends on the rate of Ge deposition. Within the temperature range 350–500 °C, with Ge deposition rates of the order of 10−3 bilayers/min, the Ge wetting layer is formed by the multilayer growth mechanism. Therefore, the arrays of Ge islands with the densities of 109–1012 cm−2, depending on the rate of Ge deposition, appear directly on the Si surface during the evolution of the wetting layer. The height of Ge islands is limited by 3 bilayers. The lateral dimensions depend on the coverage of Ge and on the growth temperature. A series of lines related to the quantization of the phonon spectrum along the growth direction [1 1 1] was observed in the spectra of Raman scattering by optical phonons of Ge nanoislands. 相似文献
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T. Kohoutek T. Wagner J. Orava M. Krbal J. Ilavsky Mil. Vlcek M. Frumar 《Journal of Non》2008,354(2-9):529-532
We report the preparation of multilayers based on polyamide–imide polymer and As–Se or Ge–Se chalcogenide thin films. Chalcogenide films of As–Se and Ge–Se systems were deposited using a thermal evaporation method periodically alternating with spin-coated Polyamide–imide films. Fifteen layers of PAI + As–Se system and nineteen layers of PAI + Ge–Se system were coated. Optical properties of prepared multilayers have been established using UV–vis–NIR and Ellipsometric spectroscopy. Both, PAI + As–Se and PAI + Ge–Se multilayer systems, exhibited the high-reflection bands centered around 830 nm and 1350 nm, respectively. The shift of the band position of PAI + Ge–Se multilayers to lower energies was caused by higher thickness of Ge–Se films. The bandwidth of reflection band of 8 PAI + 7 As–Se multilayer was ~90 nm while bandwidth of PAI + Ge–Se system decreased to ~70 nm because Ge–Se films have 0.1 lower refractive index against As–Se films. Design of 1D-photonic crystals based on alternating chalcogenide and polymer films is a new opportunity for application of chalcogenide thin films as optical materials for near-infrared region. 相似文献
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Ge epitaxial layers with reasonable quality were grown on Si (1 1 1) substrates by cluster beam deposition (CBD) process. Molecular dynamics study of the low energy Ge clusters deposition process utilizing the Stillinger–Weber two- and three-body interaction potentials was carried out to compare the experimental results. Both experimental and simulation results prove that the substrate temperature plays a dominant role in the epitaxial growth of Ge films in CBD process. The influence mechanisms of temperature are discussed. 相似文献
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Hidehiro Suzuki Noritaka Usami Akiko Nomura Toetsu Shishido Kazuo Nakajima Takashi Suemasu 《Journal of Crystal Growth》2010,312(22):3257-3260
We investigated the impact of an amorphous Ge (a-Ge) thin layer inserted at the amorphous Si (a-Si)/Al interface on Al-induced crystallization. In situ observation of the growth process clarified that the nucleation rate is drastically reduced by insertion of a-Ge, which led to increase in the average size of crystal grains. This was interpreted as resulting from decrease in the driving force of crystallization, mainly due to the larger solubility of Ge in Al than that of Si in Al. The obtained films were SiGe alloys with lateral distribution of Ge content, and its origin is discussed based on the two-step nucleation process. 相似文献