氢原子束在大气长程传输中的剥离效应

考虑到中性粒子束对近地轨道太空垃圾的清理作用以及在太空探索中的潜在应用前景，研究了中性粒子束在亚轨道空间长程传输过程中影响束流能量和密度损失的主要物理机制，重点分析了剥离效应对束流损耗的影响。中性束剥离效应包括束流粒子之间碰撞导致的自剥离效应和其与大气粒子碰撞导致的剥离效应。以束密度随传播距离变化的方程为基础，通过引用几何因子来表征束流的自剥离效应强度，建立了剥离效应机制下束流的传输模型，由此评估了束流自剥离效应在中性束长程传输中对传输距离的影响关系。研究结果表明，在固定的高度，当中性束密度大于空气粒子密度时，自剥离效应的影响将非常突出，随着传输高度的升高，即使束密度和空气密度同时降低维持量级一致，自剥离效应对传输距离的影响在大几何因子的情况下仍会增强。     

非理想氢原子束真空环境长程传输模拟研究

模拟研究了非理想氢原子束在真空环境下的长程传输效应。根据中性化程度的不同,将非理想束分为欠中性束和过中性束。通过建立束流传输的准电磁模型,研究了束流密度、中性化因子、空间磁场和弹性散射等因素对非理想氢原子束的影响。结果表明:对于欠中性束,负氢离子的存在对氢原子的传输几乎没有影响,因此欠中性束的发射装置可以考虑去除偏置磁场,以减小设备体积和质量;对于过中性束,束流损失率与束流密度和中性化因子有关,即束流密度越大,束流损失越大;中性化因子越高,束流损失就越高;而无论是欠中性束还是过中性束,空间磁场和粒子间的弹性散射对其传输都没有影响。     

EAST-NBI磁偏转系统束传输特性模拟研究

根据EAST-NBI偏转系统工作原理,分析了束流在偏转系统传输的基本过程和特点。利用直接蒙特卡罗方法,发展了中性束注入器束偏转区域束流传输模拟程序。结果显示:EAST-NBI磁偏转系统可很好地剥离束流中的剩余离子;束偏转区域束流再电离损失约为2.43%;束流180°偏转所带来线聚焦过程使偏转磁体磁极护板局部面临较高的热流密度。     

氢原子传输及负氢离子产生全三维数值模拟研究

理论分析了负氢离子源中中性粒子传输特性及引出电极表面产生负氢离子(H^-)的物理过程, 研究了引出孔传输率对氢原子传输的影响,深入剖析了氢原子与不同属性导体壁碰撞以及碰撞后反射的物理情景.基于CHIPIC软件平台,成功研制了全三维 Particle-in-cell with Monte Carlo Collision 氢原子传输及负氢离子产生物理过程的模拟算法,并采用JAEA 10A负氢离子源进行模拟验证.模拟达到稳态后,氢原子平均能量约为0.57 eV, 且H原子呈现+Y漂移,当非均匀氢原子束轰击引出壁时,导致产生的负氢离子空间分布不均匀. 这些模拟结果都与文献符合,验证了算法的可靠性.     

强流束在二极磁场中传输的模拟计算

为了研究空间电荷力对束流在二极磁场中传输的影响,从理论上用矩阵法分析非强流脉冲束流与强流脉冲束流在二极磁场中的传输矩阵,编写了束流在二极磁场等元件中传输的计算程序。用Powell优化方法计算非强流束传输实现给定的光学条件,用迭代方法计算强流束传输获得自洽解。在不同束流流强条件下,运用该程序与其他程序进行了模拟计算,并对模拟结果进行了比较分析。模拟结果表明:束流流强越大,束流包络曲线横向发散越显著,空间电荷效应越强。     

用自洽的蒙特卡罗—流体结合模型模拟溅射过程

 采用自洽的蒙特卡罗－流体结合模型对溅射过程进行模拟,以了解等离子体粒子行为与溅射参数的关系。溅射过程包括气体放电和溅射原子传输。对于气体放电,蒙特卡罗部分模拟快电子和快气体原子,而流体部分则描述离子和慢电子。对于溅射原子传输,蒙特卡罗部分模拟溅射原子的碰撞过程,而流体部分则描述溅射原子的扩散和漂移。模拟的结果包括：等离子体粒子的密度和能量分布;不同电离机制对气体原子和溅射原子电离的贡献;不同等离子体粒子对阴极溅射碰撞的贡献;溅射原子的密度分布;溅射场和溅射粒子相对于入射离子能量和角度的分布;溅射原子经碰撞后在整个等离子体区的分布。     

