利用P—偏振光双面反射法测量多层膜的光学参数

利用Ｐ－偏振光双面反射法测量了浸泡提拉法制备了“有机硅树脂－二氧化硅－有机硅树脂”三层膜样品两面Ｐ－偏振光反射强比γ与入射角θ关系曲线，经过数据拟合，确定了这三层薄膜的光学参数，同时研究了薄膜间的相互作用层的光学参数，测量结果表明此方法可能成为研究薄膜和膜层之间的相互作用的一种新手段。     

玻璃表面层对薄膜光学参数测量的影响

利用p偏振光在镀膜平板玻璃前后表面反射光强比γ与膜层光学参数之间的密切关系,给出了玻璃表面层的光学参数分布。对典型的薄膜系统-单面镀膜与双面镀膜两种情况,理论分析了玻璃表面层对薄膜光学参数测量的影响。实验上对PMTES和SnO₂薄膜参数进行了测量,仅当计及玻璃表面层作用时,反射光强比γ的角度调制曲线才与理论拟合结果相吻合.     

双折射消偏振膜的设计和制备

基于倾斜沉积薄膜材料的双折射特性,采用单一TiO2设计和制备了中心波长为632 nm的双折射消偏振膜。首先以60°和70°的沉积角度镀制了TiO2单层膜,通过单层膜的透射光谱分别拟合出两种沉积角度下薄膜对s和p偏振光的等效折射率nPH,nSH和nPL,nSL。通过对折射率的组合,实现正入射时s偏振光透射率大于p偏振光,而入射角度增大会使两者透射率差值减小,基于这一思想设计并制备了消偏振膜。分别测量了消偏振薄膜在400~800 nm波段范围内正入射及倾斜入射条件下s和p偏振光的透射光谱。入射角为60°时,s偏振光反射带宽基本与p偏振光反射带宽重合,在波长632 nm左右基本实现消偏振。结果表明,利用材料的双折射特性,可以设计和制备出倾斜入射条件下消偏振薄膜。     

玻璃表面层光学参数分布的研究

利用并改进平板玻璃两面Ｐ偏振光反射光强比的测量来确定玻璃表面光学参数的方法，测量了平板玻璃两面Ｐ偏振光反射光强比γ与入射角θｉ的关系曲线，运用新的表面层模型进行数据模拟，获得了表面层的光学参数分布。     

“V”型消反射膜的工艺改善

<正> 一、理论基础光学零件的折射率n_(?),与空气折射率n_(?)之差,造成表面具有一定的反射损失.反射损失随基底折射率的增高而增加。为降低表面反射损失、提高光学系统的透过率,通常在零件表面镀一层或多层消反射膜。双层消反射膜,通常采用λ/4—λ/4膜     

一种基于介质光栅金属薄膜复合结构的折射率传感器

设计了一种基于介质光栅金属薄膜复合结构的折射率传感器。利用He-Ne激光器输出的632.8nm横磁偏振光激发复合结构中的表面等离子体,得到了高灵敏度的折射率传感器。运用有限元方法,数值模拟了具有不同光栅厚度、周期以及折射率的分析物的反射光谱。对占空比为0.5、金属薄膜厚度为45nm的复合结构进行了参数优化,得到最优参数为:光栅厚度100nm、光栅周期500nm。在最优参数条件下,计算了金属薄膜与具有不同折射率的分析物之间的界面共振角的变化,得到了高达500(°)/RIU的角灵敏度。该折射率传感器操作简单、成本低、角灵敏度高,具有很好的应用前景。     

利用4400系统构造具有光学多道分析功能的信号处理系统

基于4400系统,通过引入光电二极管列阵作为传感器,构造了具有光学多道分析功能的信号处理系统。利用该系统对实际的激光空间分布进行了描绘,给出了高斯场分布的相应参数。通过进一步观测p偏振光在K9玻璃上下表面反射光强比(γ)的角度调制曲线,获得了玻璃表面层的光学参数。实验结果表明,该系统测量精度高,可应用在激光时间信号及空间场分布的表征与测量领域。     

周期结构薄膜在折射率色散下反射区特性研究

周期性结构是光学薄膜设计的基本物理模型,给出了反射区中心波长的一般性条件,研究了在膜层材料存在折射率色散情况下,等厚周期结构和非等厚周期结构的薄膜反射区中心波长与带宽特性.研究结果表明:在等厚和非等厚周期结构中,考虑膜层材料折射率色散与忽略色散情况相比,中心波长向长波方向移动,反射级次与相对波数的线性关系偏离;在薄膜光学厚度一定的非等厚周期结构中,高折射率层光学厚度大于低折射率层时,反射级次与相对波数的线性关系偏离度高;非等厚周期结构薄膜的带宽在低反射级次上小于等厚周期结构,同时膜层的色散对反射带宽影响不大.     