相对论电子束在动态加载等离子体中的自聚焦传输

为了进一步研究相对论电子束-离子通道辐射实验和理论的需要, 研究了相对论电子束入射中性气体以及通过碰撞电离动态加载等离子体实现对高能束流的自聚焦传输过程PIC(particle in cell) 模拟发现, 电子束电离出的离子背景能够实现对电子束的聚焦传输. 但是离子背景横向和纵向的不均匀性对束流的传输特性有显著影响. 在此基础之上, 提出了电子束在横向不均匀离子背景中传输的理论模型, 给出了束流的自聚焦条件.数值计算结果表明, 横向不均匀性会导致电子束的混合相位传输, 使得焦点附近内层电子可能跑到电子束外而被散焦损失, 这与PIC模拟的结果相符. 此外, PIC模拟还发现, 由于电子束的自聚焦, 在焦点处将电离出更多的离子而引起纵向不均匀性, 纵向不均匀性使得碰撞后的低能电子被俘获, 俘获电子效应会大幅降低电子束的传输效率. 但是俘获电子在纵向呈准周期分布, 对传输电子起到静电Wiggler场的作用, 可能实现静电Wiggler场的动态加载. 研究结果对于进一步研究电子束-等离子体系统的实验以及理论模型提出有一定的参考价值.     

释气对介质沿面闪络击穿影响的粒子模拟

为研究释气下的高功率微波介质沿面闪络击穿物理机制,首先建立了理论模型,包括:动力学方程、粒子模拟算法、次级电子发射、蒙特卡罗碰撞模型以及碰撞退吸附气体分子模型;其次,基于理论模型,编制了1D3V PIC-MCC程序,分别研究了弱退吸附、强退吸附以及释气分子运动速率对沿面闪络击穿的影响.研究结果表明:介质沿面闪络击穿本质是沉积功率的持续增加.弱退吸附下,次级电子倍增占优,随着退吸附系数的增加,碰撞电离效应对次级电子倍增有促进作用,主要表现为介质窗表面静电场、表面碰撞电子平均能量以及表面碰撞电子数目的增加,此处的表面碰撞电子主要是次级电子倍增形成的;释气分子运动速率高导致介质面附近气压下降,不利于次级电子与气体分子间碰撞电离过程形成.强退吸附下,气体碰撞电离效应占优,随着退吸附系数的增加,离子数增加速度表现为电离频率增加的指数增长形式,碰撞电离效应对次级电子倍增有抑制作用,主要表现为介质窗表面静电场为负、表面碰撞电子平均能量的降低,但是表面碰撞电子数目却得以增加,此处的表面碰撞电子主要是贴近介质面的气体碰撞电离形成的;释气分子运动速率高导致气体厚度增加,扩大了气体碰撞电离作用区域,有利于气体碰撞电离.     

电磁辐照金属铝膜材料释气效应研究

为研究空间环境中通用航天器表面覆盖的热控层电磁辐照效应,采用粒子模拟(PIC)和蒙特卡罗(MC)模拟相结合方法,建立了真空环境下电磁辐照航天器热控材料模型,模拟了场致电子发射、次级电子倍增、释气雪崩电离的全过程,并讨论了释气密度对热防护材料表面产生释气电离现象的影响。通过对比不同释气密度下该过程产生的电子和离子情况,获得热防护材料表面释气产生雪崩电离的阈值。模拟结果表明,当铝膜表面气体密度较小时,由于材料表面释气碰撞电离概率偏低而不会发生雪崩电离;只有当释气密度超过阈值时,材料表面释气碰撞电离过程加强,材料表面发生雪崩电离生成等离子体,等离子体吸收电磁波能量,其离子和电子总能量提升,可能对金属铝膜材料造成损伤。     

PPAC在单粒子效应地面模拟实验中对束流均匀度测量的应用

单粒子效应(SEE)加速器地面模拟需要离子束具有较好的均匀度,针对回旋加速器单粒子效应模拟的束流特点,建立了一套以位置灵敏平行板雪崩探测器(Parallel Plate Avalanche Counter,PPAC)为基础的均匀度探测系统并完成了带束测试,对它的结构、工作原理、均匀度获得方法及带束测试结果进行描述。为验证PPAC测量结果准确性,在带束测试过程中,前方同时放置PET膜测量穿过PPAC探测器的粒子分布,与离子径迹测量结果对比,给出PPAC的均匀度的测量误差在5%之内。探测器具有50 mm×50 mm的灵敏面积和小于1 mm的位置分辨,符合单粒子效应实验对束流均匀度测量的要求。     

Quasiclassical approach to the interpretation of the Barkas effect

A correction to the Bohr formula making it possible to explain the difference between the stopping powers of positively and negatively charged particles (the Barkas effect) is obtained in the quasiclassical approximation taking into account the difference between electron motion in a hydrogen atom as a function of the charge sign of the moving particle. The influence on the atomic electron of the moving particle leads to a change in the contribution of the adiabatic interaction, in the case of which the energy is not transferred in the majority of collisions, which is the reason for a decrease in the energy losses of slow particles compared with Bohr theory. The results of calculations show that the energy losses per path length unit can be represented in the form of the product of two functions, namely, the energy loss function (in accordance with Bohr theory) and the dynamic function taking into account corrections related to correction of the electron position in the target atom during the collision. Calculations carried out within the framework of classical dynamics make it possible to qualitatively estimate differences between the interaction of protons and antiprotons with target material atoms.     

The Impact of Direct Ionization by Beam Electrons on the Electron Kinetics of the Beam Discharge Plasma in Molecular Hydrogen

In a recent paper the stationary beam plasma discharge in partially dissociated hydrogen was investigated where the electron component was described by the Boltzmann equation for a mixture of atomic and molecular hydrogen and the main heavy charged and neutral particles by balance equations. It was assumed that, via the quasilinear beam plasma interaction, the electron beam produces only the turbulent electric field whilst an additional production of plasma electrons due to direct ionization by the beam and thus a direct influence on the balances of charge carriers were neglected. Now the additional production of plasma electrons due to direct ionization by the beam is studied on the basis of a generalized Boltzmann equation but for the simpler model of a purely molecular hydrogen plasma. For experimentally obtainable values of the turbulence energy density, beam energy, beam ionization degree and electron life time the calculation of the electron energy distribution function and of the direct beam contribution to the electron particle balance shows a marked influence of the direct beam ionization with increasing degree of beam ionization.     

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The fluid dynamics model was used to study the influence of the existence of the collisions on the dust particles in a dusty plasma sheath. The main collisions in this study consist of the ionization collision, the collision between electron and neutral particle, the collision between ion and neutral particle, the collision between electron and dust particle, the collision between ion and dust particle. Numerical calculation results are obtained by the fourth-order-Rung-Kutta method. It is shown that both the dust particles’ density and corresponding electricity quantity increase as the following collisions’ frequency enhances, such as ionization collision, the collision between electron and neutral particle, the collision between ion and neutral particle. The charge reduces due to the collisions concluding electron-dust particle and ion-dust particle. In addition, the effect produced by ions’ collision is much more obviously compared with electrons’ collision.     

碰撞对尘埃等离子体鞘层中尘埃颗粒影响

在一维平板鞘层中应用流体模型研究了尘埃等离子体鞘层中碰撞对尘埃颗粒密度和带电量的影响。 研究所涉及的碰撞主要有电离碰撞,电子、离子分别与中性粒子的碰撞,以及电子、离子分别与尘埃颗粒的碰撞。通过采用四阶龙格库塔法,得到了数值解。结果表明,随着电离碰撞或者电子、离子分别与中性粒子碰撞的频率 增加,都将导致鞘层中尘埃颗粒的数密度增大,数密度的极值位置向鞘边位置靠近,尘埃颗粒带电量增多。电子、离子与尘埃颗粒的碰撞,使得尘埃带电量减小。此外,从研究的结果来看,由离子产生的碰撞要比电子产生的碰 撞对尘埃颗粒的影响明显得多。     