金刚石薄膜的红外椭圆偏振光谱研究

采用红外椭圆偏振光谱对微波等离子体化学气相沉积法（MPCVD）和热丝化学气相沉积法（H-FCVD）制备的金刚石薄膜在红外波长范围（2.5—12.5μm）的光学参数进行了测量.建立了不同的光学模型，且在模型中采用Bruggeman有效介质近似方法综合考虑了薄膜表面和界面的椭偏效应.结果表明，MPCVD金刚石膜的椭偏数据在模型引入了厚度为77.5nm的硅表面氧化层、HFCVD金刚石膜引入879nm粗糙层之后能得到很好的拟合.最后对两种模型下金刚石薄膜的折射率和消光系数进行了计算，表明MPCVD金刚石薄膜的红外 关键词： 金刚石薄膜 红外椭圆偏振光谱 光学参数 有效介质近似     

吸收-透射界面下正弦折射率介质内辐射换热

对具有吸收-透射性边界面的梯度折射率半透明介质层,建立了介质内热辐射传递与边界面辐射换热的数理模型,并采用数值弯曲光线跟踪法求解介质内的热辐射传递。通过数值模拟,分析了正弦折射率下,边界面的反射特性、吸收率以及介质层光学厚度对介质内热辐射平衡温度场及热流分布的影响。结果表明,边界面的反射特性与吸收率对介质内辐射换热均有重要影响,吸收率的影响与边界面反射特性、介质层光学厚度及环境条件相关,呈现特征不同的作用。     

Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry

The effect of nanometer dielectric films on the differential reflection characteristics of linearly polarized light from non-absorbing materials is investigated in the long-wavelength approximation. The second-order formulas for changes in the reflectance of s- and p-polarized light caused by ultrathin layer are obtained. A detailed analysis of the influence of ultrathin film to the reflectivity of p-polarized light in the vicinity of the Brewster angle is carried out. The novel methods are developed for determining the thickness and refractive index of uniform (or the average values of refractive index of nonuniform) nanometer-scale films by differential reflectivity and ellipsometric measurements.     

散射相函数的高阶光学参量研究

漫反射光谱技术被广泛应用于无创测量生物组织光学性质。当光源与探测器很近时,仅仅依靠吸收系数μ_a和约化散射系数μ′_s不能准确描述光源附近光的传播状态。而二阶光学参量γ的引入改善了近光源光的传播状态的描述。本文将生物组织的散射等效成特定球形颗粒的散射,基于Mie散射理论,计算了与散射相函数p(θ)有关的单粒子和多分散系粒子的二阶光学参量γ,研究了γ随尺度参数α和相对折射率m的变化规律,描述了γ与组织结构参量之间的联系,并阐述了γ对粒子特征的表征能力。研究表明,参量γ对尺度参数α小于2的微粒尺寸的改变是敏感的,并呈二次函数关系,其系数与相对折射率呈线性关系;对于相对折射率和尺度参数都不相同的两个粒子,他们的各向异性因子g相同时,二阶光学参量γ却不同,粒子越大,γ表征粒子特征的能力越强。这对于无创探究组织微观形态具有深远的意义。     

酞菁LB薄膜及其旋涂膜光学参数的测量

制备了四新戊氧基酞菁锌LB膜和旋涂膜,采用p偏振反射法测定了两种薄膜在不同温度退火后的折射率n和消光系数k,发现这两种薄膜不仅表现出了相似的光学常数的数值,而且具有相似的随温度变化的趋势.实验结果与理论模拟相一致.     

Optical diagnostics of nanoscale dielectric layers on interference films by polarization-dependent differential reflectivity

The small change in the reflectance (differential reflectance) of s- or p-polarized light from an interference film as a result of the deposition of a nanoscale insulating layer on it is investigated theoretically. Analytical relations describing the contribution of nanoscale layers to the reflectance from an interference film as function of film thickness are obtained in the long-wavelength approximation. It is shown that the utilization of interference films in reflection diagnostics through differential measurements allows a significant enhancement of the sensitivity of these techniques and also opens up new possibilities for resolving the inverse problem of determining simultaneously the optical constant and thickness of nanoscale dielectric layers.     

长周期光纤光栅气敏薄膜传感器结构优化

基于三包层长周期光纤光栅模型,研究了包层表面涂覆一层溶胶凝胶气敏薄膜的长周期光纤光栅化学传感器的灵敏度Sn与薄膜光学参量(折射率n3和厚度h3)和光纤光栅结构参量(光栅周期、折变量和光栅长度)之间的关系。采用最优化数值方法,找到了获得高灵敏度所需的最佳膜层光学参量和光栅结构参量。理论计算表明,该类型传感器对膜层折射率的测量分辨率高达10-8。实验上制作了对乙醇气体敏感的传感器,并证实了传感器结构优化的必要性。     

Cerium (III) doping effects on optical and thermal properties of PVA films

Cerium chloride (CeCl₃) doped polyvinyl alcohol (PVA) films were prepared by casting technique. The effect of CeCl₃ concentrations on the structural, optical and thermal properties of the PVA films was studied by X-ray diffraction (XRD), FT-IR, UV-visible, transmittance (T), reflectance (R), differential scanning calorimetry (DSC) and thermogravimetry (TG). Both of the XRD and the DSC results affirm the increase in amorphousity. Absorption spectra of the doped films have shown an absorption band at 260 nm assigned to the trivalent state of cerium ions. Absorption, transmittance and reflectance spectra were used for the determination of the optical constants. The results indicate that the optical band gap (E_g) was derived from Tauc's extrapolation and decreases with the cerium content. The refractive index increases with monotonic behavior as the cerium content increases. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple–DiDomernico model for obtaining the dispersion parameters. The obtained optical parameters were found to be strongly affected by CeCl₃ dopant. Thermal analysis showed that the thermal parameters of PVA are enhanced by CeCl₃. The dependence of the activation energy of the decomposition temperature on doping level was estimated.     

立方型Ti-B-N的光学性质的计算

立方型TiBN材料的光学性质对于深刻理解TiBN薄膜材料的光学性质,以及监测和控制TiBN薄膜材料的生长过程起着重要作用。使用基于密度泛函理论的平面波超软赝势方法计算了立方型TiBN的电子结构和光学性质,给出了电子态密度、介电常数、吸收系数、反射力、折射系数、消光系数等计算结果,并对计算结果作了分析。态密度图显示,存在源于B的2p态的态密度峰,分析认为这对立方型TiBN的光学吸收造成了明显影响。同时还计算了立方型TiBN的色度坐标,并根据计算结果对工艺参量与TiBN薄膜材料色度坐标之间的联系作出了分析。     

Novel optical film sensor design based on p-polarized reflectance

A new scheme of optical film sensor is presented. The sensor is based on p-polarized reflectance, consisting of a sensing coated substrate, is easily optimized for maximum sensitivity in different applications. The resolutions of refractive index n_f, extinction coefficient k_f and thickness h_f of the sensitive films are predicted to be 10⁻⁷, 10⁻⁵ and 10⁻³ nm, respectively. Experimentally, we selected the sol–gel derived SnO₂ films as gas-sensitive films and conducted preliminary gas-sensing test. The results indicate that novel optical film sensor scheme has higher sensitivity, and the detection sensitivity is available to 10⁻¹ ppm on the condition of optimum optical parameters and incident angle.     

Optimization of the optical and electrical properties of electron beam evaporated aluminum-doped zinc oxide films for opto-electronic applications

Aluminum-doped zinc oxide (AZO) thin films have been deposited by electron beam evaporation technique on glass substrates. The structural, electrical and optical properties of AZO films have been investigated as a function of annealing temperature. It was observed that the optical properties such as transmittance, reflectance, optical band gap and refractive index of AZO films were strongly affected by annealing temperature. The transmittance values of 84% in the visible region and 97% in the NIR region were obtained for AZO film annealed at 475 °C. The room temperature electrical resistivity of 4.6×10⁻³ Ω cm has been obtained at the same temperature of annealing. It was found that the calculated refractive index has been affected by the packing density of the thin films, whereas, the high annealing temperature gave rise to improve the homogeneity of the films. The single-oscillator model was used to analyze the optical parameters such as the oscillator and dispersion energies.