低气压条件下氢气潘宁放电的模拟分析

为更好地理解低气压、弱电离条件下潘宁离子源放电过程中离子和电子的动力学行为, 通过建立二维轴对称模型, 采用粒子模拟与蒙特卡罗相结合(PIC/MCC)的方法, 考虑了电子与氢气之间的弹性碰撞、激发、电离以及氢原子、离子之间的弹性碰撞和电荷交换等过程, 对微型氢气潘宁离子源放电和引出过程进行了数值研究. 考察了磁场位形、壁面二次电子发射系数、引出电压和充气压力对放电过程的影响, 得到了实验中难以诊断得到的放电腔内电子与离子数密度分布, 阳极电流、引出极离子电流、单原子氢离子比例和双原子氢离子比例等宏观参数与实验结果相一致. 通过仿真使得对氢气潘宁放电机制的研究从定性过渡到定量, 这对于潘宁离子源的设计和改进具有重要意义. 关键词： 潘宁放电 氢气 粒子模拟 蒙特卡罗     

Neutralization and ionization of low energy helium ions scattering from a copper surface

Ion yield measurements are presented |of 2–10 keV helium ions scattered from a copper (100) face. The scattering angle is 30°. The results are explained using a charge transfer model originally proposed by the authors. The model takes into account Auger neutralization as well as ionization and neutralization resulting from a violent collision. The present results are compared with previous] experiments in which a primary atom beam was used. Within the experimental errors the results |of both experiments can be explained using the same charge exchange parameters. A second result of the present investigation is that more convincing evidence is given for the occurrence of neutralization during the violent collision by a non-Auger process. It is probable that this process, as well as the ionization process, results from an interaction between the helium particle and the copper L shell electrons.     

雾霾粒子的紫外光散射特性研究

紫外光与雾霾粒子发生散射后,其散射信道特性能够反映雾霾粒子的相关物理信息,利用无线紫外光单次和多次散射信道模型,采用Mie散射和T矩阵理论分析了霾粒子在不同形态和浓度下的紫外光散射信道特性,以及散射角对散射光强的影响,并完成了紫外光在雾霾环境下的实测。通过理论及仿真分析,得到了不同霾粒子形态下的紫外光通信路径损耗以及光强分布。结果表明：紫外光直视通信方式下,路径损耗随着霾粒子浓度的增大而增大,且通信质量差于晴朗天。非直视通信方式中,在短距离通信时,高霾浓度下的路径损耗小于中低霾浓度,然而随着通信距离的继续增大,高雾霾浓度下的通信质量急剧下降,低霾浓度下通信质量最终达到最优,且距离为200 m时通信质量能优于晴朗环境。当通信距离相同时,三种雾霾浓度下的紫外光散射光强分布均随着散射角的增大而减小,当散射角继续增大并超过90°时,低霾浓度下的散射光强最大。主要原因是虽然散射角继续增大,但是有效散射体体积逐渐减小,因此低霾浓度下的散射光强较大。且当粒子粒径相同时,球形粒子的衰减较非球形粒子大。雾霾环境下实测结果与仿真结果相类似,证明了仿真结果的正确性,并在一定程度上证明了实际大气中雾霾非球形粒子多于球形粒子。     

ELECTRON DIFFUSION IN A NON-UNIFORM ELECTRIC FIELD AND A UNIFORM MAGNETIC FIELD

A Monte Carlo simulation technique has been used to model the electron transport beharlot, especially the electron diffusion motion, in the cathode fall region of a glow discharge under the influence of a non-uniform electric field and a transverse magnetic field perpen-dicular to the cathode sheath electric field. Three types of collisions (elastic, excitation and ionization) are taken into account in our model. The electron free flying time is determined by the electron-neutral atom collision frequency. We focus attention on the electron diffusion distance and velocity. The electron-neutral atom collision processes and the electron drift velocity are also studied. The results indicate that with the increase of the magnetic field the electron diffusion distance increases and the electron diffusion velocity decreases. The results Mso show that the collision processes are enhanced by the magnetic field, this is in agreement with the experimental result. However, the axial magnetic field does not affect the electron transport behavior.